المؤلفون: Gribelyuk, M. A., Mody, J., Kaganer, E., Furkay, S. S., Miller, J., Charsky, A.

المصدر: Journal of Applied Physics; 8/14/2019, Vol. 126 Issue 6, pN.PAG-N.PAG, 9p, 1 Chart, 6 Graphs

مصطلحات موضوعية: ELECTRON holography, FOCUSED ion beams, SECONDARY ion mass spectrometry, CHEMICAL sample preparation, ION beams

المؤلفون: Singh, D., Restrepo, O. D., Manik, P. P., Mavilla, N. Rao, Zhang, H., Paliwoda, P., Pinkett, S., Deng, Y., Silva, E. Cruz, Johnson, J. B., Bajaj, M., Furkay, S., Chbili, Z., Kerber, A., Christiansen, C., Narasimha, S., Maciejewski, E., Samavedam, S., Lin, C.-H.

المصدر: 2018 IEEE International Reliability Physics Symposium (IRPS)

الاتاحة: http://dx.doi.org/10.1109/irps.2018.8353650
http://xplorestaging.ieee.org/ielx7/8345372/8353529/08353650.pdf?arnumber=8353650

المؤلفون: Cipriany, B., Jagannathan, B., Costrini, G., Noemaun, A., Onishi, K., Narasimha, S., Zhang, B., Sheraw, C., Meiring, J., Kumar, M., Nummy, K., Zhan, N., Nanjundappa, H., Norum, J., Furkay, S., Malik, R., Agnello, P., Fried, D., Greiner, K., Faken, D., Breit, S.

المصدر: 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) ; page 97-100

الاتاحة: http://dx.doi.org/10.1109/sispad.2013.6650583
http://xplorestaging.ieee.org/ielx7/6637582/6650550/06650583.pdf?arnumber=6650583

المؤلفون: Rajendran, K., Johnson, J.B., Furkay, S., Kumar, M., Fischer, S.

المصدر: Digest of Papers. 2004 Topical Meeting onSilicon Monolithic Integrated Circuits in RF Systems, 2004. ; page 99-102

الاتاحة: http://dx.doi.org/10.1109/smic.2004.1398177
http://xplorestaging.ieee.org/ielx5/9619/30396/01398177.pdf?arnumber=1398177

المؤلفون: Agonafer, D., Furkay, S.

المصدر: InterSociety Conference on Thermal Phenomena in the Fabrication and Operation of Electronic Components. I-THERM '88 ; page 85

الاتاحة: http://dx.doi.org/10.1109/itherm.1988.28682
http://xplorestaging.ieee.org/ielx2/742/1166/00028682.pdf?arnumber=28682

المؤلفون: Rieh, J.-S., Johnson, J., Furkay, S., Greenberg, D., Freeman, G., Subbanna, S.

المصدر: Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting

الاتاحة: http://dx.doi.org/10.1109/bipol.2002.1042896
http://xplorestaging.ieee.org/ielx5/8083/22351/01042896.pdf?arnumber=1042896

المؤلفون: Agonafer, D., Furkay, S.

المصدر: Sixth Annual IEEE Proceedings Semiconductor Thermal and Temperature Measurement Symposium ; page 103

الاتاحة: http://dx.doi.org/10.1109/stherm.1990.68498
http://xplorestaging.ieee.org/ielx2/103/2434/00068498.pdf?arnumber=68498

المؤلفون: Voldman, S., Juliano, P., Johnson, R., Schmidt, N., Joseph, A., Furkay, S., Rosenbaum, E., Dunn, J., Harame, D., Meyerson, B.

المصدر: 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059) ; page 310-316

الاتاحة: http://dx.doi.org/10.1109/relphy.2000.843932
http://xplorestaging.ieee.org/ielx5/6814/18276/00843932.pdf?arnumber=843932

المؤلفون: Voldman, S.H., Gerosa, G., Gross, V.P., Dickson, N., Furkay, S., Slinkman, J.

المصدر: Electrical Overstress/Electrostatic Discharge Symposium Proceedings ; page 43-61

الاتاحة: http://dx.doi.org/10.1109/eosesd.1995.478267
http://xplorestaging.ieee.org/ielx5/3460/10131/00478267.pdf?arnumber=478267

المؤلفون: Knepper, R. W., Johnson, J. B., Furkay, S., Slinkman, J., Tian, X., Buturla, E. M., Young, R., Fiorenza, G., Logan, R., Huang, Y. S., O’Brien, R. R., Murthy, C. S., Murley, P. C., Peng, J., Tang, H. H. K., Srinivasan, G. R., Pelella, M. M., Sunderland, D. A., Mandelman, J., Lieber, D., Farrell, E., Kurasic, M.

المصدر: Technology CAD Systems ; page 25-62 ; ISBN 9783709193174 9783709193150

الاتاحة: http://dx.doi.org/10.1007/978-3-7091-9315-0_2
http://link.springer.com/content/pdf/10.1007/978-3-7091-9315-0_2.pdf

المؤلفون: Scholze, A., Furkay, S., Seong-Dong Kim, Jain, S.

المصدر: 2011 International Conference on Simulation of Semiconductor Processes & Devices (SISPAD); 2011, p99-102, 4p

المؤلفون: Seong-Dong Kim, Jain, S., Rhee, H., Scholze, A., Yu, M., Seung Chul Lee, Furkay, S., Zorzi, M., Bufler, F.M., Erlebach, A.

المصدر: 2010 International Conference on Simulation of Semiconductor Processes & Devices (SISPAD); 2010, p79-82, 4p

المؤلفون: Rajendran, K., Johnson, J.B., Furkay, S., Kumar, M., Fischer, S.

المصدر: 2004 Digest of Papers. 2004 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems; 2004, p99-102, 4p

المؤلفون: Rieh, J.-S., Johnson, J., Furkay, S., Greenberg, D., Freeman, G., Subbanna, S.

المصدر: Proceedings of the Bipolar/BiCMOS Circuits & Technology Meeting; 2002, p100-103, 4p

المؤلفون: Voldman, S., Juliano, P., Johnson, R., Schmidt, N., Joseph, A., Furkay, S., Rosenbaum, E., Dunn, J., Harame, D., Meyerson, B.

المصدر: 2000 IEEE International Reliability Physics Symposium Proceedings 38th Annual (Cat. No.00CH37059); 2000, p310-316, 7p

المؤلفون: Phillips, W. M., Furkay, S. S., Pierce, W. S.

المصدر: Transactions - American Society for Artificial Internal Organs; April 1979, Vol. 25 Issue: 1 p56-60, 5p

المؤلفون: Voldman, S. H., Gerosa, G., Gross, V. P., Dickson, N., Furkay, S., Slinkman, J.

المصدر: Journal of Electrostatics; 1996, Vol. 38 Issue: 1 p3-32, 30p

المؤلفون: Hook, T.B., Furkay, S., Kulkarni, P., Monsieur, F.

المصدر: 2011 IEEE International SOI Conference (SOI); 2011, p1-2, 2p

المؤلفون: Agonafer, D., Furkay, S.

المصدر: InterSociety Conference on Thermal Phenomena in the Fabrication & Operation of Electronic Components I-THERM '88; 1988, p85-85, 1p

المؤلفون: Agonafer, D., Furkay, S.

المصدر: Sixth Annual IEEE Proceedings Semiconductor Thermal & Temperature Measurement Symposium; 1990, p103-103, 1p