المؤلفون: Waldhoer, Dominic, Schleich, Christian, Michl, Jakob, Grill, Alexander, Claes, Dieter, Karl, Alexander, Knobloch, Theresia, Rzepa, Gerhard, Franco, Jacopo, Kaczer, Ben, Waltl, Michael, Grasser, Tibor

مصطلحات موضوعية: Physics - Applied Physics

URL الوصول: http://arxiv.org/abs/2212.11547

المؤلفون: Asanovski, Ruben, Franco, Jacopo, Palestri, Pierpaolo, Kaczer, Ben, Selmi, Luca

المساهمون: Asanovski, Ruben, Franco, Jacopo, Palestri, Pierpaolo, Kaczer, Ben, Selmi, Luca

مصطلحات موضوعية: Trap, Dielectric characterization, MOSFET, 1/f noise

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:001071171700001; volume:207; firstpage:1; lastpage:5; journal:SOLID-STATE ELECTRONICS; https://hdl.handle.net/11380/1312646; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85166349858

الاتاحة: https://hdl.handle.net/11380/1312646
https://doi.org/10.1016/j.sse.2023.108722

المؤلفون: Asanovski, Ruben, Grill, Alexander, Franco, Jacopo, Palestri, Pierpaolo, Beckers, Arnout, Kaczer, Ben, Selmi, Luca

المساهمون: imec’s Industrial Affiliation Program on Quantum Computing and Cryoelectronics, “Università degli Studi di Modena e Reggio Emilia” through the “Bando giovani ricercatori 2021.”

المصدر: IEEE Transactions on Electron Devices ; volume 70, issue 4, page 2135-2141 ; ISSN 0018-9383 1557-9646

الاتاحة: https://doi.org/10.1109/ted.2022.3233551
http://xplorestaging.ieee.org/ielx7/16/10081247/10008212.pdf?arnumber=10008212

المؤلفون: Zhao, Ying, Rinaudo, Pietro, Chasin, Adrian, Truijen, Brecht, Kaczer, Ben, Rassoul, Nouredine, Dekkers, Harold, Belmonte, Attilio, De Wolf, Ingrid, Kar, Gouri, Franco, Jacopo

المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS)

الاتاحة: http://dx.doi.org/10.1109/irps48228.2024.10529352
http://xplorestaging.ieee.org/ielx7/10529283/10529298/10529352.pdf?arnumber=10529352

المؤلفون: Vici, Andrea, Degraeve, Robin, Horiguchi, Naoto, De Wolf, Ingrid, Franco, Jacopo

المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS)

الاتاحة: http://dx.doi.org/10.1109/irps48228.2024.10529347
http://xplorestaging.ieee.org/ielx7/10529283/10529298/10529347.pdf?arnumber=10529347

المؤلفون: Rinaudo, Pietro, Chasin, Adrian, Zhao, Ying, Kaczer, Ben, Rassoul, Nouredine, Dekkers, Harold F.W., van Setten, Michiel J., Belmonte, Attilio, De Wolf, Ingrid, Kar, Gouri, Franco, Jacopo

المساهمون: Imec

المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS)

الاتاحة: http://dx.doi.org/10.1109/irps48228.2024.10529432
http://xplorestaging.ieee.org/ielx7/10529283/10529298/10529432.pdf?arnumber=10529432

المؤلفون: IEEE International Symposium on Reliability Physics 2024, Berciano, Mathias, Croes, Kristof, De Wolf, Ingrid, Franco, Jacopo, Musibau, Solomon, Poumpouridis, Nikos, Tsiara, Artemisia, Van Campenhout, Joris

مصطلحات موضوعية: Reliability Physics

Relation: https://dx.doi.org/10.1109/IRPS48228.2024.10529439

الاتاحة: https://dx.doi.org/10.48448/n82t-4p85
https://underline.io/lecture/96019-degradation-and-recovery-kinetics-study-of-vertical-and-lateral-ge-on-si-photodetectors

المؤلفون: IEEE International Symposium on Reliability Physics 2024, Bury, Erik, Degraeve, Robin, Franco, Jacopo, Guo, Yuanyang, Kaczer, Ben, Saraza-Canflanca, Pablo, Vandemaele, Michiel, Verbauwhede, Ingrid

مصطلحات موضوعية: Reliability Physics

Relation: https://dx.doi.org/10.1109/IRPS48228.2024.10529383

الاتاحة: https://dx.doi.org/10.48448/jqpx-xq25
https://underline.io/lecture/96065-exploiting-bias-temperature-instability-for-reservoir-computing-in-edge-artificial-intelligence-applications

المؤلفون: IEEE International Symposium on Reliability Physics 2024, Belmonte, Attilio, Chasin, Adrian, Dekkers, Harold, De Wolf, Ingrid, Franco, Jacopo, Kaczer, Ben, Kar, Gouri, Rassoul, Nouredine, Rinaudo, Pietro, Van Setten, Michiel, Zhao, Ying

مصطلحات موضوعية: Reliability Physics

Relation: https://dx.doi.org/10.1109/IRPS48228.2024.10529432

الاتاحة: https://dx.doi.org/10.48448/gas0-e214
https://underline.io/lecture/96045-light-assisted-investigation-of-the-role-of-oxygen-flow-during-igzo-deposition-on-deep-subgap-states-and-their-evolution-under-pbti

المؤلفون: IEEE International Symposium on Reliability Physics 2024, Arimura, Hiroaki, Bastos, Joao, Capogreco, Elena, Chasin, Adrian, Franco, Jacopo, Ganguly, Jishnu, Higashi, Yusuke, Horiguchi, Naoto, O'Sullivan, Barry, Spessot, Alessio

مصطلحات موضوعية: Reliability Physics

Relation: https://dx.doi.org/10.1109/IRPS48228.2024.10529495

الاتاحة: https://dx.doi.org/10.48448/7p9k-v477
https://underline.io/lecture/96156-side-and-corner-region-non-uniformities-in-grown-sio2-and-their-implications-on-current-capacitance-and-breakdown-characteristics

المؤلفون: IEEE International Symposium on Reliability Physics 2024, Belmonte, Attilio, Chasin, Adrian, Dekkers, Harold, De Wolf, Ingrid, Franco, Jacopo, Kaczer, Ben, Kar, Gouri, Rassoul, Nouredine, Rinaudo, Pietro, Truijen, Brecht, Zhao, Ying

مصطلحات موضوعية: Reliability Physics

Relation: https://dx.doi.org/10.1109/IRPS48228.2024.10529352

الاتاحة: https://dx.doi.org/10.48448/6qjy-v903
https://underline.io/lecture/96202-fundamental-understanding-of-nbti-degradation-mechanism-in-igzo-channel-devices

المؤلفون: IEEE International Symposium on Reliability Physics 2024, Degraeve, Robin, De Wolf, Ingrid, Franco, Jacopo, Horiguchi, Naoto, Vici, Andrea

مصطلحات موضوعية: Reliability Physics

Relation: https://dx.doi.org/10.1109/IRPS48228.2024.10529347

الاتاحة: https://dx.doi.org/10.48448/1th3-pk33
https://underline.io/lecture/96044-silc-and-tddb-reliability-of-novel-low-thermal-budget-rmg-gate-stacks

المؤلفون: Vandemaele, Michiel, Kaczer, Ben, Bury, Erik, Franco, Jacopo, Chasin, Adrian, Makarov, Alexander, Mertens, Hans, Hellings, Geert, Groeseneken, Guido

المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS)

الاتاحة: http://dx.doi.org/10.1109/irps48203.2023.10118211
http://xplorestaging.ieee.org/ielx7/10117589/10117581/10118211.pdf?arnumber=10118211

المؤلفون: Rinaudo, Pietro, Chasin, Adrian, Franco, Jacopo, Kaczer, Ben, de Wolf, Ingrid, Kar, Gouri

المصدر: Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Transistors (ULSIC VS TFT 8)

مصطلحات موضوعية: IGZO, BTI, layout dependent degradation

Relation: https://dc.engconfintl.org/ulsic_vs_tft_8/34; https://dc.engconfintl.org/context/ulsic_vs_tft_8/article/1022/filename/0/type/additional/viewcontent/23AU_Oral_Abstracts_22.pdf

الاتاحة: https://dc.engconfintl.org/ulsic_vs_tft_8/34
https://dc.engconfintl.org/context/ulsic_vs_tft_8/article/1022/filename/0/type/additional/viewcontent/23AU_Oral_Abstracts_22.pdf

المؤلفون: Vici, Andrea, Degraeve, Robin, Franco, Jacopo, Kaczer, Ben, Roussel, Philippe J., De Wolf, Ingrid

المصدر: IEEE Transactions on Electron Devices ; volume 70, issue 12, page 6512-6519 ; ISSN 0018-9383 1557-9646

الاتاحة: http://dx.doi.org/10.1109/ted.2023.3326430
http://xplorestaging.ieee.org/ielx7/16/10328902/10304567.pdf?arnumber=10304567

المؤلفون: Vandemaele, Michiel, Kaczer, Ben, Tyaginov, Stanislav, Bury, Erik, Chasin, Adrian, Franco, Jacopo, Makarov, Alexander, Mertens, Hans, Hellings, Geert, Groeseneken, Guido

المصدر: 2022 IEEE International Reliability Physics Symposium (IRPS)

الاتاحة: http://dx.doi.org/10.1109/irps48227.2022.9764470
http://xplorestaging.ieee.org/ielx7/9764406/9764408/09764470.pdf?arnumber=9764470

المؤلفون: Wu, Zhicheng, Franco, Jacopo, Truijen, Brecht, Roussel, Philippe, Tyaginov, Stanislav, Vandemaele, Michiel, Bury, Erik, Groeseneken, Guido, Linten, Dimitri, Kaczer, Ben

المصدر: 2021 IEEE International Reliability Physics Symposium (IRPS)

الاتاحة: http://dx.doi.org/10.1109/irps46558.2021.9405106
http://xplorestaging.ieee.org/ielx7/9405068/9405088/09405106.pdf?arnumber=9405106

المؤلفون: Vandemaele, Michiel, Kaczer, Ben, Tyaginov, Stanislav, Franco, Jacopo, Degraeve, Robin, Chasin, Adrian, Wu, Zhicheng, Bury, Erik, Xiang, Yang, Mertens, Hans, Groeseneken, Guido

المساهمون: Research Foundation - Flanders

المصدر: 2021 IEEE International Reliability Physics Symposium (IRPS)

الاتاحة: http://dx.doi.org/10.1109/irps46558.2021.9405164
http://xplorestaging.ieee.org/ielx7/9405068/9405088/09405164.pdf?arnumber=9405164

المؤلفون: Wu, Tian-Li, Marcon, Denis, Bakeroot, Benoit, De Jaeger, Brice, Lin, HC, Franco, Jacopo, Stoffels, Steve, Van Hove, Marleen, Roelofs, Robin, Groeseneken, Guido, Decoutere, Stefaan

المصدر: APPLIED PHYSICS LETTERS ; ISSN: 0003-6951

مصطلحات موضوعية: Technology and Engineering

وصف الملف: application/pdf

Relation: https://biblio.ugent.be/publication/6972789; http://hdl.handle.net/1854/LU-6972789; http://dx.doi.org/10.1063/1.4930076; https://biblio.ugent.be/publication/6972789/file/6972802

الاتاحة: https://biblio.ugent.be/publication/6972789
http://hdl.handle.net/1854/LU-6972789
https://doi.org/10.1063/1.4930076
https://biblio.ugent.be/publication/6972789/file/6972802

المؤلفون: Chasin, Adrian, Franco, Jacopo, Bury, Erik, Ritzenthaler, Romain, Litta, Eugenio, Spessot, Alessio, Horiguchi, Naoto, Linten, Dimitri, Kaczer, Ben

المصدر: 2020 IEEE International Reliability Physics Symposium (IRPS)

الاتاحة: http://dx.doi.org/10.1109/irps45951.2020.9129584
http://xplorestaging.ieee.org/ielx7/9125439/9128217/09129584.pdf?arnumber=9129584