-
1Academic Journal
المؤلفون: Marković, Zoran M., Budimir Filimonović, Milica, Milivojević, Dušan, Kovač, Janez, Todorović-Marković, Biljana
المصدر: Journal of Functional Biomaterials
مصطلحات موضوعية: carbon polymerized dots, fullerene C60, polyurethane, composite films, electrostatic force microscopy, viscoelastic microscopy, antibacterial, antibiofouling, photodynamic, reactive oxygen species
Relation: info:eu-repo/grantAgreement/ScienceFundRS/Ideje/7741955/RS//; info:eu-repo/grantAgreement/MESTD/inst-2020/200030/RS//; Slovenian Research Agency [P2-0082]; https://vinar.vin.bg.ac.rs/handle/123456789/12997; http://vinar.vin.bg.ac.rs/bitstream/id/35942/jfb-15-00073.pdf
-
2Academic Journal
المؤلفون: Cinzia Di Giorgio, Elena Blundo, Julien Basset, Giorgio Pettinari, Marco Felici, Charis H. L. Quay, Stanislas Rohart, Antonio Polimeni, Fabrizio Bobba, Marco Aprili
مصطلحات موضوعية: Biophysics, Medicine, Physiology, Biotechnology, Developmental Biology, Marine Biology, Plant Biology, Space Science, Biological Sciences not elsewhere classified, Chemical Sciences not elsewhere classified, Physical Sciences not elsewhere classified, promising optoelectronic properties, produced via hydrogen, presumably sulfur vacancies, passivated sulfur vacancies, implemented radio frequency, electrostatic force microscopy, electric field response, atomic scale defects, 2 sub, intrinsic quantum capacitance, rf sub, quantum capacitance, f <, total capacitance, quantum materials, >< sub, visualize simultaneously, using rf, take advantage
-
3Academic Journal
المؤلفون: Ekaterina K. Kosareva, Alla N. Pivkina, Nikita V. Muravyev
المصدر: Energetic Materials Frontiers, Vol 3, Iss 4, Pp 290-302 (2022)
مصطلحات موضوعية: Atomic force microscopy, Scanning probe microscopy, Energetic materials, Force spectroscopy, Electrostatic force microscopy, Kelvin probe force microscopy, Chemical technology, TP1-1185
وصف الملف: electronic resource
-
4Conference
المؤلفون: Thomas, Louis, Godey, S., Deresmes, D., Berthe, Maxime
المساهمون: Plateforme de Caractérisation Multi-Physiques - IEMN (PCMP - IEMN), Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)-JUNIA (JUNIA), Université catholique de Lille (UCL)-Université catholique de Lille (UCL)-Centrale Lille-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)-JUNIA (JUNIA), Université catholique de Lille (UCL)-Université catholique de Lille (UCL), Ces travaux ont été supportés par le CNRS à travers le projet neuroPOM (80PRIME), l’ANR à travers les projets PANASSÉ(ANR-18-CE09-0036), CONTEXT (ANR-17-CE24-0013 ), SENSATION (ANR-JCJC-CE24) et NANODYN (ANR-14-CE22-0001), le Fonds Européen deDéveloppement Régional/ Met steun van het Europees Fonds voor Regionale Ontwikkeling dans le cadre du projet Interreg France-Wallonie-Vlaanderen LUMINOPTEX et l’I-SITE ULNE à travers le projet MINNA (R-20-004)., Renatech Network, PCMP PCP, ANR-18-CE09-0036,PANASSE,Assemblage planaire de nanofils pour émission sur parois latérales(2018), ANR-17-CE24-0013,CONTEXT,Textiles connectés pour les communications autour du corps humain(2017), ANR-14-CE22-0001,NANODYN,Dynamique multi-échelle des chaînes et des charges dans les nanocomposites(2014), ANR-22-CE24-0001,Sensation,Instruments gravés pour détecter l'information physique non-triviale(2022), ANR-16-IDEX-0004,ULNE,ULNE(2016)
المصدر: 24éme Forum des microscopies à sonde locale 2023
https://hal.science/hal-04149653
24éme Forum des microscopies à sonde locale 2023, Apr 2023, Obernai, Franceمصطلحات موضوعية: AFM - Atomic force microscopy, AFM conducteur, AFM en mode Kelvin, Electrostatic force microscopy, [SPI]Engineering Sciences [physics], [PHYS]Physics [physics]
Relation: hal-04149653; https://hal.science/hal-04149653; https://hal.science/hal-04149653/document; https://hal.science/hal-04149653/file/poster_forum_23_Lth.pdf
-
5Academic Journal
المؤلفون: Zonghua Qin, Xin Nie, Wenbin Yu, Shuguang Yang, Zongke Zhou, Shuqin Yang, Quan Wan
المصدر: Materials Research Express, Vol 11, Iss 2, p 025501 (2024)
مصطلحات موضوعية: electrostatic force microscopy, kelvin probe microscopy, kaolinite, montmorillonite, illite, surface electrical properties, Materials of engineering and construction. Mechanics of materials, TA401-492, Chemical technology, TP1-1185
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2053-1591
-
6Academic Journal
المؤلفون: Haesol Kim, Dohyeon Jeon, Minji Gu, Taekyeong Kim
مصطلحات موضوعية: Biophysics, Medicine, Molecular Biology, Pharmacology, Biotechnology, Sociology, Space Science, Biological Sciences not elsewhere classified, Physical Sciences not elsewhere classified, target substrate due, induced bandgap reduction, electrostatic force microscopy, polarization forces based, report κ measurements, higher κ values, 2 sub, studies based, calculations based, measured κ, enhanced κ, ≈ 3, poorly understood, nanoscale bubbles, nanobubble structures, nanobubble size, large number, good agreement, flat regions, dielectric constant
-
7Academic Journal
المؤلفون: FUHRMANN, Marc, Musyanovych, Anna, THOELEN, Ronald, Moebius, Hildegard
المساهمون: FUHRMANN, Marc, Musyanovych, Anna, THOELEN, Ronald, Moebius, Hildegard
مصطلحات موضوعية: atomic force microscopy, electrostatic force microscopy, polymer nanoparticles, dielectric properties
وصف الملف: application/pdf
Relation: Journal of physics communications, 6 (12) (Art N° 125005); http://hdl.handle.net/1942/39197; 12; 000899424700001
-
8Academic Journal
المؤلفون: Osung Kwon, Jaehyoung Park, Jihoon Lee
المصدر: Polymers; Volume 15; Issue 10; Pages: 2295
مصطلحات موضوعية: proton exchange membrane, electrostatic force microscopy, numerical approximation model, proton conductivity, proton transport mechanism, ionic channel distribution, nafion composite, charge distribution
وصف الملف: application/pdf
Relation: Polymer Analysis and Characterization; https://dx.doi.org/10.3390/polym15102295
-
9Academic Journal
المساهمون: Bottomley, Lawrence [Georgia Inst. of Technology, Atlanta, GA (United States)]
المصدر: Nano Letters; 15; 9; Other Information: HeteroFoaM partners with University of South Carolina (lead); University of California, Santa Barbara; University of Connecticut; Georgia Institute of Technology; Princeton University; Rochester Institute of Technology; Savannah River National Laboratory; University of South Carolina; University of Utah
وصف الملف: Medium: ED; Size: p. 6047-6050
-
10Academic Journal
المؤلفون: Young-Min Kim, Jihye Lee, Deok-Jin Jeon, Si-Eun Oh, Jong-Souk Yeo
المصدر: Applied Microscopy, Vol 51, Iss 1, Pp 1-9 (2021)
مصطلحات موضوعية: Selector, Conductive filaments (CFs), Conductive atomic force microscopy (C-AFM), Electrostatic force microscopy (EFM), Kelvin probe force microscopy (KPFM), Microscopy, QH201-278.5
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2287-4445
-
11Academic Journal
المساهمون: Jesse, Stephen [Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)]
المصدر: Nanotechnology; 27; 41
وصف الملف: Medium: ED; Size: Article No. 414003
-
12Academic Journal
المؤلفون: Wescley Walison Valeriano, Rodrigo Ribeiro Andrade, Juan Pablo Vasco, Angelo Malachias, Bernardo Ruegger Almeida Neves, Paulo Sergio Soares Guimarães, Wagner Nunes Rodrigues
المصدر: Beilstein Journal of Nanotechnology, Vol 12, Iss 1, Pp 139-150 (2021)
مصطلحات موضوعية: dielectric constant, electrostatic force microscopy (efm), natural photonic crystals, relative permittivity, structural colors, Technology, Chemical technology, TP1-1185, Science, Physics, QC1-999
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2190-4286
-
13Academic Journal
المؤلفون: Xiaofeng Hu, Shujie Li, Zuimin Jiang, Xinju Yang
المصدر: Nanoscale Research Letters, Vol 16, Iss 1, Pp 1-11 (2021)
مصطلحات موضوعية: Si nanowires, Photoconductive atomic force microscopy, Electrostatic force microscopy, Photoconductive property, Size-dependence, Materials of engineering and construction. Mechanics of materials, TA401-492
وصف الملف: electronic resource
Relation: https://doaj.org/toc/1556-276X
-
14Academic Journal
المؤلفون: N. A. Davletkildeev, D. V. Sokolov, E. Yu. Mosur, I. A. Lobov
المصدر: Омский научный вестник, Vol 6 (174), Pp 87-92 (2020)
مصطلحات موضوعية: doped carbon nanotubes, electrostatic force microscopy, contact potential difference, electron work function, Engineering (General). Civil engineering (General), TA1-2040
وصف الملف: electronic resource
Relation: https://www.omgtu.ru/general_information/media_omgtu/journal_of_omsk_research_journal/files/arhiv/2020/6%20(174)/87-92%20%D0%94%D0%B0%D0%B2%D0%BB%D0%B5%D1%82%D0%BA%D0%B8%D0%BB%D1%8C%D0%B4%D0%B5%D0%B5%D0%B2%20%D0%9D.%20%D0%90.,%20%D0%9C%D0%BE%D1%81%D1%83%D1%80%20%D0%95.%20%D0%AE.,%20%D0%A1%D0%BE%D0%BA%D0%BE%D0%BB%D0%BE%D0%B2%20%D0%94.%20%D0%92.%20%D0%B8%20%D0%B4%D1%80..pdf; https://doaj.org/toc/1813-8225; https://doaj.org/toc/2541-7541
-
15Academic Journal
المؤلفون: Osung Kwon, JaeHyoung Park
المصدر: Polymers; Volume 14; Issue 18; Pages: 3718
مصطلحات موضوعية: proton exchange membrane, electrostatic force microscopy, numerical approximation model, proton conductivity, proton transport mechanism, ionic channel distribution
وصف الملف: application/pdf
Relation: Polymer Analysis and Characterization; https://dx.doi.org/10.3390/polym14183718
-
16Academic Journal
المؤلفون: Lukas Matthias Seewald, Jürgen Sattelkow, Michele Brugger-Hatzl, Gerald Kothleitner, Hajo Frerichs, Christian Schwalb, Stefan Hummel, Harald Plank
المصدر: Nanomaterials; Volume 12; Issue 24; Pages: 4477
مصطلحات موضوعية: 3D nanoprinting, additive manufacturing, direct-write nanofabrication, focused electron beam induced deposition, metal nanostructures, platinum, atomic force microscopy, conductive atomic force microscopy, electrostatic force microscopy
وصف الملف: application/pdf
Relation: Nanofabrication and Nanomanufacturing; https://dx.doi.org/10.3390/nano12244477
الاتاحة: https://doi.org/10.3390/nano12244477
-
17Academic Journal
المساهمون: Roelofs, Andreas [Argonne National Lab. (ANL), Argonne, IL (United States). Nanoscience and Technology Division]
المصدر: Physical Review Applied; 3; 1
وصف الملف: Medium: ED; Size: Article No. 014003
-
18Dissertation/ Thesis
Thesis Advisors: UAM. Departamento de Ingeniería Informática, Neurocomputación Biológica (ING EPS-005)
المصدر: IEEE Transactions on Nanotechnology 12.2 (2013): 152 – 156
1536-125X (print)
1941-0085 (online)
152
2
156
12مصطلحات موضوعية: Electrostatic force microscopy, Thin films, Informática
URL الوصول: http://hdl.handle.net/10486/665558
-
19Dissertation/ Thesis
Thesis Advisors: UAM. Departamento de Ingeniería Informática, Neurocomputación Biológica (ING EPS-005)
المصدر: Nanoscale Research Letters 7 (2012): 250
1931-7573 (print)
1556-276X (online)
250
7مصطلحات موضوعية: Artificial neural networks, Electrostatic force microscopy, Thin films, Informática
URL الوصول: http://hdl.handle.net/10486/662634
-
20Academic Journal
المؤلفون: Hyungbeen Lee, Soo Hyun Lee
المصدر: Micro and Nano Systems Letters, Vol 7, Iss 1, Pp 1-6 (2019)
مصطلحات موضوعية: Electrostatic force microscopy, Genetic mutation analysis, Gold nanoparticle, Micro RNA, Single nucleotide polymorphism, Three nucleotide polymorphisms, Technology
وصف الملف: electronic resource