المؤلفون: Giulian, Raquel, Bolzan, Charles Airton, Salazar, Josiane Bueno, Cunha, Carlo Requiao da

مصطلحات موضوعية: Antimonide films, Ion irradiation, XRD, SEM, Radiacao ionica, Antimônio, Difração de raios X, Microscopia eletrônica de varredura, Filmes finos semicondutores

وصف الملف: application/pdf

Relation: Energy reports. Amsterdam. Vol. 6, suppl. 4 (Feb. 2020), p. 70-76; http://hdl.handle.net/10183/217054; 001120312

الاتاحة: http://hdl.handle.net/10183/217054

المؤلفون: Decoster, S., Glover, C. J., Johannessen, B., Giulian, Raquel, Sprouster, David J., Kluth, Patrick, Araújo, Leandro Langie, Hussain, Zohair S., Schnohr, Claudia S., Salama, H., Kremer, Felipe, Temst, Kristiaan, Vantomme, A., Ridgway, M.C.

مصطلحات موضوعية: Thin film, Lift-off, Semiconductor, Dielectric, Filmes finos dieletricos, Filmes finos semicondutores, Semicondutores amorfos, Crescimento de semicondutores, Estrutura fina estendida de absorção de raios x (EXAFS), Arseneto de galio, Compostos de indio, Compostos de silício

وصف الملف: application/pdf

Relation: Journal of synchrotron radiation. Copenhagen. Vol. 20, no. 3 (May 2013), p. 426-432; http://hdl.handle.net/10183/94424; 000897160

الاتاحة: http://hdl.handle.net/10183/94424

المؤلفون: Carlo R. da Cunha, Charles A. Bolzan, Raquel Giulian, Josiane Bueno Salazar

المصدر: Energy Reports, Vol 6, Iss, Pp 70-76 (2020)
Repositório Institucional da UFRGS
Universidade Federal do Rio Grande do Sul (UFRGS)
instacron:UFRGS

مصطلحات موضوعية: Materials science, Band gap, XRD, 020209 energy, 02 engineering and technology, Fluence, 020401 chemical engineering, Antimonide, 0202 electrical engineering, electronic engineering, information engineering, ddc:330, Irradiation, 0204 chemical engineering, Filmes finos semicondutores, Radiacao ionica, Difração de raios X, business.industry, Antimônio, Sputter deposition, Amorphous solid, Microscopia eletrônica de varredura, General Energy, Semiconductor, Ion irradiation, SEM, Optoelectronics, Crystallite, lcsh:Electrical engineering. Electronics. Nuclear engineering, business, lcsh:TK1-9971, Antimonide films

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::25cd3ccff73d1b6508ef10184810d510
https://hdl.handle.net/10419/244008

المؤلفون: Ávila, Tiago Silva de

Thesis Advisors: Grande, Pedro Luis, Fichtner, Paulo Fernando Papaleo

المصدر: Biblioteca Digital de Teses e Dissertações da UFRGSUniversidade Federal do Rio Grande do SulUFRGS.

مصطلحات موضوعية: Filmes finos semicondutores, Deformação, Nanoestruturas, Feixes de íons, Método de Monte Carlo, Íon beam analysis, SiGe, Blocking, MEIS

وصف الملف: application/pdf

الاتاحة: http://hdl.handle.net/10183/150057

المؤلفون: Claudia Schnohr, Mark C Ridgway, Patrick Kluth, Leandro Araujo, Bernt Johannessen, Zohair S. Hussain, Christopher Glover, Kristiaan Temst, Raquel Giulian, André Vantomme, Felipe Kremer, S. Decoster, David J. Sprouster, Hazar A. Salama

المصدر: Repositório Institucional da UFRGS
Universidade Federal do Rio Grande do Sul (UFRGS)
instacron:UFRGS

مصطلحات موضوعية: Nuclear and High Energy Physics, Compostos de silício, Materials science, thin film, Analytical chemistry, Pancreatitis-Associated Proteins, Dielectric, Specimen Handling, Compostos de indio, Filmes finos dieletricos, lift-off, Sample preparation, Thin film, dielectric, Instrumentation, Filmes finos semicondutores, Radiation, Extended X-ray absorption fine structure, Scattering, Small-angle X-ray scattering, business.industry, Arseneto de galio, Spectrometry, X-Ray Emission, Membranes, Artificial, Semicondutores amorfos, semiconductor, Isotropic etching, Crescimento de semicondutores, EXAFS, Semiconductor, Semiconductors, Nanoparticles, business, Estrutura fina estendida de absorção de raios x (EXAFS)

وصف الملف: Print-Electronic; application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c590e22643f93aa544b332f2805f1477
https://lirias.kuleuven.be/handle/123456789/417348