يعرض 1 - 7 نتائج من 7 نتيجة بحث عن '"Enokimoto, K."', وقت الاستعلام: 0.38s تنقيح النتائج
  1. 1
    Electronic Resource
    CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing

    المؤلفون: Kyushu Institute of Technology, Kawazu 680-4, Iizuka, Fukuoka 820-8502, Japan, Fukuoka Industry, Science & Technology Foundation, Fukuoka, Fukuoka 810-0001, Japan, NEC Micro Systems, Ltd., Kamimashiki, Kumamoto 861-2202, Japan, Enokimoto, K., Wen, X., Yamato, Y., Miyase, K., Sone, H., Kajihara, S., Aso, M., Furukawa, H.

    مصطلحات الفهرس: Power Supply Noise, Test Relaxation, X-Filling, Clock-Gating, 548, Journal Article, AM

    URL: http://hdl.handle.net/10228/00007593
    https://kyutech.repo.nii.ac.jp/?action=repository_action_common_download&item_id=6383&item_no=1&attribute_id=17&file_no=1
    https://doi.org/10.1109/ATS.2009.22
    9780769538648
    https://doi.org/10.1109/ATS.2009.22

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  2. 2
    Conference
    Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-Filling

    المؤلفون: Miyase, K., Uchinodan, Y., Enokimoto, K., Yamato, Y., Wen, X., Kajihara, S., Wu, F., Dilillo, L., Bosio, A., Girard, P., Virazel, A.

    المصدر: 2011 Asian Test Symposium ; page 90-95

    الاتاحة: http://dx.doi.org/10.1109/ats.2011.35
    http://xplorestaging.ieee.org/ielx5/6114262/6114277/06114519.pdf?arnumber=6114519

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  3. 3
    Electronic Resource
    Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-Filling

    المؤلفون: Kyushu Institute of Technology, Nara Institute of Science and Technology, LIRMM, Montpellier, Miyase, K., Uchinodan, Y., Enokimoto, K., Yamato, Y., Wen, X., Kajihara, S., Wu, F., Dilillo, L., Bosio, A., Girard, P., Virazel, A.

    مصطلحات الفهرس: Conference Paper, AM

    URL: http://hdl.handle.net/10228/5678
    https://kyutech.repo.nii.ac.jp/?action=repository_action_common_download&item_id=4459&item_no=1&attribute_id=17&file_no=1
    https://doi.org/10.1109/ATS.2011.35
    https://doi.org/10.1109/ATS.2011.35

    View record in OAIster

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  4. 4
    Conference
    Power-aware test generation with guaranteed launch safety for at-speed scan testing.

    المؤلفون: Wen, X., Enokimoto, K., Miyase, K., Yamato, Y., Kochte, M.A., Kajihara, S., Girard, P., Tehranipoor, M.

    المصدر: 2011 IEEE 29th VLSI Test Symposium (VTS); 2011, p166-171, 6p


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  5. 5
    Conference
    SAT-based capture-power reduction for at-speed broadcast-scan-based test compression architectures.

    المؤلفون: Kochte, M.A., Miyase, K., Wen, X., Kajihara, S., Yamato, Y., Enokimoto, K., Wunderlich, H.

    المصدر: 2011 International Symposium on Low Power Electronics & Design (ISLPED); 2011, p33-38, 6p


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  6. 6
    Conference
    CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing.

    المؤلفون: Enokimoto, K., Wen, X., Yamato, Y., Miyase, K., Sone, H., Kajihara, S., Aso, M., Furukawa, H.

    المصدر: 2009 Asian Test Symposium; 2009, p99-104, 6p


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  7. 7
    Periodical
    CAT (Critical-Area-Targeted): A New Paradigm for Reducing Yield Loss Risk in At-Speed Scan Testing

    المؤلفون: Wen, Xiaoqing, Enokimoto, K., Miyase, K., Kajihara, S., Aso, M., Furukawa, H.

    المصدر: ECS Transactions; November 2010, Vol. 27 Issue: 1


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