المؤلفون: Young, R.M., Adam, J.D., Vale, C.R., Braggins, T.T., Krishnaswamy, S.V., Milton, C.E., Bever, D.W., Chorosinski, L.G., Li-Shu Chen, Crockett, D.E., Freidhoff, C.B., Talisa, S.H., Capelle, E., Tranchini, R., Fende, J.R., Lorthioir, J.M., Tories, A.R.

المصدر: IEEE MTT-S International Microwave Symposium Digest, 2003 ; volume 3, page 1781-1784

الاتاحة: http://dx.doi.org/10.1109/mwsym.2003.1210485
http://xplorestaging.ieee.org/ielx5/8599/27239/01210485.pdf?arnumber=1210485