المؤلفون: Leonardo Juan Ramirez Lopez, Julian Camilo Cortes Rodríguez, Engler Ramirez Maldonado

المصدر: Bulletin of Electrical Engineering and Informatics (BEEI), 13(3), (2024-06-01)

Relation: https://doi.org/10.11591/eei.v13i3.5100; oai:zenodo.org:12204338

الاتاحة: https://doi.org/10.11591/eei.v13i3.5100