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المؤلفون: OLIVER HECKL, Baer, C. R. E., Kraenkel, C., Marchese, S. V., Schapper, F., Holler, M., Suedmeyer, T., Keller, U., Robinson, J. S., Tisch, J. W. G., Couny, F., Light, P., Enabid, F., Russell, P. St J., IEEE
المصدر: ResearcherID
URL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::01d1131a5a9c9321f48cbece4ef92185
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=WOS:000274751302336&KeyUID=WOS:000274751302336