المساهمون: George, Easo [ORNL]

المصدر: Acta Materialia; 57; 2

وصف الملف: Medium: X; Size: 503-510

URL الوصول: http://www.osti.gov/scitech/biblio/947586

المؤلفون: Presley, Michael

مصطلحات موضوعية: Materials Science, Metallurgy, Radiation, Focused ion beam, radiation damage, FIB damage, collision cascade, sample preparation, TEM, STEM, FIB, crystalline defects, amorphous, amorphous damage, needle, damage measurement, semiconductor, metal, intermetallic

الاتاحة: http://rave.ohiolink.edu/etdc/view?acc_num=osu1469056293

المؤلفون: B. Amon, G. Spoldi, Mathias Rommel, V. Yanev, S. Beuer, Lothar Frey, A.J. Bauer, S. Petersen, J. D. Jambreck

المساهمون: Publica

المصدر: Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 28:595-607

مصطلحات موضوعية: focused ion beam, Materials science, SPM, Analytical chemistry, scanning probe microscopy, Focused ion beam, FIB damage, Scanning probe microscopy, FIB, Ion beam deposition, Microscopy, Materials Chemistry, Electrical and Electronic Engineering, Electron beam-induced deposition, SSRM, Instrumentation, business.industry, Process Chemistry and Technology, Scanning confocal electron microscopy, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, SCM, Transmission electron microscopy, Scanning ion-conductance microscopy, Optoelectronics, business

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::20d54c29f48e54e1a4297747ec1c9e37
https://doi.org/10.1116/1.3431085

المؤلفون: Beuer, Susanne, Yanev, V., Rommel, Mathias, Bauer, A.J., Ryssel, H.

مصطلحات موضوعية: SSRM, FIB damage, ion beam damage

Time: 670

Relation: International Vacuum Congress (IVC) 2007; International Conference on Surface Science (ICSS) 2007; International Conference on Nanoscience and Technology (ICN+T) 2007; 17th International Vacuum Congress (IVC-17), 13th International Conference on Surface Science (ICSS-13) and International Conference on Nanoscience and Technology (ICN+T) 2007. Part 5: Nanoscience; https://publica.fraunhofer.de/handle/publica/358003

الاتاحة: https://publica.fraunhofer.de/handle/publica/358003
https://doi.org/10.1088/1742-6596/100/5/052007

المؤلفون: Millaku, Agron, Lešer, Vladka, Drobne, Damjana, Godec, Matjaž, Torkar, Matjaž, Jenko, Monika, Milani, Marziale, Tatti, Francesco

المصدر: Protoplasma, vol. 1-4, no. 241, pp. 83-89, 2010. ; ISSN: 0033-183X

مصطلحات موضوعية: FIB/SEM, FIB damage, conductive staining, terrestrial isopod, digestive glands, digestive gland epithelium, electron microscopy, scaning electron microscopy, crustacea, info:eu-repo/classification/udc/576

وصف الملف: text/url

Relation: https://repozitorij.uni-lj.si/IzpisGradiva.php?id=36277; https://repozitorij.uni-lj.si/Dokument.php?id=36288&dn=; https://plus.si.cobiss.net/opac7/bib/6240377?lang=sl

الاتاحة: https://repozitorij.uni-lj.si/IzpisGradiva.php?id=36277
https://repozitorij.uni-lj.si/Dokument.php?id=36288&dn=
https://plus.si.cobiss.net/opac7/bib/6240377?lang=sl

المؤلفون: Lešer, Vladka, Milani, Marziale, Tatti, Francesco, Pipan Tkalec, Živa, Štrus, Jasna, Drobne, Damjana

المصدر: Protoplasma, vol. 1-4, no. 246, pp. 41-48, 2010. ; ISSN: 0033-183X

مصطلحات موضوعية: FIB/SEM, FIB damage, histopathology, terestrial isopods, edx analyses, crustacea, info:eu-repo/classification/udc/576

وصف الملف: text/url

Relation: https://repozitorij.uni-lj.si/IzpisGradiva.php?id=36278; https://repozitorij.uni-lj.si/Dokument.php?id=36289&dn=; https://plus.si.cobiss.net/opac7/bib/6240633?lang=sl

الاتاحة: https://repozitorij.uni-lj.si/IzpisGradiva.php?id=36278
https://repozitorij.uni-lj.si/Dokument.php?id=36289&dn=
https://plus.si.cobiss.net/opac7/bib/6240633?lang=sl

المؤلفون: Saowadee, Nath, Agersted, Karsten, Bowen, Jacob R.

المصدر: Saowadee , N , Agersted , K & Bowen , J R 2012 , ' Effects of focused ion beam milling on electron backscatter diffraction patterns in strontium titanate and stabilized zirconia ' , Journal of Microscopy , vol. 246 , no. 3 , pp. 279-286 . https://doi.org/10.1111/j.1365-2818.2012.03616.x

مصطلحات موضوعية: Band contrast, Band slope, 3D-EBSD, FIB damage, Pattern quality, Solid oxide cells, Stabilized zirconia, Strontium titanate

Relation: https://orbit.dtu.dk/en/publications/bf12eb41-cdb9-4238-8dab-f7e7400aa5aa

الاتاحة: https://orbit.dtu.dk/en/publications/bf12eb41-cdb9-4238-8dab-f7e7400aa5aa
https://doi.org/10.1111/j.1365-2818.2012.03616.x

المؤلفون: Matteson, T. L., Schwarz, S. W., Houge, E. C.

المصدر: Scopus Export 2000s

مصطلحات موضوعية: Amorphous, Cu, Dual beam, EBSD, EBSP, FIB, FIB damage, Image quality, Si, TRIM

Relation: https://stars.library.ucf.edu/scopus2000/3045

الاتاحة: https://stars.library.ucf.edu/scopus2000/3045

المصدر: Faculty Bibliography 2000s

مصطلحات موضوعية: FIB, EBSD, EBSP, Cu, Si, FIB damage, amorphous, TRIM, image quality, dual beam, TEM SPECIMEN PREPARATION, LIFT-OUT, Engineering, Electrical & Electronic, Materials Science, Multidisciplinary, Physics, Applied

Relation: https://stars.library.ucf.edu/facultybib2000/3354

الاتاحة: https://stars.library.ucf.edu/facultybib2000/3354