المؤلفون: Lucía Mulas, María Luisa, Prado Millán, Álvaro del, San Andrés Serrano, Enrique, Feijoo, P.C., Toledano-Luque, M.

مصطلحات الفهرس: 537, Electron-Cyclotron-Resonance, High-K, Hafnium Oxide, Thin-Films, Dielectrics, Absorption, TiO2., Electricidad, Electrónica (Física), 2202.03 Electricidad, journal article

URL: https://hdl.handle.net/20.500.14352/44401
http://scitation.aip.org/
AP2007-01157
TEC2007/63318
CCG07- UCM/TIC-2804
GR58/08

المؤلفون: Feijoo, P.C., Pampillón Arce, María Ángela, San Andrés Serrano, Enrique, Fierro, J.L.G.

مصطلحات الفهرس: 537, Particle fluxes, Gate oxides, Thin-films, Thermalization, Dielectrics, Integration, Transistors, Technology, Plasma, Si., Electricidad, Electrónica (Física), 2202.03 Electricidad, journal article

URL: https://hdl.handle.net/20.500.14352/24316
http://www.sciencedirect.com/
TEC2010-18051
BES-2011-04379

المؤلفون: Feijoo, P.C., Pampillón Arce, María Ángela, San Andrés Serrano, Enrique, Fierro, J.L.G.

مصطلحات موضوعية: Particle fluxes, Gate oxides, Thin-films, Thermalization, Dielectrics, Integration, Transistors, Technology, Plasma, Si, Electricidad, Electrónica (Física), 2202.03 Electricidad

Time: 537

وصف الملف: application/pdf

Relation: TEC2010-18051; BES-2011-04379; http://dx.doi.org/10.1016/j.tsf.2015.07.045; http://www.sciencedirect.com/; https://hdl.handle.net/20.500.14352/24316

الاتاحة: https://hdl.handle.net/20.500.14352/24316
https://doi.org/10.1016/j.tsf.2015.07.045
http://www.sciencedirect.com/

المؤلفون: Lucía Mulas, María Luisa, Prado Millán, Álvaro del, San Andrés Serrano, Enrique, Feijoo, P.C., Toledano-Luque, M.

مصطلحات موضوعية: Electron-Cyclotron-Resonance, High-K, Hafnium Oxide, Thin-Films, Dielectrics, Absorption, TiO2, Electricidad, Electrónica (Física), 2202.03 Electricidad

Time: 537

وصف الملف: application/pdf

Relation: AP2007-01157; TEC2007/63318; CCG07- UCM/TIC-2804; GR58/08; http://dx.doi.org/10.1063/1.3354096; http://scitation.aip.org/; https://hdl.handle.net/20.500.14352/44401

الاتاحة: https://hdl.handle.net/20.500.14352/44401
https://doi.org/10.1063/1.3354096
http://scitation.aip.org/

المؤلفون: Feijoo, P.C., Toledano-Luque, M., del Prado, A., San Andres, E., Lucia, M.L., Fierro, J.L.G.

المصدر: Proceedings of the 8th Spanish Conference on Electron Devices, CDE'2011 ; page 1-3

الاتاحة: http://dx.doi.org/10.1109/sced.2011.5744185
http://xplorestaging.ieee.org/ielx5/5740656/5744150/05744185.pdf?arnumber=5744185

المؤلفون: Feijoo, P.C., Pampillón, M.A., San Andrés, E., Lucía, M.L.

المصدر: Thin Solid Films ; volume 526, page 81-86 ; ISSN 0040-6090

الاتاحة: http://dx.doi.org/10.1016/j.tsf.2012.11.008
https://api.elsevier.com/content/article/PII:S0040609012014794?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0040609012014794?httpAccept=text/plain

المؤلفون: Feijoo, P.C., Cho, M., Togo, M., San Andrés, E., Groeseneken, G.

المساهمون: Ministerio de Ciencia e Innovación

المصدر: Microelectronics Reliability ; volume 51, issue 9-11, page 1521-1524 ; ISSN 0026-2714

الاتاحة: http://dx.doi.org/10.1016/j.microrel.2011.06.014
https://api.elsevier.com/content/article/PII:S0026271411002137?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0026271411002137?httpAccept=text/plain

المؤلفون: Castán, H., Dueñas, S., Gómez, A., García, H., Bailón, L., Feijoo, P.C., Toledano-Luque, M., del Prado, A., San Andrés, E., Lucía, M.L.

المصدر: Thin Solid Films ; volume 519, issue 7, page 2268-2272 ; ISSN 0040-6090

الاتاحة: http://dx.doi.org/10.1016/j.tsf.2010.10.073
https://api.elsevier.com/content/article/PII:S0040609010015063?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0040609010015063?httpAccept=text/plain

المؤلفون: Pampillón, M.A., Feijoo, P.C., Andrés, E. San, Toledano-Luque, M., del Prado, A., Blázquez, A.J., Lucía, M.L.

المصدر: Microelectronic Engineering ; volume 88, issue 7, page 1357-1360 ; ISSN 0167-9317

الاتاحة: http://dx.doi.org/10.1016/j.mee.2011.03.025
https://api.elsevier.com/content/article/PII:S016793171100284X?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S016793171100284X?httpAccept=text/plain

المؤلفون: Pampillón, M.A., Feijoo, P.C., San Andrés, E., Lucía, M.L., del Prado, A., Toledano-Luque, M.

المصدر: Microelectronic Engineering ; volume 88, issue 9, page 2991-2996 ; ISSN 0167-9317

الاتاحة: http://dx.doi.org/10.1016/j.mee.2011.04.058
https://api.elsevier.com/content/article/PII:S0167931711004825?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0167931711004825?httpAccept=text/plain

المؤلفون: Pampillo?n, M.A., Feijoo, P.C., San Andres, E., Toledano-Luque, M., del Prado, A., Bla?zquez, A.J., Luci?a, M.L.

المصدر: 2011 Spanish Conference on Electron Devices (CDE); 2011, p1-4, 4p

المؤلفون: Toledano-Luque, M., del Prado, A., Feijoo, P.C., Amezaga, A., Andres, E.S., Lucia, M.L.

المصدر: 2009 Spanish Conference on Electron Devices; 2009, p23-26, 4p

المؤلفون: del Prado, A., Toledano-Luque, M., San Andres, E., Feijoo, P.C., Lucia, M.L.

المصدر: 2009 Spanish Conference on Electron Devices; 2009, p16-18, 3p