المؤلفون: Habib, M. S., Farhad, S. F. U., Tanvir, N. I., Alam, M. S., Bitu, M. N. A., Islam, M. S., Islam, S., Khatun, N., Hossain, M. S

مصطلحات موضوعية: Physics - Applied Physics, Condensed Matter - Materials Science

URL الوصول: http://arxiv.org/abs/2306.10400

المؤلفون: Musa, A. M. M., Farhad, S. F. U., Gafur, M. A., Jamil, A. T. M. K.

مصطلحات موضوعية: Physics - Applied Physics, Condensed Matter - Materials Science

URL الوصول: http://arxiv.org/abs/2106.10551

المؤلفون: Alam, Rabeya Binta, Ahmad, Md. Hasive, Farhad, S. F. U., Islam, Muhammad Rakibul

المصدر: Journal of Applied Physics; 3/28/2022, Vol. 131 Issue 12, p1-10, 10p

مصطلحات موضوعية: SINGLE walled carbon nanotubes, DIELECTRIC strength, DIELECTRIC relaxation, NANOCOMPOSITE materials, DIELECTRICS, DIELECTRIC properties, CARBON nanotubes

المؤلفون: Fardush Tanha, Jannatul^1,2 (AUTHOR), Farhad, S. F. U.^1,3 (AUTHOR), Honey, U.¹ (AUTHOR), Tanvir, N. I.^1,3 (AUTHOR), Hasan, Tarique² (AUTHOR), Shahriyar Nishat, Sadiq⁴ (AUTHOR), Kabir, Alamgir⁵ (AUTHOR), Ahmed, Shahran² (AUTHOR), Hakim, Mahmuda⁶ (AUTHOR), Khan, M. N. I.⁷ (AUTHOR), Moniruzzaman, Mohammad³ (AUTHOR), Ahmed, Imtiaz² (AUTHOR) s.f.u.farhad@bcsir.gov.bd

المصدر: Journal of Applied Physics. 12/21/2021, Vol. 130 Issue 23, p1-13. 13p.

مصطلحات موضوعية: *SCHEELITE, *ENERGY dispersive X-ray spectroscopy, *FIELD emission electron microscopy, *RIETVELD refinement, *REFLECTANCE spectroscopy, *POWDERS, *INTRAMOLECULAR proton transfer reactions, *X-ray powder diffraction

المؤلفون: Fardush Tanha, Jannatul, Farhad, S. F. U., Honey, U., Tanvir, N. I., Hasan, Tarique, Shahriyar Nishat, Sadiq, Kabir, Alamgir, Ahmed, Shahran, Hakim, Mahmuda, Khan, M. N. I., Moniruzzaman, Mohammad, Ahmed, Imtiaz

المصدر: Journal of Applied Physics; 12/21/2021, Vol. 130 Issue 23, p1-13, 13p

مصطلحات موضوعية: SCHEELITE, ENERGY dispersive X-ray spectroscopy, FIELD emission electron microscopy, RIETVELD refinement, REFLECTANCE spectroscopy, POWDERS, INTRAMOLECULAR proton transfer reactions, X-ray powder diffraction

المؤلفون: Farhad, S. F. U., Tanvir, N. I., Bashar, M. S., Sultana, M.

المصدر: MRS Advances ; volume 4, issue 16, page 921-928 ; ISSN 2059-8521

الاتاحة: http://dx.doi.org/10.1557/adv.2019.65
http://link.springer.com/content/pdf/10.1557/adv.2019.65.pdf
http://link.springer.com/article/10.1557/adv.2019.65/fulltext.html
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S2059852119000653

المؤلفون: Farhad, S. F. U., Majumder, S., Hossain, Md. A., Tanvir, N. I., Akter, R., Patwary, Md. A. M.

المصدر: MRS Advances ; volume 4, issue 16, page 937-944 ; ISSN 2059-8521

الاتاحة: http://dx.doi.org/10.1557/adv.2019.139
http://link.springer.com/content/pdf/10.1557/adv.2019.139.pdf
http://link.springer.com/article/10.1557/adv.2019.139/fulltext.html
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S2059852119001397

المؤلفون: Musa, A. M. M., Farhad, S. F. U., Gafur, M. A., Jamil, A. T. M. K.

المصدر: AIP Advances; Nov2021, Vol. 11 Issue 11, p1-12, 12p

مصطلحات موضوعية: COPPER oxide films, COPPER oxide, THIN films, OPTICAL properties, CARRIER density, SOL-gel processes

المؤلفون: Farhad, S. F. U., Tanvir, N. I., Bashar, M. S., Hossain, M. S., Sultana, M., Khatun, N.

المصدر: Bangladesh Journal of Scientific & Industrial Research; 2018, Vol. 53 Issue 4, p233-244, 12p

مصطلحات موضوعية: ZINC oxide, HYDROTHERMAL synthesis, NANORODS, CASTING (Manufacturing process), SCANNING electron microscopes

المؤلفون: CHOWDHURY, R. I., HOSSEN, M. A., MUSTAFA, G., HUSSAIN, S., RAHMAN, S. N., FARHAD, S. F. U., MURATA, K., TAMBO, T., ISLAM, A. B. M. O.

المصدر: International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics; 12/10/2010, Vol. 24 Issue 30, p5901-5911, 11p

مصطلحات موضوعية: THIN films, OPTICAL properties, ELECTRIC properties of thin films, CADMIUM sulfide, SUBSTRATES (Materials science), GLASS, X-ray diffraction, STRUCTURAL analysis (Science), ELECTRIC conductivity

المؤلفون: MOLLA, M. Z., CHOWDHURY, M. R. I., MUSTAFA, G., HUSSAIN, S., HOSSAIN, K. S., RAHMAN, S. N., KHATUN, N., AHMED, N. A., FARHAD, S. F. U., MURATA, K., TAMBO, T., ISLAM, A. B. M. O.

المصدر: International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics; 12/10/2009, Vol. 23 Issue 30, p5695-5704, 10p, 1 Color Photograph, 1 Black and White Photograph, 2 Charts, 6 Graphs

مصطلحات موضوعية: SILVER sulfide, THIN films, SOLID state electronics, ATOMIC force microscopy, SCANNING electron microscopy

المؤلفون: Abu Kowsar, Rahaman, M., Islam, M. S., Imam, A. Y., Debnath, S. C., Sultana, M., Hoque, M. A., Sharmin, A., Mahmood, Z. H., Farhad, S. F. U.

المصدر: Scopus-Elsevier

URL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::00bb833ca326bc1ecfe56342bb33b530
http://www.scopus.com/inward/record.url?eid=2-s2.0-85070953699&partnerID=MN8TOARS

المؤلفون: Abu Kowsar, Farhad, S. F. U.

المصدر: Scopus-Elsevier

URL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::25158508ef9581a15ca772c9b0322bab
http://www.scopus.com/inward/record.url?eid=2-s2.0-85059342895&partnerID=MN8TOARS

المؤلفون: Abu Kowsar, Sakib, S. N., Billah, M., Dey, S., Babi, K. N., Bahar, A. N., Farhad, S. F. U.

المصدر: Scopus-Elsevier

URL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::57268536f4ad63fea00aa709820b693a
http://www.scopus.com/inward/record.url?eid=2-s2.0-85092133768&partnerID=MN8TOARS

المؤلفون: Abu Kowsar, Farhad, S. F. U., Sakib, S. N.

المصدر: Scopus-Elsevier
Web of Science

URL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::1f840093d356f2fec71a3da366bb6f0a
http://www.scopus.com/inward/record.url?eid=2-s2.0-85059348270&partnerID=MN8TOARS