المؤلفون: Paul Schwanitz von Keitz, Dana Kleimeier, Christoph Fabian Lutter, Mirko Rehberg, Wolfram Mittelmeier, Richard Kasch, Katrin Osmanski-Zenk, Susanne Fröhlich

المصدر: Heliyon, Vol 8, Iss 12, Pp e11942- (2022)

مصطلحات موضوعية: Developmental hip dysplasia, Biomechanics, Abduction orthoses, Tübinger orthosis, MittelmeierGraf orthosis, Axial force, Science (General), Q1-390, Social sciences (General), H1-99

وصف الملف: electronic resource

Relation: http://www.sciencedirect.com/science/article/pii/S2405844022032303; https://doaj.org/toc/2405-8440

URL الوصول: https://doaj.org/article/21c1e70add9440a78024a1ffa703a2a3

المؤلفون: Fell, Jonas, Fabian, Lutter, Christoph, Pauly, Michael, Engstler, Feng, Han, Rémi, Costa, Simon, Zabler, Michael, Maisl, Frank, Mücklich, Randolf, Hanke, Hans-Georg, Herrmann

مصطلحات موضوعية: Elektrochemische Energietechnik

وصف الملف: application/pdf

Relation: https://elib.dlr.de/198005/1/Fell%20Lutter%20et%20al%202023%20-%20Correlative%20microscopy%20using%20SEM%20based%20nano-CT%20%28002%29.pdf; Fell, Jonas und Fabian, Lutter und Christoph, Pauly und Michael, Engstler und Feng, Han und Rémi, Costa und Simon, Zabler und Michael, Maisl und Frank, Mücklich und Randolf, Hanke und Hans-Georg, Herrmann (2023) Correlative microscopy using SEM based nano-CT. In: X-Ray Nanoimaging: Instruments and Methods VI 2023, 12698. SPIE Optics + Photonics, 2023-08-20 - 2023-08-24, San Diego, California, United States. doi:10.1117/12.2677235 . ISBN 978-151066610-8. ISSN 0277-786X.

الاتاحة: https://elib.dlr.de/198005/
https://elib.dlr.de/198005/1/Fell%20Lutter%20et%20al%202023%20-%20Correlative%20microscopy%20using%20SEM%20based%20nano-CT%20%28002%29.pdf

المؤلفون: Hans-Georg Herrmann, Philipp Stahlhut, Jonas Fell, Randolf Hanke, Simon Zabler, Fabian Lutter, Kilian Dremel

المصدر: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. :10-17

مصطلحات موضوعية: 0303 health sciences, Nuclear and High Energy Physics, Materials science, business.industry, Scanning electron microscope, Resolution (electron density), 02 engineering and technology, Integrated circuit, 021001 nanoscience & nanotechnology, Focused ion beam, Sample (graphics), law.invention, 03 medical and health sciences, Optics, Sampling (signal processing), law, Tomography, 0210 nano-technology, business, Instrumentation, Image resolution, 030304 developmental biology

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f6f87df2c4db22eb95fc13601250a32b
https://doi.org/10.1016/j.nimb.2021.05.006