المؤلفون: Ludwig, Peter, Bishop, Shawn, Egli, Ramon, Chernenko, Valentyna, Deneva, Boyana, Faestermann, Thomas, Famulok, Nicolai, Fimiani, Leticia, Gomez-Guzman, Jose Manuel, Hain, Karin, Korschinek, Gunther, Hanzlik, Marianne, Merchel, Silke, Rugel, Georg

المصدر: Proceedings of the National Academies of Science, vol. 113 (2016) pg. 9232-9237

مصطلحات موضوعية: Astrophysics - Solar and Stellar Astrophysics, Astrophysics - Earth and Planetary Astrophysics

URL الوصول: http://arxiv.org/abs/1710.09573

المؤلفون: Ludwig, Peter, Bishop, Shawn, Egli, Ramon, Chernenko, Valentyna, Deneva, Boyana, Faestermann, Thomas, Famulok, Nicolai, Fimiani, Leticia, Gómez-Guzmán, José Manuel, Hain, Karin, Korschinek, Gunther, Hanzlik, Marianne, Merchel, Silke, Rugel, Georg

المصدر: Proceedings of the National Academy of Sciences of the United States of America, 2016 Aug . 113(33), 9232-9237.

URL الوصول: https://www.jstor.org/stable/26471411

المؤلفون: Weber, Johannes, Kaschani, Karim T., Gieser, Horst, Wolf, Heinrich, Maurer, Linus, Famulok, Nicolai, Moser, Reinhard, Rajagopal, Krishna, Sellmayer, Michael, Sharma, Anmol, Tamm, Heiko

المصدر: 978-1-58537-293-5 ; Weber, Johannes; Kaschani, Karim T.; Gieser, Horst; Wolf, Heinrich; Maurer, Linus; Famulok, Nicolai; Moser, Reinhard; Rajagopal, Krishna; Sellmayer, Michael; Sharma, Anmol; Tamm, Heiko: Correlation study of different CDM testers and CC-TLP. In: Electrical Overstress/Electrostatic Discharge Symposium (39., 2017, Tucson, AZ). IEEE, 2017, S. 1-10, DOI:10.23919/EOSESD.2017.8073446 . ISBN 978-1-58537-293-5.

Relation: http://athene-forschung.unibw.de/node?id=121078; https://doi.org/10.23919/EOSESD.2017.8073446

الاتاحة: http://athene-forschung.unibw.de/node?id=121078
https://doi.org/10.23919/EOSESD.2017.8073446

المؤلفون: Weber, Johannes, Kaschani, Karim T., Gieser, Horst, Wolf, Heinrich, Maurer, Linus, Famulok, Nicolai, Moser, Reinhard, Rajagopal, Krishna, Sellmayer, Michael, Sharma, Anmol, Tamm, Heiko

مصطلحات موضوعية: ESD, CDM, CC-TLP, Capacitively Coupled Transmission Line Pulsing, failure threshold, correlation, rise time

وصف الملف: application/pdf

Relation: ESD Forum 2017; 15. ESD Forum 2017. Tagungsband; https://publica.fraunhofer.de/handle/publica/399668

الاتاحة: https://publica.fraunhofer.de/handle/publica/399668
https://doi.org/10.24406/publica-fhg-399668