المؤلفون: Madeira, Henrique

المصدر: PRDC, Pacific Rim International Symposium on Dependable Computing, Beijing, China, November 28-December 1, 2022

مصطلحات موضوعية: CubeSats, COTS, software development, verification and validation, soft errors, fault injection, software fault tolerance techniques

Relation: https://doi.org/10.1109/PRDC55274.2022.00022; oai:zenodo.org:14178243

الاتاحة: https://doi.org/10.1109/PRDC55274.2022.00022

المؤلفون: KaradaÅŸ, Ö.F., Öz, I., …

مصطلحات موضوعية: GPGPU programs, Vulnerability analysis, Error correction, Fault injection, Soft error reliability, Fault tolerance, Program processors, Radiation hardening, Reliability analysis, Error propagation analysis, Fault tolerance techniques, General-purpose computations, Graphics programs, Performance and reliabilities, Reliability level, Reliable execution

Relation: Journal of Supercomputing; Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı; https://hdl.handle.net/11147/14188; https://doi.org/10.1007/s11227-021-04026-6; 78; 2-s2.0-85113722511; Q2; N/A

الاتاحة: https://hdl.handle.net/11147/14188
https://doi.org/10.1007/s11227-021-04026-6

المؤلفون: Al-Dulaimy, Auday, Ashjaei, M., Behnam, M., Nolte, T., Papadopoulos, A. V.

المصدر: Lecture Notes of the Institute for Computer Sciences, Social-Informatics and Telecommunications Engineering, LNICST. :89-101

مصطلحات موضوعية: Cloud computing, Cloud manufacturing, CMfg, Edge computing, Fault tolerance, MaaS, Manufacturing as a Service, Reliability, Computer aided manufacturing, Internet of things, 'current, Cloud-computing, Fault tolerance techniques, Maa, Manufacturing IS, Permanent and temporary faults

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:du-46268

المؤلفون: Ahmadilivani, M. H., Mousavi, Hamid, Raik, J., Daneshtalab, Masoud, Jenihhin, M.

المصدر: Proceedings - 2024 IEEE 30th International Symposium on On-line Testing and Robust System Design, IOLTS 2024.

مصطلحات موضوعية: Error correction, Fault tolerance, Hardening, Multilayer neural networks, Redundancy, Convolutional neural network, Cost effective, Errors correction, Fault resilience, Fault tolerance techniques, Neural-networks, Output channels, Safety critical applications, Selective filters, Triple modular redundancy, Convolutional neural networks

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:mdh:diva-68261

المؤلفون: Shawkat S. Khairullah, Carl R. Elks

المصدر: IET Cyber-Physical Systems (2019)

مصطلحات موضوعية: factory automation, embedded systems, fault tolerant computing, iec standards, programmable controllers, cyber-physical systems, biocomputing, failure analysis, healing layer, safety-critical cyber-physical-systems, safety-critical cps, fault classes, reliable systems, safety-related automation industry, self-healing hardware architecture, biological concepts, critical infrastructure, critical function layer, digital embedded systems, fault tolerance techniques, iec 61131-3 operational schematics, failure occurrence, industrial automation, Computer engineering. Computer hardware, TK7885-7895, Electronic computers. Computer science, QA75.5-76.95

وصف الملف: electronic resource

Relation: https://digital-library.theiet.org/content/journals/10.1049/iet-cps.2019.0022; https://doaj.org/toc/2398-3396

URL الوصول: https://doaj.org/article/dc34d4a2778d495fad89122457450d7d

المؤلفون: D. Yu. Volkanov

المصدر: Моделирование и анализ информационных систем, Vol 23, Iss 2, Pp 119-136 (2016)

مصطلحات موضوعية: dependability, fault tolerance techniques, genetic algorithm, computer systems, reliability, reliability allocation problem, reliability-redundancy allocation problem, evolutionary algorithm, Information technology, T58.5-58.64

وصف الملف: electronic resource

Relation: https://www.mais-journal.ru/jour/article/view/323; https://doaj.org/toc/1818-1015; https://doaj.org/toc/2313-5417

URL الوصول: https://doaj.org/article/7bfae420ed014a829edd326e2f7f0131

المؤلفون: Lindoso Muñoz, Almudena, Entrena Arrontes, Luis Alfonso, García Valderas, Mario, Parra Avellaneda, Luis Isaías

المساهمون: Ministerio de Economía y Competitividad (España)

مصطلحات موضوعية: Fault tolerance, Hybrid fault-tolerance techniques, Microprocessors, Neutron cross-section, SEEs, Soft errors, Electrónica

Relation: Gobierno de España. ESP2015-68245-C4-1-P; Lindoso, A., Entrena, L., Garcia-Valderas, M. & Parra, L. (2017). A Hybrid Fault-Tolerant LEON3 Soft Core Processor Implemented in Low-End SRAM FPGA. IEEE Transactions on Nuclear Science, 64(1), pp. 374–381.; http://hdl.handle.net/10016/32690; https://doi.org/10.1109/TNS.2016.2636574; 374; 381; IEEE Transactions on Nuclear Science; 64; AR/0000019464

الاتاحة: http://hdl.handle.net/10016/32690
https://doi.org/10.1109/TNS.2016.2636574

المؤلفون: Santos, Vinicius Andrade dos, Manacero, Aleardo, Lobato, Renata S., Spolon, Roberta, Cavenaghi, Marcos A., Rocha, A., Perez, B. E., Penalvo, F. G., Miras, M. D., Goncalves, R.

المساهمون: Universidade Estadual Paulista (UNESP)

مصطلحات موضوعية: Fault tolerance techniques, cloud computing communication faults

Relation: 2020 15th Iberian Conference On Information Systems And Technologies (cisti'2020); 2020 15th Iberian Conference On Information Systems And Technologies (cisti'2020). New York: Ieee, 6 p., 2020.; http://hdl.handle.net/11449/209984; WOS:000612720600132

الاتاحة: http://hdl.handle.net/11449/209984

المؤلفون: Parra Avellaneda, Luis Isaías, Lindoso Muñoz, Almudena, Portela García, Marta, Entrena Arrontes, Luis Alfonso, Du, B., Sonza Reorda, Matteo, Sterpone, Luca

المساهمون: Ministerio de Ciencia e Innovación (España)

مصطلحات موضوعية: Fault tolerance, Hybrid fault tolerance techniques, Microprocessors, Single-event effects (SEEs), Soft errors, Electrónica, Energía Nuclear

Relation: Gobierno de España. TEC2010-22095-C03-03; IEEE Transactions on Nuclear Science, (2014), 61(6), pp.: 3236-3243.; http://hdl.handle.net/10016/36003; https://doi.org/10.1109/TNS.2014.2361953; 3236; 3243; IEEE TRANSACTIONS ON NUCLEAR SCIENCE; 61; AR/0000016077

الاتاحة: http://hdl.handle.net/10016/36003
https://doi.org/10.1109/TNS.2014.2361953

المؤلفون: Almudena Lindoso, Boyang Du, Luis Entrena, Luca Sterpone, Marta Portela-Garcia, M. Sonza Reorda, Luis Parra

المساهمون: Ministerio de Ciencia e Innovación (España)

المصدر: IEEE Transactions on Nuclear Science. 61:3236-3243

مصطلحات موضوعية: Nuclear and High Energy Physics, fault injection, Computer science, Soft errors, law.invention, Control flow, Software, law, Software fault tolerance, Single-event effects (SEEs), error detection, Electronic engineering, Overhead (computing), Electrical and Electronic Engineering, Microprocessors, fault tolerance, control flow error detection, Hybrid fault tolerance techniques, business.industry, Fault tolerance, Fault injection, Microprocessor, Nuclear Energy and Engineering, Energía Nuclear, Electrónica, business, Error detection and correction, Computer hardware

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::38c197666ef2079b936a939abfa0bdbe
https://doi.org/10.1109/tns.2014.2361953

المؤلفون: Mario Garcia-Valderas, Luis Parra, Almudena Lindoso, Luis Entrena

المساهمون: Ministerio de Economía y Competitividad (España)

المصدر: e-Archivo. Repositorio Institucional de la Universidad Carlos III de Madrid
instname
e-Archivo: Repositorio Institucional de la Universidad Carlos III de Madrid
Universidad Carlos III de Madrid (UC3M)

مصطلحات موضوعية: Nuclear and High Energy Physics, Engineering, Neutron cross-section, Soft errors, 02 engineering and technology, 01 natural sciences, SEEs, Software fault tolerance, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Overhead (computing), Static random-access memory, Electrical and Electronic Engineering, Field-programmable gate array, Microprocessors, 010308 nuclear & particles physics, business.industry, Fault tolerance, Memory scrubbing, Fault injection, Hybrid fault-tolerance techniques, 020202 computer hardware & architecture, Nuclear Energy and Engineering, Embedded system, Electrónica, business, Error detection and correction

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8672f5e8ee0dc5b318c2273a35448e03
http://hdl.handle.net/10016/32690

المؤلفون: Pham, Thanh-Trung, Defago, Xavier

المصدر: Research report (School of Information Science, Japan Advanced Institute of Science and Technology). :1-12

مصطلحات موضوعية: software fault tolerance techniques, execution models, error detection, component-based reliability prediction

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=jairo_______::ef98e515099e37c2822ecb20b61b7d11
http://hdl.handle.net/10119/12084

المؤلفون: Nicolescu, B., Savaria, B.Y., Velazco, Raoul

المساهمون: École Polytechnique de Montréal (EPM), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)

المصدر: Proceedings.-18th-IEEE-International-Symposium-on-Defect-and-Fault-Tolerance-in-VLSI-Systems ; https://hal.science/hal-00008192 ; 2003, pp.589-596, ⟨10.1109/DFTVS.2003.1250159⟩

مصطلحات موضوعية: safety-critical-applications, software-implemented-error-detection, SIED-, control-check-flow-scheme, software-redundancy, fault-tolerance-techniques, fault-coverage, program-control-flow-faults, data-faults, fault-injection, PACS 85.42, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

Relation: hal-00008192; https://hal.science/hal-00008192

الاتاحة: https://hal.science/hal-00008192
https://doi.org/10.1109/DFTVS.2003.1250159

المؤلفون: Azambuja, José Rodrigo Furlanetto de, Scarpato, Maurício Altieri, Becker, Jürgen, Kastensmidt, Fernanda Gusmão de Lima

مصطلحات موضوعية: Fault tolerance, Hybrid fault tolerance techniques, Microprocessors, SEEs

وصف الملف: application/pdf

Relation: AZAMBUJA, José Rodrigo Furnaletto de et. al. HETA: hybrid error-detection technique using assertions. IEEE Transactions on Nuclear Science, v. 60, n. 4, p. 2805-2812, 2013. Disponível em: . Acesso em: 24 abr. 2015.; http://repositorio.furg.br/handle/1/4962

الاتاحة: http://repositorio.furg.br/handle/1/4962
https://doi.org/10.1109/TNS.2013.2246798

المؤلفون: Azambuja, José Rodrigo Furlanetto de, Nazar, Gabriel Luca, Rech, Paolo, Carro, Luigi, Kastensmidt, Fernanda Gusmão de Lima, Fairbanks, Thomas, Quinn, Heather

مصطلحات موضوعية: Fault tolerance, Hybrid fault tolerance techniques, Microprocessors, Single event effects (SEEs)

وصف الملف: application/pdf

Relation: AZAMBUJA, José Rodrigo Furnaletto de et. al. Evaluating neutron induced SEE in SRAM-based FPGA protected by hardware- and software-based fault tolerant techniques. IEEE Transactions on Nuclear Science, v. 60, n. 6, p. 4243-4250, 2013. Disponível em: . Acesso em: 24 abr. 2015.; http://repositorio.furg.br/handle/1/4958

الاتاحة: http://repositorio.furg.br/handle/1/4958
https://doi.org/10.1109/TNS.2013.2288305

المؤلفون: Sözer H., Tekinerdoǧan, B., Akşit, M.

المصدر: Software Quality Journal

مصطلحات موضوعية: Availability, Fault tolerance, Local recovery, Performance, Software architecture design, Effective approaches, Fault tolerance techniques, Feasible alternatives, Local recoveries, Performance metrics, Potential failures, Design, Optimization, Software architecture, Software reliability, Recovery, archi, envir

Relation: http://hdl.handle.net/11693/21129

الاتاحة: http://hdl.handle.net/11693/21129

المؤلفون: Geissler, Filipe de Aguiar

Thesis Advisors: Kastensmidt, Fernanda Gusmão de Lima

المصدر: Biblioteca Digital de Teses e Dissertações da UFRGSUniversidade Federal do Rio Grande do SulUFRGS.

مصطلحات موضوعية: Microeletrônica, Processadores, Processamento : Sinais, Tolerancia : Falhas, Radiation effects in microprocessors, Fault injection methodology, Processor emulation, Software-based fault tolerance techniques

وصف الملف: application/pdf

الاتاحة: http://hdl.handle.net/10183/107543

المؤلفون: Ishraf Tounsi, Mohammad Saleh, Bilel Boulifa, Ali Jaoua, Samir Elloumi, Sharmeen Kakil

المصدر: Qatar Foundation Annual Research Conference Proceedings Volume 2014 Issue 1.

مصطلحات موضوعية: Computer science, business.industry, Fault tolerance, computer.software_genre, Software quality, Reliability engineering, Software, Fault tolerance techniques, Software fault tolerance, Software construction, N-version programming, Plug-in, Fault Tolerant Software, Software reliability testing, business, computer

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::29a6f7b4f8e251da51e1fade855f9684
https://doi.org/10.5339/qfarc.2014.itpp0982

المؤلفون: Geissler, Filipe de Aguiar

المساهمون: Kastensmidt, Fernanda Gusmão de Lima

المصدر: Biblioteca Digital de Teses e Dissertações da UFRGS
Universidade Federal do Rio Grande do Sul (UFRGS)
instacron:UFRGS

مصطلحات موضوعية: Processadores, Sinais [Processamento], Fault injection methodology, Software-based fault tolerance techniques, Falhas [Tolerancia], Radiation effects in microprocessors, Processor emulation, Microeletrônica

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=od______3056::7d60f1530a03980e102a705011c7ede8

المؤلفون: Azambuja, José Rodrigo Furlanetto de, Lapolli, Ângelo Cardoso, Rosa, Lucas Lemos, Kastensmidt, Fernanda Gusmão de Lima

مصطلحات موضوعية: Fault tolerance, Hybrid fault tolerance techniques, Microprocessors, SEEs

وصف الملف: application/pdf

Relation: AZAMBUJA, José Rodrigo Furnaletto de et al. Detecting SEEs in microprocessors through a non-intrusive hybrid technique. IEEE Transactions on Nuclear Science, v. 58, n. 3, p. 993-1000, 2011. Disponível em:. Acesso em: 13 maio 2015.; http://repositorio.furg.br/handle/1/4978

الاتاحة: http://repositorio.furg.br/handle/1/4978
https://doi.org/10.1109/TNS.2011.2109398