المؤلفون: Elias B. Frantz, Nicholas J. Harmon, David J. Michalak, Eric M. Henry, Michael E. Flatté, Sean W. King, James S. Clarke, Patrick M. Lenahan

المصدر: Journal of Applied Physics. 130:234401

مصطلحات موضوعية: General Physics and Astronomy

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::bcd896d6a4ddf4fc0085fa3e07838fe0
https://doi.org/10.1063/5.0075460

المؤلفون: Sean W. King, Eric M. Henry, Nicholas J. Harmon, Michael E. Flatté, David J. Michalak, James S. Clarke, Elias B. Frantz, Patrick M. Lenahan

المصدر: Applied Physics Letters. 119:184101

مصطلحات موضوعية: Materials science, Physics and Astronomy (miscellaneous), Silicon, Magnetoresistance, Condensed matter physics, Hydrogen, Dangling bond, Oxide, chemistry.chemical_element, Trapping, chemistry.chemical_compound, chemistry, Forming gas, Quantum tunnelling

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6226c13a19d60cc9beb2e8d386925904
https://doi.org/10.1063/5.0066640

المؤلفون: A. M. Zwerver, Lester Lampert, Patrick H. Keys, Eric M. Henry, K. Millard, N. Kashani, Payam Amin, Menno Veldhorst, G. Scappucci, Jessica M. Torres, James S. Clarke, R. Pillarisetty, Nicole K. Thomas, Thomas F. Watson, Tobias Krähenmann, Hubert C. George, Bojarski Stephanie A, Otto Zietz, F. Luthi, Roza Kotlyar, Jeanette M. Roberts, David J. Michalak, Lieven M. K. Vandersypen, Roman Caudillo

المصدر: 2019 IEEE International Electron Devices Meeting, IEDM 2019, 2019-December

مصطلحات موضوعية: 010302 applied physics, business.industry, Computer science, Transistor, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Engineering physics, Line (electrical engineering), law.invention, Semiconductor, Quantum dot, law, Qubit, 0103 physical sciences, Volume testing, 0210 nano-technology, business, Throughput (business), Quantum computer

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::40cdbfb411a6f23a001f26646bc46ca4
https://doi.org/10.1109/iedm19573.2019.8993587

المؤلفون: Elias B. Frantz, Patrick M. Lenahan, Stephen J. Moxim, Eric M. Henry, Nicholas J. Harmon, James S. Clarke, David J. Michalak, Sean W. King, Michael E. Flatté

المصدر: Journal of Applied Physics. 130:065701

مصطلحات موضوعية: Materials science, Magnetoresistance, Condensed matter physics, Dielectric strength, Silicon, Oxide, Dangling bond, General Physics and Astronomy, chemistry.chemical_element, chemistry.chemical_compound, chemistry, Hyperfine structure, Quantum tunnelling, Leakage (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ca83c00f68f554ae0ccd71ba666d84c2
https://doi.org/10.1063/5.0057871