يعرض 1 - 20 نتائج من 71 نتيجة بحث عن '"Fault resilience"', وقت الاستعلام: 0.53s تنقيح النتائج
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    Academic Journal
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    Academic Journal

    المصدر: International Journal of Power Electronics and Drive Systems (IJPEDS), 15(2), 1117-1127, (2024-04-29)

    Relation: oai:zenodo.org:11081650

  3. 3
    Academic Journal
  4. 4
    Dissertation/ Thesis
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    Conference

    المساهمون: Valpreda, Emanuele, Palumbo, Giuseppe, Caon, Michele, Masera, Guido, Martina, Maurizio

    وصف الملف: ELETTRONICO

    Relation: info:eu-repo/semantics/altIdentifier/isbn/979-8-3503-0320-9; info:eu-repo/semantics/altIdentifier/wos/WOS:001018707400070; ispartofbook:2023 18th Conference on Ph.D Research in Microelectronics and Electronics (PRIME); 18th International Conference on PhD Research in Microelectronics and Electronics; firstpage:277; lastpage:280; numberofpages:4; https://hdl.handle.net/11583/2979532; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85165024950; https://ieeexplore.ieee.org/document/10161894

  6. 6
    Conference

    المساهمون: Barbirotta, Marcello, Angioli, Marco, Mastrandrea, Antonio, Cheikh, Abdallah, Jamili, Saeid, Menichelli, Francesco, Olivieri, Mauro

    مصطلحات موضوعية: fault-injection, fault-resilience, single event transient

    Relation: info:eu-repo/semantics/altIdentifier/isbn/9783031481208; info:eu-repo/semantics/altIdentifier/isbn/9783031481215; ispartofbook:Lecture Notes in Electrical Engineering; International Conference on Applications in Electronics Pervading Industry, Environment and Society, APPLEPIES 2023; volume:1110 LNEE; firstpage:42; lastpage:48; numberofpages:7; serie:LECTURE NOTES IN ELECTRICAL ENGINEERING; https://hdl.handle.net/11573/1722576

  7. 7
    Conference

    المساهمون: Barbirotta, Marcello, Menichelli, Francesco, Mastrandrea, Antonio, Cheikh, Abdallah, Angioli, Marco, Jamili, Saeid, Olivieri, Mauro

    مصطلحات موضوعية: dual core lock-step, fault resilience, fault tolerance

    Relation: info:eu-repo/semantics/altIdentifier/isbn/9783031481208; info:eu-repo/semantics/altIdentifier/isbn/9783031481215; ispartofbook:Lecture Notes in Electrical Engineering; International Conference on Applications in Electronics Pervading Industry, Environment and Society, APPLEPIES 2023; volume:1110 LNEE; firstpage:15; lastpage:21; numberofpages:7; serie:LECTURE NOTES IN ELECTRICAL ENGINEERING; https://hdl.handle.net/11573/1722575

  8. 8
    Academic Journal

    المؤلفون: Foisal Ahmed, Maksim Jenihhin

    المصدر: Sensors; Volume 22; Issue 16; Pages: 6286

    وصف الملف: application/pdf

    Relation: Vehicular Sensing; https://dx.doi.org/10.3390/s22166286

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  10. 10
    Academic Journal
  11. 11
    Report

    المساهمون: Bronevetsky, G. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)]

    وصف الملف: Medium: ED; Size: PDF-file: 23 pages; size: 1.8 Mbytes

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    Academic Journal

    المصدر: Electronics; Volume 10; Issue 6; Pages: 686

    وصف الملف: application/pdf

    Relation: Artificial Intelligence Circuits and Systems (AICAS); https://dx.doi.org/10.3390/electronics10060686

  14. 14
    Conference

    المساهمون: Barbirotta, Marcello, Menichelli, Francesco, Mastrandrea, Antonio, Cheikh, Abdallah, Jamili, Saeid, Angioli, Marco, Olivieri, Mauro

    مصطلحات موضوعية: fault resilience, dual core lock-step, dault tolreance

    Relation: info:eu-repo/semantics/altIdentifier/isbn/978-3-031-48710-1; info:eu-repo/semantics/altIdentifier/isbn/978-3-031-48711-8; ispartofbook:SIE 2023: Proceedings of SIE 2023; 54th Annual Meeting of the Italian Electronics Society; volume:1113; firstpage:363; lastpage:368; numberofpages:6; serie:LECTURE NOTES IN ELECTRICAL ENGINEERING; https://hdl.handle.net/11573/1692824; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85180155253

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    Academic Journal

    المساهمون: Gaglianese, M., Forti, S., Paganelli, F., Brogi, A.

    Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:001002052600001; journal:FUTURE GENERATION COMPUTER SYSTEMS; https://hdl.handle.net/11568/1175247; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85159094432

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  17. 17
    Conference

    المساهمون: Krishnamoorthy, Sriram

    المصدر: Conference: Proceedings of the the 10th IEEE/ACM International Conference on Cluster, Cloud and Grid Computing (CCGrid 2010), 709-714

    وصف الملف: Medium: X

  18. 18
    Academic Journal

    المصدر: International Journal of Managment, IT and Engineering 2(1):152-162. 2012

  19. 19
    Conference

    المؤلفون: Soldani J., Brogi A.

    المساهمون: R. Adler, A. Bennaceur, S. Burton, A. Di Salle, N. Nostro, R.L. Olsen, S. Saidi, P. Schleiss, D. Schneider, H.P. Schwefel, Soldani, J., Brogi, A.

    مصطلحات موضوعية: Chaos testing, Cloud-native application, Fault resilience

    Relation: info:eu-repo/semantics/altIdentifier/isbn/978-3-030-86506-1; info:eu-repo/semantics/altIdentifier/isbn/978-3-030-86507-8; info:eu-repo/semantics/altIdentifier/wos/WOS:000890195000010; ispartofbook:Dependable Computing - EDCC 2021 Workshops; 17th European Dependable Computing Conference, EDCC 2021; volume:1462; firstpage:101; lastpage:108; numberofpages:8; serie:COMMUNICATIONS IN COMPUTER AND INFORMATION SCIENCE; alleditors:R. Adler, A. Bennaceur, S. Burton, A. Di Salle, N. Nostro, R.L. Olsen, S. Saidi, P. Schleiss, D. Schneider, H.P. Schwefel; http://hdl.handle.net/11568/1119384; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85115443420; https://link.springer.com/chapter/10.1007/978-3-030-86507-8_10

  20. 20
    Conference

    المساهمون: Nieplocha, Jaroslaw

    المصدر: Conference: Parallel Computing: Architectures, Algorithms and Applications: NIC Series, 38:339-345

    وصف الملف: Medium: X