المؤلفون: Zaaimi, B, Turnbull, M, Hazra, A, Wang, Y, Gandara, C, McLeod, F, McDermott, EE, Escobedo-Cousin, E, Idil, AS, Bailey, RG, Tardio, S, Patel, A, Ponon, N, Gausden, J, Walsh, D, Hutchings, F, Kaiser, M, Cunningham, MO, Clowry, GJ, LeBeau, FEN, Constandinou, TG, Baker, SN, Donaldson, N, Degenaar, P, O’Neill, A, Trevelyan, AJ, Jackson, A

المصدر: Nature Biomedical Engineering , 7 pp. 559-575. (2023)

مصطلحات موضوعية: Biomedical engineering, Computational neuroscience, Epilepsy, Neural circuits

وصف الملف: text

Relation: https://discovery.ucl.ac.uk/id/eprint/10162774/1/article_1.pdf; https://discovery.ucl.ac.uk/id/eprint/10162774/

الاتاحة: https://discovery.ucl.ac.uk/id/eprint/10162774/1/article_1.pdf
https://discovery.ucl.ac.uk/id/eprint/10162774/

المؤلفون: Firfilionis D, Hutchings F, Tamadoni R, Walsh D, Turnbull M, Escobedo-Cousin E, Bailey RG, Gausden J, Patel A, Haci D, Liu Y, LeBeau FEN, Trevelyan A, Constandinou TG, O'Neill A, Kaiser M, Degenaar P, Jackson A

المصدر: Frontiers in Neuroscience, 10 September 2021

وصف الملف: application/pdf

Relation: https://eprints.ncl.ac.uk/277412; https://eprints.ncl.ac.uk/fulltext.aspx?url=277412/C4954266-896E-4342-BB75-E173D12B9F83.pdf&pub_id=277412

الاتاحة: https://eprints.ncl.ac.uk/277412

المؤلفون: Firfilionis, D, Hutchings, F, Tamadoni, R, Walsh, D, Turnbull, M, Escobedo-Cousin, E, Bailey, RG, Gausden, J, Patel, A, Haci, D, Liu, Y, LeBeau, FEN, Trevelyan, A, Constandinou, TG, O'Neill, A, Kaiser, M, Degenaar, P, Jackson, A

المصدر: 10 ; 1

مصطلحات موضوعية: Science & Technology, Life Sciences & Biomedicine, Neurosciences, Neurosciences & Neurology, optogenetics, closed-loop, neuromodulation, electrophysiology, open-source, BRAIN, BCI, 1109 Neurosciences, 1701 Psychology, 1702 Cognitive Sciences

Relation: Frontiers in Neuroscience; http://hdl.handle.net/10044/1/92958

الاتاحة: http://hdl.handle.net/10044/1/92958
https://doi.org/10.3389/fnins.2021.718311

المؤلفون: Idil AS, Bailey R, Escobedo-Cousin E, Gausden J, O'Neill A, Donaldson N

المصدر: 24th European Microelectronics & Packaging Conference (EMPC23), September 2023

Relation: https://eprints.ncl.ac.uk/297528

الاتاحة: https://eprints.ncl.ac.uk/297528

المؤلفون: Luo, J, Firflionis, D, Turnbull, M, Xu, W, Walsh, D, Escobedo-Cousin, E, Soltan, A, Ramezani, R, Liu, Y, Bailey, R, ONeill, A, Idil, AS, Donaldson, N, Constandinou, T, Jackson, A, Degenaar, P

المصدر: IEEE Transactions on Biomedical Enginering , 67 (11) pp. 3004-3015. (2020)

مصطلحات موضوعية: Optogenetic, Brain Machine Interface, embedded-ASIC system, freely moving, neuroprosthetics, rodents, low power processing

وصف الملف: text

Relation: https://discovery.ucl.ac.uk/id/eprint/10116652/1/09006958.pdf; https://discovery.ucl.ac.uk/id/eprint/10116652/

الاتاحة: https://discovery.ucl.ac.uk/id/eprint/10116652/1/09006958.pdf
https://discovery.ucl.ac.uk/id/eprint/10116652/

المؤلفون: Zaaimi B, Turnbull M, Hazra A, Wang Y, Gandara C, McLeod F, McDermott EE, Escobedo-Cousin E, Idil AS, Bailey RG, Tardio S, Patel A, Ponon N, Gausden J, Walsh D, Hutchings F, Kaiser M, Cunningham MO, Clowry GJ, LeBeau FEN, Constandinou TG, Baker SN, Donaldson N, Degenaar P, O'Neill A, Trevelyan AJ, Jackson A

المصدر: Nature Biomedical Engineering, 2022

Relation: https://eprints.ncl.ac.uk/287364

الاتاحة: https://eprints.ncl.ac.uk/287364

المؤلفون: Zaaimi, B., Turnbull, M., Hazra, A., Wang, Y., Gandara, C., McLeod, F., McDermott, E. E., Escobedo-Cousin, E., Idil, A. Shah, Bailey, R. G., Tardio, S., Patel, A., Ponon, N., Gausden, J., Walsh, D., Hutchings, F., Kaiser, M., Cunningham, M. O., Clowry, G. J., LeBeau, F. E. N., Constandinou, T. G., Baker, S. N., Donaldson, N., Degenaar, P., O’Neill, A., Trevelyan, A. J., Jackson, A.

المساهمون: Wellcome Trust, RCUK | Engineering and Physical Sciences Research Council

المصدر: Nature Biomedical Engineering ; volume 7, issue 4, page 559-575 ; ISSN 2157-846X

الاتاحة: http://dx.doi.org/10.1038/s41551-022-00945-8
https://www.nature.com/articles/s41551-022-00945-8.pdf
https://www.nature.com/articles/s41551-022-00945-8

المؤلفون: Zaaimi B, Turnbull M, Hazra A, Wang Y, Gandara C, McLeod F, McDermott EE, Escobedo-Cousin E, Shah Idil A, Bailey RG, Tardio S, Patel A, Ponon N, Walsh D, Hutchings F, Kaiser M, Cunningham MO, Clowry GJ, LeBeau FEN, Constandinou TG, Baker SN, Donaldson N, Degenaar P, O'Neill A, Trevelyan AJ, Jackson A

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::07dcc6065ff2245a7b798cf0f754f5b8

المؤلفون: Hopf, T., Vassilevski, K. V., Escobedo-Cousin, E., King, P. J., Wright, N. G., O'Neill, A. G., Horsfall, A. B., Goss, J. P., Wells, G. H., Hunt, M. R. C.

المصدر: Journal of Applied Physics; 2014, Vol. 116 Issue 15, p1-6, 6p

مصطلحات موضوعية: FIELD-effect transistors, GRAPHENE, SILICON carbide, RAMAN spectroscopy, ATOMIC force microscopy

المؤلفون: Yan, L., Olsen, S. H., Escobedo-Cousin, E., O’Neill, A. G.

المصدر: Journal of Applied Physics; May2008, Vol. 103 Issue 9, p094508, 10p, 1 Black and White Photograph, 2 Diagrams, 13 Graphs

مصطلحات موضوعية: TECHNOLOGICAL innovations, SURFACES (Technology), METALLIC oxides, PARTICLES (Nuclear physics), DISLOCATIONS in crystals

المؤلفون: Escobedo-Cousin, E.¹, Olsen, S. H.¹, Dobrosz, P.¹, Bull, S. J.¹, O’Neill, A. G.¹, Coulson, H.², Claeys, C.³, Loo, R.³, Delhougne, R.³, Caymax, M.³

المصدر: Journal of Applied Physics. Dec2007, Vol. 102 Issue 12, p123502. 8p. 3 Diagrams, 7 Graphs.

مصطلحات موضوعية: *SILICON research, *SURFACE roughness, *MICROSCOPY, *METAL oxide semiconductor field-effect transistors, *THERMAL conductivity

المؤلفون: Fjer, M., Persson, Stefan, Escobedo-Cousin, E., O'Neill, A. G.

المصدر: IEEE Transactions on Electron Devices. 58(12):4196-4203

مصطلحات موضوعية: 1/f noise, Defect, low frequency noise, strain-relaxed buffer (SRB), strained Si heterojunction bipolar transistors (HBTs), strained silicon

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:miun:diva-15300

المؤلفون: Persson, Stefan, Fjer, M, Escobedo-Cousin, E, Olsen, S H, Malm, BG, Wang, YB, Hellström, PE, Ostling, M, O´Neill, AG

المصدر: IEEE Transactions on Electron Devices. 57(6):1243-1252

مصطلحات موضوعية: Band-gap engineering, BiCOMS integration, stained-Si heterojunction bipolar transistor (HBT), TECHNOLOGY, Electrical engineering, electronics and photonics, TEKNIKVETENSKAP, Elektroteknik, elektronik och fotonik

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:miun:diva-11628

المؤلفون: Olsen, S. H., Yana, L., Agaiby, R., Escobedo-Cousin, E., O'Neill, A. G., Hellström, Per-Erik, Östling, Mikael, Lyutovich, K., Kasper, E., Claeys, C., Parker, E. H. C.

المصدر: Microelectronic Engineering. 86(3):218-223

مصطلحات موضوعية: Si, SiGe, MOSFET, Mobility enhancement, Gate leakage, Dielectric, reliability, Lifetime, Virtual substrate, n-mosfets, electrical-properties, si, ge, diffusion, si1-xgex, buffers, alloys, layers, films, TECHNOLOGY, Electrical engineering, electronics and photonics, TEKNIKVETENSKAP, Elektroteknik, elektronik och fotonik

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-18317

المؤلفون: Hopf T, Vassilevski K, Escobedo-Cousin E, Wright N, O'Neill A, Horsfall A, Goss J, Barlow A, Wells G, Hunt M

المصدر: 15th International Conference on Silicon Carbide and Related Materials (ICSCRM 2013) , 2014

Relation: https://eprints.ncl.ac.uk/203132

الاتاحة: https://eprints.ncl.ac.uk/203132

المؤلفون: Persson, S., Fjer, M., Escobedo-Cousin, E., Malm, Gunnar, Wang, Yongbin, Hellström, Per-Erik, Östling, Mikael, Parker, E. H. C., Nash, L. J., Majhi, P., Olsen, S. H., O'Neill, A. G.

المصدر: IEEE INTERNATIONAL ELECTRON DEVICES MEETING 2008, TECHNICAL DIGEST International Electron Devices Meeting. :735-738

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-92174

المؤلفون: O'Neill, A.G., Olsen, S. H., Escobedo-Cousin, E., Varzgar, J. B., Agaiby, R., Chattopadhyay, S., Dobrosz, P., Bull, S., Hellström, Per-Erik, Östling, Mikael, Lyutovich, K., Kasper, E.

المصدر: ICSICT-2006 ICSICT- 8th International Conference on Solid-State and Integrated Circuit Technology, Proceedings. :104-107

مصطلحات موضوعية: Control equipment, Electric properties, Heating, MOSFET devices

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-155609

المؤلفون: Escobedo-Cousin E, Vassilevski K, Nikitina I, Wright N, O'Neill A, Horsfall A, Goss J

المصدر: 14th International Conference on Silicon Carbide and Related Materials (ICSCRM), 11-16 September 2011

Relation: https://eprints.ncl.ac.uk/189423

الاتاحة: https://eprints.ncl.ac.uk/189423

المؤلفون: Urena, F., Olsen, S., Escobedo-Cousin, E., Siller, S., Bhaskar, Umesh Kumar, Raskin, Jean-Pierre, Electronic Materials Conference - EMC 2011

المساهمون: UCL - SST/ICTM/ELEN - Pôle en ingénierie électrique

Relation: boreal:86636; http://hdl.handle.net/2078.1/86636

الاتاحة: http://hdl.handle.net/2078.1/86636

المؤلفون: Kapoor R, Escobedo-Cousin E, Olsen S, Bull S

المصدر: Microelectronics Reliability: 21st European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis, 11-15 October 2010

Relation: https://eprints.ncl.ac.uk/172596

الاتاحة: https://eprints.ncl.ac.uk/172596