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1Report
المؤلفون: Poort, Luuk, Besselink, Bart, Fey, Rob H. B., van de Wouw, Nathan
مصطلحات موضوعية: Electrical Engineering and Systems Science - Systems and Control
URL الوصول: http://arxiv.org/abs/2501.11406
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2Report
مصطلحات موضوعية: Electrical Engineering and Systems Science - Systems and Control
URL الوصول: http://arxiv.org/abs/2411.13344
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3Report
المؤلفون: Egelmeers, Robert A., Janssen, Lars A. L., Fey, Rob H. B., Gerritsen, Jasper, van de Wouw, Nathan
مصطلحات موضوعية: Electrical Engineering and Systems Science - Systems and Control
URL الوصول: http://arxiv.org/abs/2402.06829
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4Report
مصطلحات موضوعية: Electrical Engineering and Systems Science - Systems and Control
URL الوصول: http://arxiv.org/abs/2402.06589
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5Report
المؤلفون: Poort, Luuk, Besselink, Bart, Fey, Rob H. B., van de Wouw, Nathan
مصطلحات موضوعية: Electrical Engineering and Systems Science - Systems and Control
URL الوصول: http://arxiv.org/abs/2311.13214
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6Report
مصطلحات موضوعية: Electrical Engineering and Systems Science - Systems and Control
URL الوصول: http://arxiv.org/abs/2310.17320
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7Report
مصطلحات موضوعية: Electrical Engineering and Systems Science - Systems and Control
URL الوصول: http://arxiv.org/abs/2304.05021
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8Report
مصطلحات موضوعية: Electrical Engineering and Systems Science - Systems and Control
URL الوصول: http://arxiv.org/abs/2301.08510
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9Report
مصطلحات موضوعية: Electrical Engineering and Systems Science - Systems and Control
URL الوصول: http://arxiv.org/abs/2210.15958
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10Academic Journal
المؤلفون: Kessels, Bas M., Fey, Rob H. B., van de Wouw, Nathan
المساهمون: NWO
المصدر: Nonlinear Dynamics ; volume 111, issue 11, page 10255-10285 ; ISSN 0924-090X 1573-269X
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11Periodical
المؤلفون: Poort, Luuk, Besselink, Bart, Fey, Rob H. B., van de Wouw, Nathan
المصدر: IEEE Transactions on Control Systems Technology; September 2024, Vol. 32 Issue: 5 p1817-1826, 10p
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12Academic Journal
المؤلفون: Veldman, Daniel W. M., Fey, Rob H. B., Zwart, Hans, van de Wal, Marc M. J., van den Boom, Joris D. B. J., Nijmeijer, Henk
المساهمون: the Impuls II research program of the High Tech System Center (HTSC) at the Eindhoven University of Technology
المصدر: Journal of Thermal Stresses ; volume 44, issue 8, page 970-1010 ; ISSN 0149-5739 1521-074X
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13Academic Journal
المؤلفون: Veldman, Daniel W. M., Fey, Rob H. B., Zwart, Hans, van de Wal, Marc M. J., van den Boom, Joris D. B. J., Nijmeijer, Henk
المساهمون: Impuls II Research Program of the High Tech System Center (HTSC) at the Eindhoven University of Technology
المصدر: IEEE Transactions on Control Systems Technology ; volume 29, issue 2, page 514-529 ; ISSN 1063-6536 1558-0865 2374-0159
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14Book
المصدر: Data Science in Engineering, Volume 9 ; Conference Proceedings of the Society for Experimental Mechanics Series ; page 1-4 ; ISSN 2191-5644 2191-5652 ; ISBN 9783031041211 9783031041228
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15Book
المؤلفون: Mestrom, R. M. C., Fey, Rob H. B., Phan, K. L., Nijmeijer, H.
المصدر: IUTAM Symposium on Nonlinear Dynamics for Advanced Technologies and Engineering Design ; page 195-207 ; ISBN 9789400757417 9789400757424
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16Book
المؤلفون: Fey, Rob H. B., Mallon, Niels J., Kraaij, C. Stefan, Nijmeijer, Henk
المصدر: Parametric Resonance in Dynamical Systems ; page 267-285 ; ISBN 9781461410423 9781461410430
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17Book
المؤلفون: Peña-Ramírez, Jonatan, Fey, Rob H. B., Nijmeijer, Henk
المصدر: Parametric Resonance in Dynamical Systems ; page 1-13 ; ISBN 9781461410423 9781461410430
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18Academic Journal
المؤلفون: Murguia, C., Fey, Rob H. B., Nijmeijer, H.
المساهمون: Consejo Nacional de Ciencia y Tecnología, Technische Universiteit Eindhoven
المصدر: Chaos: An Interdisciplinary Journal of Nonlinear Science ; volume 25, issue 2 ; ISSN 1054-1500 1089-7682
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19Academic Journal
المؤلفون: Murguia, Carlos, Fey, Rob H. B., Nijmeijer, Henk
المساهمون: Mexican Council for Science and Technology (CONACYT)
المصدر: IEEE Transactions on Circuits and Systems I: Regular Papers ; volume 61, issue 6, page 1801-1814 ; ISSN 1549-8328 1558-0806
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20Academic Journal
المؤلفون: Pena Ramirez, J., Fey, Rob H. B., Nijmeijer, H.
المصدر: Chaos: An Interdisciplinary Journal of Nonlinear Science ; volume 23, issue 3, page 033118 ; ISSN 1054-1500 1089-7682