المؤلفون: Agiakatsikas, D., Foutris, N., Sari, A., Vlagkoulis, V., Souvatzoglou, I., Psarakis, M., Luján, M., Kastriotou, M., Cazzaniga, C.

مصطلحات موضوعية: Physics - Instrumentation and Detectors, Computer Science - Artificial Intelligence, Computer Science - Hardware Architecture

URL الوصول: http://arxiv.org/abs/2206.01981

المؤلفون: Agiakatsikas D, Foutris N, Sari A, Vlagkoulis V, Souvatzoglou I, Psarakis M, Ye R, Goodacre J, Luján M, Kastriotou M, Cazzaniga C, Frost C

Relation: Science and Technology Facilities Council (2007- ); ISIS (1984- ); http://purl.org/net/epubs/work/56373251

الاتاحة: http://purl.org/net/epubs/work/56373251

المؤلفون: VALLERO, ALESSANDRO, SAVINO, ALESSANDRO, POLITANO, GIANFRANCO MICHELE MARIA, DI CARLO, STEFANO, Tselonis, S., Foutris, N., Kaliorakis, M., Gizopoulos, D.

المساهمون: Vallero, Alessandro, Savino, Alessandro, Tselonis, S., Foutris, N., Kaliorakis, M., Politano, GIANFRANCO MICHELE MARIA, Gizopoulos, D., DI CARLO, Stefano

مصطلحات موضوعية: DIGITAL SYSTEM DESIGN TEST AND VERIFICATION, belief network, estimation theory, large-scale system, microcomputer, probability, reliability, statistical analysis

وصف الملف: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/isbn/978-1-4799-7603-4; info:eu-repo/semantics/altIdentifier/wos/WOS:000380572100020; ispartofbook:Proceedings of the 20th IEEE European Test Symposium (ETS); 20th IEEE European Test Symposium (ETS); firstpage:1; lastpage:2; numberofpages:2; http://hdl.handle.net/11583/2622131; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84942548943; http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7138745

الاتاحة: http://hdl.handle.net/11583/2622131
https://doi.org/10.1109/ETS.2015.7138745
http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7138745

المؤلفون: VALLERO, ALESSANDRO, SAVINO, ALESSANDRO, POLITANO, GIANFRANCO MICHELE MARIA, DI CARLO, STEFANO, Tselonis, S., Foutris, N., Kaliorakis, M., Gizopoulos, D.

المساهمون: Vallero, Alessandro, Savino, Alessandro, Tselonis, S., Foutris, N., Kaliorakis, M., Politano, GIANFRANCO MICHELE MARIA, Gizopoulos, D., DI CARLO, Stefano

مصطلحات موضوعية: DIGITAL SYSTEM DESIGN TEST AND VERIFICATION, belief network, software fault tolerance, statistical analysis

وصف الملف: STAMPA

Relation: info:eu-repo/semantics/altIdentifier/isbn/978-1-4673-7905-2; info:eu-repo/semantics/altIdentifier/wos/WOS:000381620600002; ispartofbook:Proceedings of the IEEE 21st International On-Line Testing Symposium (IOLTS); IEEE 21st International On-Line Testing Symposium (IOLTS); firstpage:7; lastpage:12; numberofpages:6; http://hdl.handle.net/11583/2622326; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84955481791; http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7229819

الاتاحة: http://hdl.handle.net/11583/2622326
https://doi.org/10.1109/IOLTS.2015.7229819
http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7229819

المؤلفون: VALLERO, ALESSANDRO, SAVINO, ALESSANDRO, POLITANO, GIANFRANCO MICHELE MARIA, DI CARLO, STEFANO, Tselonis, S., Foutris, N., Kaliorakis, M., Kooli, M., Bosio, A., Di Natale, G., Gizopoulos, D.

المساهمون: Vallero, Alessandro, Tselonis, S., Foutris, N., Kaliorakis, M., Kooli, M., Savino, Alessandro, Politano, GIANFRANCO MICHELE MARIA, Bosio, A., Di Natale, G., Gizopoulos, D., DI CARLO, Stefano

مصطلحات موضوعية: DIGITAL SYSTEM DESIGN TEST AND VERIFICATION, Reliability evaluation, Fault injection, Statistical models

وصف الملف: STAMPA

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000366879500055; volume:39; issue:8; firstpage:1204; lastpage:1214; numberofpages:11; journal:MICROPROCESSORS AND MICROSYSTEMS; http://hdl.handle.net/11583/2624569; http://www.sciencedirect.com/science/article/pii/S0141933115000824

الاتاحة: http://hdl.handle.net/11583/2624569
https://doi.org/10.1016/j.micpro.2015.06.003
http://www.sciencedirect.com/science/article/pii/S0141933115000824

المؤلفون: Goumas, G., Nikas, K., Lakew, E.B., Kotselidis, C., Attwood, A., Elmroth, E., Flouris, M., Foutris, N., Goodacre, J., Grohmann, D., Karakostas, V., Koutsourakis, P., Kersten, M., Lujàn, M., Rustad, E., Thomson, J., Tomás, L., Vesterkjaer, A., Webber, J., Zhang, Y., Koziris, N.

المساهمون: Lee, K., Liu, L.

المصدر: Goumas , G , Nikas , K , Lakew , E B , Kotselidis , C , Attwood , A , Elmroth , E , Flouris , M , Foutris , N , Goodacre , J , Grohmann , D , Karakostas , V , Koutsourakis , P , Kersten , M , Lujàn , M , Rustad , E , Thomson , J , Tomás , L , Vesterkjaer , A , Webber , J , Zhang , Y & Koziris , N 2017 , ACTiCLOUD: Enabling the Next Generation of Cloud Applications . in K Lee & ....

Relation: https://dare.uva.nl/personal/pure/en/publications/acticloud-enabling-the-next-generation-of-cloud-applications(c68da117-4ca5-431d-83d7-9670c6fa5193).html; urn:ISBN:9781538617939

الاتاحة: https://dare.uva.nl/personal/pure/en/publications/acticloud-enabling-the-next-generation-of-cloud-applications(c68da117-4ca5-431d-83d7-9670c6fa5193).html
https://doi.org/10.1109/ICDCS.2017.252
https://hdl.handle.net/11245.1/c68da117-4ca5-431d-83d7-9670c6fa5193
https://ivi.fnwi.uva.nl/isis/publications/2017/KerstenICDCS2017

المؤلفون: Foutris, N., Psarakis, M., Gizopoulos, D., Apostolakis, A., Vera, X., Gonzalez, A.

المصدر: 2010 IEEE International Test Conference

الاتاحة: http://dx.doi.org/10.1109/test.2010.5699277
http://xplorestaging.ieee.org/ielx5/5684496/5699173/05699277.pdf?arnumber=5699277

المؤلفون: Vallero, A. Tselonis, S. Foutris, N. Kaliorakis, M. Kooli, M. Savino, A. Politano, G. Bosio, A. Di Natale, G. Gizopoulos, D. Di Carlo, S.

URL الوصول: https://explore.openaire.eu/search/publication?articleId=od______2127::2cf53c5c4301f984fb713fff69253a35
https://pergamos.lib.uoa.gr/uoa/dl/object/uoadl:3071011

المؤلفون: Vallero, A., Savino, A., Tselonis, S., Foutris, N., Kaliorakis, M., Politano, G., Gizopoulos, D., Di Carlo, S.

المصدر: 2015 IEEE 21st International OnLine Testing Symposium (IOLTS); 2015, p7-12, 6p