يعرض 1 - 20 نتائج من 491 نتيجة بحث عن '"Electronic packages"', وقت الاستعلام: 0.80s تنقيح النتائج
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    Relation: Role of alternating current shape on microstructure and damage evolution of solder joints / Waluyo Adi Siswanto [et al.] // Journal of Manufacturing Processes. - 2020. - Vol.50.-P. 450-455. - Doi:10.1016/j.jmapro.2019.12.041. - Refer.: p. 454-455.; http://dspace.bsu.edu.ru/handle/123456789/42728

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    Academic Journal
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    Book

    المؤلفون: Jacques, Sebastien

    المساهمون: GREMAN (matériaux, microélectronique, acoustique et nanotechnologies) (GREMAN - UMR 7347), Université de Tours (UT)-Institut National des Sciences Appliquées - Centre Val de Loire (INSA CVL), Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)

    المصدر: System Reliability ; https://univ-tours.hal.science/hal-01678040 ; System Reliability, 2017, ⟨10.5772/intechopen.69611⟩

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    Academic Journal

    المؤلفون: Yang, Liyu, Bernstein, Joseph

    المصدر: Microelectronics International: An International Journal, 2012, Vol. 29, Issue 1, pp. 15-21.

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    Conference

    المؤلفون: Codecasa L., D'Amore D., D'Alessandro V.

    المساهمون: Codecasa, L., D'Amore, D., D'Alessandro, V.

    Relation: info:eu-repo/semantics/altIdentifier/isbn/978-1-6654-1896-6; info:eu-repo/semantics/altIdentifier/wos/WOS:000758722800037; ispartofbook:2021 27th International Workshop on Thermal Investigations of ICs and Systems, THERMINIC 2021; 27th International Workshop on Thermal Investigations of ICs and Systems, THERMINIC 2021; firstpage:1; lastpage:6; numberofpages:6; http://hdl.handle.net/11311/1201135; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85123601111

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