المؤلفون: Jose Javier Imas, Ignacio R. Matías, Ignacio Del Villar, Aritz Ozcáriz, Carlos Ruiz Zamarreño, Jacques Albert

المصدر: Opto-Electronic Advances, Vol 6, Iss 10, Pp 1-13 (2023)

مصطلحات موضوعية: tilted fiber bragg grating (tfbg), mode transition, ellipsometer, Optics. Light, QC350-467

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2096-4579

URL الوصول: https://doaj.org/article/45abc2a1bfc444d1b909e2e705ce3214

المؤلفون: S.H. Mohamed, Ali A. Alhazime

المصدر: Journal of Materials Research and Technology, Vol 18, Iss , Pp 4470-4478 (2022)

مصطلحات موضوعية: TiO2/TiN/TiO2 multilayer nanostructured films, Ellipsometer spectra, Plasmonic, Photoluminescence, Mining engineering. Metallurgy, TN1-997

وصف الملف: electronic resource

Relation: http://www.sciencedirect.com/science/article/pii/S2238785422006329; https://doaj.org/toc/2238-7854

URL الوصول: https://doaj.org/article/6c7600d94abf4266a1ce689a125e7777

المؤلفون: Océane Guillot, Amira Guediche, Mathieu Lafarie, Amandine Moiny, Théo Brockhouse, Hervé Piombini

المصدر: Coatings; Volume 13; Issue 3; Pages: 633

مصطلحات موضوعية: ellipsometer, ormosil, PDMS, sol–gel, thickness homogeneity, transparent thick film, viscoelasticity

وصف الملف: application/pdf

Relation: Thin Films; https://dx.doi.org/10.3390/coatings13030633

الاتاحة: https://doi.org/10.3390/coatings13030633

المؤلفون: Moustafa Ahmed, Yas M. Al-Hadeethi, Ali M. Abdel-Daiem, Essam R. Shaaban

المصدر: Materials; Volume 16; Issue 6; Pages: 2226

مصطلحات موضوعية: (In 1−x Gd x ) 2 O 3 thin films, XRD, spectroscopic ellipsometer, optical parameters, electrical parameters, magnetic properties

وصف الملف: application/pdf

Relation: https://dx.doi.org/10.3390/ma16062226

الاتاحة: https://doi.org/10.3390/ma16062226

المؤلفون: Nahed Alarifi, Mahmoud A Al-Gawati, Fahad Alnjiman, Hamad Albrithen, Abdullah N Alodhayb

المصدر: Materials Research Express, Vol 10, Iss 11, p 116401 (2023)

مصطلحات موضوعية: atomic force microscopy, microelectromechanical system, cantilevers, ellipsometer, Materials of engineering and construction. Mechanics of materials, TA401-492, Chemical technology, TP1-1185

Relation: https://doi.org/10.1088/2053-1591/ad068b; https://doaj.org/toc/2053-1591; https://doaj.org/article/c1268e50dc43409993ffa2537beda70c

الاتاحة: https://doi.org/10.1088/2053-1591/ad068b
https://doaj.org/article/c1268e50dc43409993ffa2537beda70c

المؤلفون: Zhou Jiang, Song Zhang, Hao Jiang, Shiyuan Liu

المصدر: Photonics, Vol 10, Iss 1038, p 1038 (2023)

مصطلحات موضوعية: Mueller matrix ellipsometer, birefringent, waveplate, calibration, field-of-view effect, thickness measurement, Applied optics. Photonics, TA1501-1820

Relation: https://www.mdpi.com/2304-6732/10/9/1038; https://doaj.org/toc/2304-6732; https://doaj.org/article/ccfbd7160fb54f64929362ee3acfcf2f

الاتاحة: https://doi.org/10.3390/photonics10091038
https://doaj.org/article/ccfbd7160fb54f64929362ee3acfcf2f

المؤلفون: Jiamin Liu, Song Zhang, Bowen Deng, Lei Li, Honggang Gu, Jinlong Zhu, Hao Jiang, Shiyuan Liu

المصدر: Photonics, Vol 10, Iss 1064, p 1064 (2023)

مصطلحات موضوعية: vertical optical layout, polarization effect calibration, polarization modulation and demodulation reference plane, incidence plane switching, high-speed Mueller matrix ellipsometer, Applied optics. Photonics, TA1501-1820

Relation: https://www.mdpi.com/2304-6732/10/9/1064; https://doaj.org/toc/2304-6732; https://doaj.org/article/99ec63c8cbb24757ad22870efebcb43b

الاتاحة: https://doi.org/10.3390/photonics10091064
https://doaj.org/article/99ec63c8cbb24757ad22870efebcb43b

المؤلفون: Shikhar Misra, Matias Kalaswad, Di Zhang, Haiyan Wang

المصدر: Materials Research Letters, Vol 8, Iss 9, Pp 321-327 (2020)

مصطلحات موضوعية: biased ellipsometer, tunable permittivity, barium titanate, ferroelectric, epitaxial thin films, Materials of engineering and construction. Mechanics of materials, TA401-492

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2166-3831

URL الوصول: https://doaj.org/article/77c9f66b83584488a4fde13a2602886f

المؤلفون: Zhou Jiang, Song Zhang, Jiaming Liu, Qi Li, Hao Jiang, Shiyuan Liu

المصدر: Frontiers in Physics, Vol 9 (2022)

مصطلحات موضوعية: Mueller matrix ellipsometer, thin film measurement, noise, error, repeatability, Physics, QC1-999

وصف الملف: electronic resource

Relation: https://www.frontiersin.org/articles/10.3389/fphy.2021.820552/full; https://doaj.org/toc/2296-424X

URL الوصول: https://doaj.org/article/9a001b3f2ec543afb6661f6068adf757

المؤلفون: Jingmin Wu, Xiang Yang, Fengxuan Wang, Zhiyu Guo, Zhongchao Fan, Zhi He, Fuhua Yang

المصدر: Micromachines; Volume 13; Issue 5; Pages: 804

مصطلحات موضوعية: laser annealing, thermal annealing, P + ion implantation, ellipsometer, optical absorption

وصف الملف: application/pdf

Relation: https://dx.doi.org/10.3390/mi13050804

الاتاحة: https://doi.org/10.3390/mi13050804

المؤلفون: Aathira Murali (10132063), Manikandan Ganesan (11642471), Dillip K. Satapathy (4556089), P. B. Sunil Kumar (4454776)

مصطلحات موضوعية: Biophysics, Biochemistry, Medicine, Evolutionary Biology, Ecology, Immunology, Plasma Physics, Biological Sciences not elsewhere classified, Chemical Sciences not elsewhere classified, Physical Sciences not elsewhere classified, spectroscopic ellipsometer equipped, relatively slower evolution, relative humidity conditions, like transition (<, higher humidity conditions, g , thin chitosan films, linked chitosan films, smaller penetrant molecules, relative humidity, like transition, chitosan films, water molecules, time evolution, p <, humidity cell, >< sub, stiffer films, polymer films, water vapor

Relation: https://figshare.com/articles/journal_contribution/Penetrant-Induced_Glass-like_Transition_in_Thin_Chitosan_Films/16924436

الاتاحة: https://doi.org/10.1021/acs.jpcb.1c07903.s001

المؤلفون: Aydınoğlu, Hafize Seda, Hopoğlu, Hicret, Özer, Ali, ŞenadımTüzemen, Ebru

المساهمون: Sağlık Hizmetleri Meslek Yüksekokulu, orcid:0000-0003-0416-8276

مصطلحات موضوعية: N doped ZnO, Magnetron sputtering, Spectroscopic Ellipsometer, XRD, Energy band gap

وصف الملف: application/pdf

Relation: https://doi.org/10.1016/j.optmat.2021.111685; Optical Materials; Uluslararası Hakemli Dergide Makale - Kurum Öğretim Elemanı; https://hdl.handle.net/20.500.12418/13187; 122

الاتاحة: https://hdl.handle.net/20.500.12418/13187

المؤلفون: Rathnathilaka, Achini

المساهمون: Lappeenrannan-Lahden teknillinen yliopisto LUT, Lappeenranta-Lahti University of Technology LUT

مصطلحات موضوعية: dielctric material, thin film, low pressure chemical vapor deposition, direct thermal nitridation, atomic force microscope, root mean square roughness, spectroscopic ellipsometer, thickness, optical constants, modelling, x-ray photoelectron spectroscopy, fi=Kestävää teollisuutta, innovaatioita ja infrastruktuureja|en=Industry, innovation and infrastructure, fi=School of Engineering Science, Laskennallinen tekniikka|en=School of Engineering Science, Computational Engineering

وصف الملف: fulltext

Relation: https://lutpub.lut.fi/handle/10024/167193; URN:NBN:fi-fe2024041216731

الاتاحة: https://lutpub.lut.fi/handle/10024/167193

المؤلفون: Park, Sungmo, Park, Geonu, Ilsin, An¹

المصدر: Invertis Journal of Science & Technology 10(3):142-147. 2017

المؤلفون: Li, Siyuan, Deng, Zhongxun, Quan, Naicheng, Zhang, Chunmin

مصطلحات موضوعية: Ellipsometer, Polarization state, Snapshot

Relation: Optics Communications; http://ir.opt.ac.cn/handle/181661/96884

الاتاحة: http://ir.opt.ac.cn/handle/181661/96884
https://doi.org/10.1016/j.optcom.2023.130115

المؤلفون: Muhammad Arslan, Amir Habib, Muhammad Zakria, Arshad Mehmood, Ghulam Husnain

المصدر: Journal of Science: Advanced Materials and Devices, Vol 2, Iss 1, Pp 79-85 (2017)

مصطلحات موضوعية: X-ray diffraction, Morphology, Dielectric constant, Spectroscopic ellipsometer, Energy band gap, Materials of engineering and construction. Mechanics of materials, TA401-492

وصف الملف: electronic resource

Relation: http://www.sciencedirect.com/science/article/pii/S2468217916301769; https://doaj.org/toc/2468-2179

URL الوصول: https://doaj.org/article/d64e2bdd26af40bca2fcaefa2e0f9bd3

المؤلفون: Ping Tao, Wenchao Tang, Yan Wang, Jianxin Shi, Henry H Cheng, Xiaoshan Wu

المصدر: Materials Research Express, Vol 7, Iss 3, p 035902 (2020)

مصطلحات موضوعية: Ge1−xSnx alloy films, structure, spectroscopic ellipsometer, hall measurement, Materials of engineering and construction. Mechanics of materials, TA401-492, Chemical technology, TP1-1185

Relation: https://doi.org/10.1088/2053-1591/ab7a63; https://doaj.org/toc/2053-1591; https://doaj.org/article/18ec72c75c244f0c8c9c1bb3e261a9d8

الاتاحة: https://doi.org/10.1088/2053-1591/ab7a63
https://doaj.org/article/18ec72c75c244f0c8c9c1bb3e261a9d8

المؤلفون: Haruki Ishikawa, Hiroshi Kumagai, Michio Suzuki, Riho Iida, Takanobu Sato, Tomohiro Kosuge, 佐藤 崇信, 小菅 智裕, 熊谷 寛, 石川 春樹, 鈴木 道夫, 飯田 里帆

المصدر: 電気学会論文誌Ｃ（電子・情報・システム部門誌） / IEEJ Transactions on Electronics, Information and Systems. 2021, 141(4):572

المؤلفون: Reger, Ron, Purdue University Office of Research

المصدر: University Research Core Facility Boilerplate Descriptions

مصطلحات موضوعية: boilerplate, grant, nanofabrication, cleanroom, nano, nanotechnology, atomic force microscopy, AFM, electron microscopy, ellipsometer, profilometer, lithography, maskmaking, dry etching, metal deposition, wet etching, thermal processing, deposition, evaporator, oxidation, semiconductor processing

وصف الملف: application/pdf

Relation: https://docs.lib.purdue.edu/ovprcores/15; https://docs.lib.purdue.edu/context/ovprcores/article/1014/type/native/viewcontent/Scifres_Nanofabrication_Laboratory_Cleanroom_Aug2023.docx

الاتاحة: https://docs.lib.purdue.edu/ovprcores/15
https://docs.lib.purdue.edu/context/ovprcores/article/1014/type/native/viewcontent/Scifres_Nanofabrication_Laboratory_Cleanroom_Aug2023.docx

المساهمون: Britt, J

المصدر: Other Information: PBD: 1 Apr 2002; Other Information: Work performed by Global Solar Energy, Tucson, Arizona

وصف الملف: Medium: ED; Size: 52 pages

URL الوصول: http://www.osti.gov/scitech/servlets/purl/15000424