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1
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2Conference
المؤلفون: MENEGHESSO, GAUDENZIO, J. R. M. Luchies, F. G. Kuper, A. J. Mouthaan
المساهمون: Meneghesso, Gaudenzio, J. R. M., Luchie, F. G., Kuper, A. J., Mouthaan
مصطلحات موضوعية: Electrostatic discharge (ESD), turn-on-speed, Charged Device Model (CDM), ggNMOSFET
وصف الملف: STAMPA
Relation: 7th Annual RCJ Reliability Symposium; firstpage:27; lastpage:32; numberofpages:6; http://hdl.handle.net/11577/2523028
الاتاحة: http://hdl.handle.net/11577/2523028
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3Academic Journal
المؤلفون: G. Meneghesso, J. R. M. Luchies, F. G. Kuper, A. J. Mouthaan, Ae Nijmegen, The Netherl
المساهمون: The Pennsylvania State University CiteSeerX Archives
وصف الملف: application/pdf
Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.577.2535; http://doc.utwente.nl/56009/1/00888204.pdf
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4Academic Journal
المؤلفون: G. Meneghesso L, J. R. M. Luchies, F. G. Kuper, A. J. Mouthaan, Ae Nijmegen, The Netherl
المساهمون: The Pennsylvania State University CiteSeerX Archives
وصف الملف: application/pdf
Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.573.7144; http://doc.utwente.nl/15124/1/Meneghesso96turn.pdf
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5
المؤلفون: J. F. Verwey, J.Th.M. De Hosson, F. G. Kuper
المساهمون: Zernike Institute for Advanced Materials
المصدر: Journal of Applied Physics, 60(3), 985-990. AMER INST PHYSICS
مصطلحات موضوعية: chemistry.chemical_compound, Ion implantation, Silicon, chemistry, Impurity, Nuclear reaction analysis, Oxidizing agent, Kinetics, Inorganic chemistry, Fluorine, Oxide, General Physics and Astronomy, chemistry.chemical_element
وصف الملف: application/pdf
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6
المؤلفون: M. H. J. Hottenhuis, F. G. Kuper, L. Wolterbeek
المصدر: Review of Scientific Instruments. 53:1058-1060
مصطلحات موضوعية: Monatomic gas, Materials science, Mathematical model, Silicon, business.industry, Glass fiber, chemistry.chemical_element, Cleavage (crystal), Surface finish, Crystal, Optics, chemistry, Bundle, business, Instrumentation
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7
المؤلفون: J.Th.M. De Hosson, J. F. Verwey, F. G. Kuper
المساهمون: Zernike Institute for Advanced Materials
المصدر: Journal of Applied Physics, 61(12), 5475-5477. AMER INST PHYSICS
مصطلحات موضوعية: Materials science, Passivation, Silicon, business.industry, Electron beam-induced current, General Physics and Astronomy, Mineralogy, chemistry.chemical_element, Silicon on insulator, Grain size, Ion implantation, chemistry, Optoelectronics, Grain boundary, Thin film, business
وصف الملف: application/pdf