نتائج البحث - "FIEGNA, CLAUDIO"

المصدر: Lecture Notes in Electrical Engineering ; Proceedings of SIE 2023 ; page 288-297 ; ISSN 1876-1100 1876-1119 ; ISBN 9783031487101 9783031487118

الاتاحة: http://dx.doi.org/10.1007/978-3-031-48711-8_35
https://link.springer.com/content/pdf/10.1007/978-3-031-48711-8_35

View record in BASE

7

Academic Journal

Hot-Carrier Degradation in Power LDMOS: Selective LOCOS-Versus STI-Based Architecture

المؤلفون: Tallarico, Andrea Natale, Reggiani, Susanna, Depetro, Riccardo, Torti, Andrea Mario, Croce, Giuseppe, Sangiorgi, Enrico, Fiegna, Claudio

المساهمون: Tallarico, Andrea Natale*, Reggiani, Susanna, Depetro, Riccardo, Torti, Andrea Mario, Croce, Giuseppe, Sangiorgi, Enrico, Fiegna, Claudio

مصطلحات موضوعية: Hot-carrier degradation/stre, LOCOS, multiple-particle proce, on-resistance degradation, single-particle proce, STI, TCAD simulation, Biotechnology, Electronic, Optical and Magnetic Material, Electrical and Electronic Engineering

وصف الملف: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000423582900033; volume:6; issue:1; firstpage:219; lastpage:226; numberofpages:8; journal:IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY; info:eu-repo/grantAgreement/EC/H2020/653933; http://hdl.handle.net/11585/631863; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85041449805; http://ieeexplore.ieee.org/servlet/opac?punumber=6245494

الاتاحة: http://hdl.handle.net/11585/631863
https://doi.org/10.1109/JEDS.2018.2792539
http://ieeexplore.ieee.org/servlet/opac?punumber=6245494

View record in BASE

8

Academic Journal

Hot-carrier degradation in power LDMOS: Drain bias dependence and lifetime evaluation

المؤلفون: Tallarico, Andrea Natale, Reggiani, Susanna, Depetro, Riccardo, Manzini, Stefano, Torti, Andrea Mario, Croce, Giuseppe, Sangiorgi, Enrico, Fiegna, Claudio

المساهمون: Tallarico, Andrea Natale*, Reggiani, Susanna, Depetro, Riccardo, Manzini, Stefano, Torti, Andrea Mario, Croce, Giuseppe, Sangiorgi, Enrico, Fiegna, Claudio

مصطلحات موضوعية: Hot-carrier stress (HCS), lateral double-diffused MOSFET (LDMOS) transistor, lifetime evaluation, ON-resistance degradation, TCAD simulation

وصف الملف: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000448030000065; volume:65; issue:11; firstpage:5195; lastpage:5198; numberofpages:4; journal:IEEE TRANSACTIONS ON ELECTRON DEVICES; info:eu-repo/grantAgreement/EC/H2020/737417; http://hdl.handle.net/11585/664310; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85053157457; https://ieeexplore.ieee.org/document/8458210

الاتاحة: http://hdl.handle.net/11585/664310
https://doi.org/10.1109/TED.2018.2867650
https://ieeexplore.ieee.org/document/8458210

View record in BASE

9

A novel approach to analyze the reliability of GaN power HEMTs operating in a DC-DC Buck converter

المؤلفون: Capasso, Giuseppe, Zanuccoli, Mauro, Tallarico, Andrea Natale, Fiegna, Claudio

المصدر: ESSDERC 2022-IEEE 52nd European Solid-State Device Research Conference (ESSDERC)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c2b764097ac85f3ba29b622bf33c8756
https://doi.org/10.1109/essderc55479.2022.9947200

View record in OpenAIRE

10

Academic Journal

Investigation of the hot carrier degradation in power LDMOS transistors with customized thick oxide

المؤلفون: TALLARICO, ANDREA NATALE, REGGIANI, SUSANNA, Magnone, P., Croce, G., Depetro, R., Gattari, P., SANGIORGI, ENRICO, FIEGNA, CLAUDIO

المساهمون: Tallarico, A. N., Reggiani, S., Magnone, P., Croce, G., Depetro, R., Gattari, P., Sangiorgi, E., Fiegna, C.

مصطلحات موضوعية: Hot-carrier degradation, Interface trap, LDMOS transistor, Modelling, ON-state stre, Reliability

وصف الملف: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000414817500086; volume:76-77; issue:Special Issue 28th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis; firstpage:475; lastpage:479; numberofpages:5; journal:MICROELECTRONICS RELIABILITY; info:eu-repo/grantAgreement/EC/H2020/653933; http://hdl.handle.net/11585/609463; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85023634085; http://www.sciencedirect.com/science/article/pii/S002627141730327X

الاتاحة: http://hdl.handle.net/11585/609463
https://doi.org/10.1016/j.microrel.2017.07.043
http://www.sciencedirect.com/science/article/pii/S002627141730327X

View record in BASE

11

Periodical

In-Circuit Assessment of the Long-Term Reliability of E-Mode GaN HEMTs

المؤلفون: Capasso, Giuseppe, Zanuccoli, Mauro, Tallarico, Andrea Natale, Fiegna, Claudio

المصدر: IEEE Transactions on Electron Devices; November 2023, Vol. 70 Issue: 11 p5807-5813, 7p

12

Academic Journal

Numerical Simulation and Experimental Characterization of Emitter Wrap through Solar Cells with Deep Grooved Base Contact (EWT-DGB)

المؤلفون: Nicolai, Massimo, Zanuccoli, Mauro, Paternoster, Giovanni, de Ceglia, Giuseppe, Ferrario, Lorenza, Bellutti, Pierluigi, Sangiorgi, Enrico, Fiegna, Claudio

مصطلحات موضوعية: General Energy

Relation: url:https://www.openaccessrepository.it/communities/itmirror; https://www.openaccessrepository.it/record/34558

الاتاحة: https://www.openaccessrepository.it/record/34558
https://doi.org/10.1016/j.egypro.2016.07.015

View record in BASE

13

Academic Journal

Simulation Study of Light-induced, Current-induced Degradation and Recovery on PERC Solar Cells

المؤلفون: Nicolai, Massimo, Zanuccoli, Mauro, Galiazzo, Marco, Bertazzo, Matteo, Sangiorgi, Enrico, Fiegna, Claudio

المصدر: Energy Procedia ; volume 92, page 153-159 ; ISSN 1876-6102

الاتاحة: http://dx.doi.org/10.1016/j.egypro.2016.07.014
https://api.elsevier.com/content/article/PII:S1876610216304416?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S1876610216304416?httpAccept=text/plain

View record in BASE

14

Book

Nanowire based solar cells

المؤلفون: Zanuccoli, Mauro, Kaminski-Cachopo, Anne, Michallon, Jérôme, Consonni, Vincent, Semenikhin, Igar, Daanoune, Mehdi, Ducroquet, Frédérique, Kohen, David, Morin, Christine, Fiegna, Claudio

المساهمون: Department of electrical, electronic and information engineering "GUGLIELMO MARCONI" Bologna (DEI), Alma Mater Studiorum Università di Bologna = University of Bologna (UNIBO), Advanced Research Center on Electronic Systems for Information and Communication Technologies E. De Castro Bologna (ARCES), Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Institut National Polytechnique de Grenoble (INPG)-Université Savoie Mont Blanc (USMB Université de Savoie Université de Chambéry )-Centre National de la Recherche Scientifique (CNRS), Laboratoire des matériaux et du génie physique (LMGP), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Institut National Polytechnique de Grenoble (INPG)-Institut de Chimie - CNRS Chimie (INC-CNRS)-Centre National de la Recherche Scientifique (CNRS), Moscow Institute of Physics and Technology Moscow (MIPT), Laboratoire d'Innovation pour les Technologies des Energies Nouvelles et les nanomatériaux (LITEN), Institut National de L'Energie Solaire (INES), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Savoie Mont Blanc (USMB Université de Savoie Université de Chambéry )-Centre National de la Recherche Scientifique (CNRS)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Savoie Mont Blanc (USMB Université de Savoie Université de Chambéry )-Centre National de la Recherche Scientifique (CNRS)-Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Ed. by F. Balestra, European Project: 257375,ICT,FP7-ICT-2009-5,NANOFUNCTION(2010)

المصدر: Beyond CMOS Nanodevices 1 ; https://hal.science/hal-01059625 ; Ed. by F. Balestra. Beyond CMOS Nanodevices 1, Wiley-ISTE, pp.221-248, 2014, Nanoscience and Nanotechnology Series, 978-1-84821-654-9, 978-1-11898-477-2

مصطلحات موضوعية: solar cell, nanowire, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

Relation: info:eu-repo/grantAgreement//257375/EU/Beyond CMOS Nanodevices for Adding Functionalities to CMOS/NANOFUNCTION

الاتاحة: https://hal.science/hal-01059625

View record in BASE

15

Book

Towards Self-Powered Systems: Using Nanostructures to Harvest Ambient Energy

المؤلفون: Ardila, Gustavo, Kaminski-Cachopo, Anne, Pala, Marco, Cresti, Alessandro, Montès, Laurent, Consonni, Vincent, Hinchet, Ronan, Michallon, Jerome, Daanoune, Mehdi, Zanuccoli, Mauro, Fiegna, Claudio, Mouis, Mireille

المساهمون: Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Institut National Polytechnique de Grenoble (INPG)-Université Savoie Mont Blanc (USMB Université de Savoie Université de Chambéry )-Centre National de la Recherche Scientifique (CNRS), Laboratoire des matériaux et du génie physique (LMGP), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Institut National Polytechnique de Grenoble (INPG)-Institut de Chimie - CNRS Chimie (INC-CNRS)-Centre National de la Recherche Scientifique (CNRS), Department of electrical, electronic and information engineering "GUGLIELMO MARCONI" Bologna (DEI), Alma Mater Studiorum Università di Bologna = University of Bologna (UNIBO), A. Nazarov, F. Balestra, V. Kilchytska, D. Flandre, European Project: 257375,ICT,FP7-ICT-2009-5,NANOFUNCTION(2010)

المصدر: Functional Nanomaterials and Devices for Electronics, Sensors and Energy Harvesting ; https://hal.science/hal-01966696 ; A. Nazarov; F. Balestra; V. Kilchytska; D. Flandre. Functional Nanomaterials and Devices for Electronics, Sensors and Energy Harvesting, Springer International Publishing, pp.223-240, 2014, 978-3-319-08803-7. ⟨10.1007/978-3-319-08804-4_11⟩

مصطلحات موضوعية: [SPI]Engineering Sciences [physics]

Relation: info:eu-repo/grantAgreement//257375/EU/Beyond CMOS Nanodevices for Adding Functionalities to CMOS/NANOFUNCTION

الاتاحة: https://hal.science/hal-01966696
https://doi.org/10.1007/978-3-319-08804-4_11

View record in BASE

16

Academic Journal

Understanding the Influence of Busbars in Large-Area IBC Solar Cells by Distributed SPICE Simulations

المؤلفون: Paolo Magnone, Maarten Debucquoy, Daniele Giaffreda, Niels Posthuma, FIEGNA, CLAUDIO

المساهمون: Paolo Magnone, Maarten Debucquoy, Daniele Giaffreda, Niels Posthuma, Claudio Fiegna

مصطلحات موضوعية: Photovoltaic, SOLAR CELLS, NUMERICAL SIMULATION

وصف الملف: STAMPA

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000353524800012; volume:5; issue:2; firstpage:552; lastpage:558; numberofpages:7; journal:IEEE JOURNAL OF PHOTOVOLTAICS; http://hdl.handle.net/11585/469969; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84924141952; https://ieeexplore.ieee.org/document/7031386

الاتاحة: http://hdl.handle.net/11585/469969
https://doi.org/10.1109/JPHOTOV.2015.2392939
https://ieeexplore.ieee.org/document/7031386

View record in BASE