المؤلفون: Dou, Zehua, Xu, Yuezhen, Wei, Zhiying, Emmerich, Hannes, Czarske, Juergen, Weik, David

المصدر: 2024 IEEE Ultrasonics, Ferroelectrics, and Frequency Control Joint Symposium (UFFC-JS) ; page 1-4

الاتاحة: https://doi.org/10.1109/uffc-js60046.2024.10794159
http://xplorestaging.ieee.org/ielx8/10793454/10793457/10794159.pdf?arnumber=10794159

المؤلفون: Weik, David, Zehua Dou, Emmerich, Hannes, Czarske, Jürgen

الاتاحة: https://dx.doi.org/10.13140/rg.2.2.16536.98567
https://rgdoi.net/10.13140/RG.2.2.16536.98567

المؤلفون: Emmerich, Hannes, Knupfer, Leon, Heitkam, Sascha, Starke, Eric, Trtik, Pavel, Schaller, Ludwig, Weik, David, Czarske, Jurgen

المساهمون: AiF, IGF, German Federal Ministry of Economics and Technology

المصدر: IEEE Transactions on Instrumentation and Measurement ; page 1-1 ; ISSN 0018-9456 1557-9662

الاتاحة: http://dx.doi.org/10.1109/tim.2022.3228582
http://xplorestaging.ieee.org/ielx7/19/4407674/09996121.pdf?arnumber=9996121

المؤلفون: Emmerich, Hannes, Schaller, Ludwig, Nauber, Richard, Knüpfer, Leon, Heitkam, Sascha, Czarske, Jürgen, Büttner, Lars

المساهمون: Allianz Industrie Forschung

المصدر: tm - Technisches Messen ; volume 88, issue 9, page 562-570 ; ISSN 2196-7113 0171-8096

الاتاحة: http://dx.doi.org/10.1515/teme-2021-0047
https://www.degruyter.com/document/doi/10.1515/teme-2021-0047/xml
https://www.degruyter.com/document/doi/10.1515/teme-2021-0047/pdf

المؤلفون: Emmerich, Hannes, Knupfer, Leon, Heitkam, Sascha, Starke, Eric, Trtik, Pavel, Schaller, Ludwig, Weik, David, Czarske, Jurgen

المصدر: IEEE Transactions on Instrumentation and Measurement; 2023, Vol. 72 Issue: 1 p1-11, 11p