المؤلفون: Iulian Mihai, Pier Paolo Capra, Flavio Galliana

المصدر: Metrology and Measurement Systems, Vol vol. 29, Iss No 4, Pp 701-718 (2022)

مصطلحات موضوعية: high resistance measurements, dual source bridge (dsb), settle-time, measurement uncertainty, compatibility test, measurement noise, Technology

وصف الملف: electronic resource

Relation: https://journals.pan.pl/Content/125372/PDF/art07-01316_int.pdf; https://doaj.org/toc/2300-1941

URL الوصول: https://doaj.org/article/5d7d549583a64a47a60da55fdbc0edae

المؤلفون: Alessandro Cultrera, Gabriele Germito, Danilo Serazio, Flavio Galliana, Bruno Trinchera, Giulia Aprile, Martino Chirulli, Luca Callegaro

المصدر: Energies, Vol 17, Iss 6, p 1403 (2024)

مصطلحات موضوعية: calibration test bed, revenue energy meters, power quality, distorted conditions, harmonics, Technology

وصف الملف: electronic resource

Relation: https://www.mdpi.com/1996-1073/17/6/1403; https://doaj.org/toc/1996-1073

URL الوصول: https://doaj.org/article/d16070341b324f5eb47aed26a38c18c5

المؤلفون: Luca Callegaro, Giulia Aprile, Alessandro Cultrera, Flavio Galliana, Gabriele Germito, Danilo Serazio, Bruno Trinchera

المصدر: Measurement: Sensors, Vol 18, Iss , Pp 100188- (2021)

مصطلحات موضوعية: Power meter, Energy meter, Calibration, Verification, Power quality, Electric apparatus and materials. Electric circuits. Electric networks, TK452-454.4

وصف الملف: electronic resource

Relation: http://www.sciencedirect.com/science/article/pii/S2665917421001513; https://doaj.org/toc/2665-9174

URL الوصول: https://doaj.org/article/8704fb3162ee4b50962d8da2c2766982

المؤلفون: Iulian Mihai, Flavio Galliana

المساهمون: WakeUp - Benevento, GMEE, GMMT, Mihai, Iulian, Galliana, Flavio

مصطلحات موضوعية: Ottimizzato un ponte di misura Wheatstone modificato, Varianza di Allan, Densità Spettrale di Potenza, Accuratezza

Relation: info:eu-repo/semantics/altIdentifier/isbn/978-88-942753-2-2; ispartofbook:Atti del VII Forum nazionale delle misure, BOLOGNA, 13-15 SETTEMBRE 2023; Forum delle misure / Congresso Nazionale di Misure Elettriche ed Elettroniche; firstpage:337; lastpage:338; numberofpages:2; alleditors:GMEE, GMMT; https://hdl.handle.net/11696/80480

الاتاحة: https://hdl.handle.net/11696/80480

المؤلفون: Alessandro Cultrera, Gabriele Germito, Flavio Galliana, Bruno Trinchera, Giulia aprile, Martino Chirulli, Danilo Serazio, Luca Callegaro

المساهمون: IMEKO TC4, IMEKO, Cultrera, Alessandro, Germito, Gabriele, Galliana, Flavio, Trinchera, BRUNO OTTAVIO, Aprile, Giulia, Chirulli, Martino, Serazio, Danilo, Callegaro, Luca

Relation: info:eu-repo/semantics/altIdentifier/isbn/978-92-990090-1-7; ispartofbook:Proceedings 25th IMEKO TC-4 international symposium on of Measurement of Electrical quantities 23rd international workshop on ADC and DAC modelling and testing; Proceedins of 25th IMEKO TC-4 international symposium on measurement of Electrical quantities 23rd international workshop on ADC and DAC modelling and testing; firstpage:29; lastpage:33; numberofpages:5; alleditors:IMEKO; https://hdl.handle.net/11696/74580; https://imeko-tc4-2022.org/procs/IMEKO_2022_Proceedings.pdf

الاتاحة: https://hdl.handle.net/11696/74580
https://imeko-tc4-2022.org/procs/IMEKO_2022_Proceedings.pdf

المؤلفون: FLAVIO GALLIANA, ROBERTO CERRI, DAVIDE CORONA

المساهمون: Galliana, Flavio, Cerri, Roberto, Corona, Davide

Relation: volume:28; issue:1; firstpage:22; lastpage:26; numberofpages:5; journal:CAL LAB; http://hdl.handle.net/11696/68890

الاتاحة: http://hdl.handle.net/11696/68890

المؤلفون: Flavio Galliana, Marco Lanzillotti

المساهمون: Galliana, Flavio, Lanzillotti, Marco

مصطلحات موضوعية: digital multimeter, calibration, measurement uncertainties, low-frequency electrical measure- ments, performance index, measurement specifications.

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000472917100006; volume:26; issue:2; firstpage:283; lastpage:296; numberofpages:14; journal:METROLOGY AND MEASUREMENT SYSTEMS; http://hdl.handle.net/11696/60525; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85068922612; http://journals.pan.pl/dlibra/publication/128356/edition/111963/content

الاتاحة: http://hdl.handle.net/11696/60525
https://doi.org/10.24425/mms.2019.128356
http://journals.pan.pl/dlibra/publication/128356/edition/111963/content

المؤلفون: Pier Paolo Capra, Flavio Galliana, Michela Borla, Marco Lanzillotti, Luca Roncaglione Tet, Claudio Francese

المساهمون: Capra, PIER PAOLO, Galliana, Flavio, Borla, Michela, Lanzillotti, Marco, RONCAGLIONE TET, Luca, Francese, Claudio

Relation: firstpage:1; lastpage:17; numberofpages:17; https://hdl.handle.net/11696/78079; https://www.researchgate.net/publication/374867715_EM-K13a_and_b_DC_electrical_Resistance_Key_Comparisons_between_INRIM_and_BIPM_on_1_O_and_10_kO_Resistors?channel=doi&linkId=65328dbc5d51a8012b585749&showFulltext=true

الاتاحة: https://hdl.handle.net/11696/78079
https://doi.org/10.13140/rg.2.2.19922.53447
https://www.researchgate.net/publication/374867715_EM-K13a_and_b_DC_electrical_Resistance_Key_Comparisons_between_INRIM_and_BIPM_on_1_O_and_10_kO_Resistors?channel=doi&linkId=65328dbc5d51a8012b585749&showFulltext=true

المؤلفون: Pier Paolo Capra, Flavio Galliana, Claudio Francese, Marco Lanzillotti, Luca Roncaglione Tet

المساهمون: Capra, PIER PAOLO, Galliana, Flavio, Francese, Claudio, Lanzillotti, Marco, RONCAGLIONE TET, Luca

Relation: firstpage:1; lastpage:12; numberofpages:12; https://hdl.handle.net/11696/75319

الاتاحة: https://hdl.handle.net/11696/75319

المؤلفون: alessandro cultrera, gabriele germito, danilo serazio, flavio galliana, bruno trinchera, giulia aprile, martino chirulli, luca callegaro

المساهمون: IEEE, Cultrera, Alessandro, Germito, Gabriele, Serazio, Danilo, Galliana, Flavio, Trinchera, Bruno, Aprile, Giulia, Chirulli, Martino, Callegaro, Luca

Relation: ispartofbook:2022 Conference on Precision Electromagnetic Measurements Conference Digest; https://hdl.handle.net/11696/76339

الاتاحة: https://hdl.handle.net/11696/76339

المؤلفون: Luigi Iacomini, Davide Torchio, Flavio Galliana

المصدر: MAPAN. 35:435-445

مصطلحات موضوعية: Engineering, Peer assessment, Physics and Astronomy (miscellaneous), business.industry, Systems engineering, business, Competence (human resources), Accreditation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::85c052af34eef4e7faffc57f6ff540da
https://doi.org/10.1007/s12647-020-00374-5

المؤلفون: Marco Lanzillotti, Flavio Galliana

المصدر: MAPAN. 34:473-478

مصطلحات موضوعية: Physics and Astronomy (miscellaneous), Traceability, Computer science, Calibration, Control engineering, Field (computer science), Multimeter, Accreditation, Metrology

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9d4b2d9e1195fab16896e3c34cdd1fe1
https://doi.org/10.1007/s12647-019-00317-9

المؤلفون: Flavio Galliana

المصدر: IEEE Instrumentation & Measurement Magazine. 22:62-66

مصطلحات موضوعية: Correctness, Traceability, Computer science, System of measurement, Calibration, Measurement uncertainty, Electrical and Electronic Engineering, Instrumentation, Competence (human resources), High tech, Manufacturing engineering, Accreditation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::04bef045a419c142b17c6065cc42be20
https://doi.org/10.1109/mim.2019.8674638

المؤلفون: FLAVIO GALLIANA, P. CAPRA, IULIAN MIHAI

المساهمون: IMEKO-TC4, IMEKO, Galliana, Flavio, Capra, P., Mihai, Iulian

Relation: info:eu-repo/semantics/altIdentifier/isbn/978-92-990084-7-8; ispartofbook:PROCEEDINGS 24th IMEKO TC4 International Symposium 22nd International Workshop on ADC and DAC Modelling and Testing IMEKO TC-4 2020; 24th IMEKO TC4 International Symposium 22nd International Workshop on ADC and DAC Modelling and Testing IMEKO TC-4 2020; firstpage:379; lastpage:383; numberofpages:5; alleditors:IMEKO; http://hdl.handle.net/11696/63950; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85096746604

الاتاحة: http://hdl.handle.net/11696/63950

المؤلفون: Flavio Galliana, Roberto Cerri, Marco Lanzillotti, Pier Paolo Capra

المصدر: Measurement. 123:129-134

مصطلحات موضوعية: Computer science, Applied Mathematics, 020208 electrical & electronic engineering, 010401 analytical chemistry, Process (computing), Linearity, 02 engineering and technology, Condensed Matter Physics, 01 natural sciences, 0104 chemical sciences, Metrology, Generator (circuit theory), Dc voltage, Reliability (semiconductor), 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Calibration, Electrical and Electronic Engineering, Instrumentation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::88ce488b42e1816077184d8cd94249ac
https://doi.org/10.1016/j.measurement.2018.03.062

المؤلفون: Roberto Cerri, Flavio Galliana, Marco Lanzillotti, Pier Paolo Capra

المصدر: Measurement. 122:291-296

مصطلحات موضوعية: 010302 applied physics, Materials science, Applied Mathematics, 020208 electrical & electronic engineering, Linearity, 02 engineering and technology, Division (mathematics), Condensed Matter Physics, 01 natural sciences, law.invention, Metrology, Generator (circuit theory), law, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Range (statistics), Calibration, Electrical and Electronic Engineering, Resistor, Instrumentation, Temperature coefficient

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1e5161507e23051a5b09c121c4191a71
https://doi.org/10.1016/j.measurement.2018.03.045

المؤلفون: Flavio Galliana, Danilo Serazio

المصدر: MAPAN. 33:435-439

مصطلحات موضوعية: Correctness, Physics and Astronomy (miscellaneous), Computer science, business.industry, 020208 electrical & electronic engineering, 02 engineering and technology, 01 natural sciences, Metrology, 010309 optics, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Calibration, Systems engineering, Electric power, Electricity, Inter-laboratory, business, Accreditation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::eb7def8f279230031e1a14c6a5c22672
https://doi.org/10.1007/s12647-018-0266-4

المؤلفون: Luca Roncaglione, Marco Lanzillotti, Claudio Francese, Pier Paolo CAPRA, Flavio Galliana

المساهمون: RONCAGLIONE TET, Luca, Lanzillotti, Marco, Francese, Claudio, Capra, PIER PAOLO, Galliana, Flavio

Relation: firstpage:1; lastpage:19; numberofpages:19; http://hdl.handle.net/11696/71690

الاتاحة: http://hdl.handle.net/11696/71690

المؤلفون: STEFANO CARIA, FLAVIO GALLIANA, PAOLO ROCCATO

المساهمون: Caria, STEFANO EMILIO, Galliana, Flavio, Roccato, PAOLO EMILIO

Relation: firstpage:1; lastpage:40; numberofpages:40; http://hdl.handle.net/11696/70650

الاتاحة: http://hdl.handle.net/11696/70650

المؤلفون: Roberto Cerri, Davide Corona, Flavio Galliana

المصدر: Measurement. 183:109865

مصطلحات موضوعية: Resistive touchscreen, Materials science, business.industry, Applied Mathematics, Electrical engineering, Linearity, Input impedance, Condensed Matter Physics, Span (engineering), law.invention, Dc voltage, law, Calibration, Electrical and Electronic Engineering, Resistor, business, Instrumentation, Multimeter

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::78a6153ffca4d0a2575329a7240178d8
https://doi.org/10.1016/j.measurement.2021.109865