المؤلفون: Piotr Lezynski, Pawel Szczesniak, Bartosz Waskowicz, Robert Smolenski, Wojciech Drozdz

المصدر: IEEE Access, Vol 7, Pp 47259-47272 (2019)

مصطلحات موضوعية: Electrical engineering, power engineering and energy, electronic equipment testing, energy storage, power electronics, power system control, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/8674756/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/d494c477ad67425f9c2b2e15e9189724

المؤلفون: Carratu' M., Pietrosanto A., Sommella P., Catelani M., Ciani L., Patrizi G., Singuaroli R.

المساهمون: IEEE, Carratu', M., Pietrosanto, A., Sommella, P., Catelani, M., Ciani, L., Patrizi, G., Singuaroli, R.

مصطلحات موضوعية: Automotive application, Electronic equipment testing, Inertial sensor, Metrology, Vibration

Relation: info:eu-repo/semantics/altIdentifier/isbn/978-1-6654-5383-7; info:eu-repo/semantics/altIdentifier/wos/WOS:001039259600049; ispartofbook:Conference Record - IEEE Instrumentation and Measurement Technology Conference; 2023 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2023; volume:2023-; firstpage:1; lastpage:6; numberofpages:6; serie:CONFERENCE PROCEEDINGS - IEEE INSTRUMENTATION/MEASUREMENT TECHNOLOGY CONFERENCE; https://hdl.handle.net/11386/4838233; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85166381645

الاتاحة: https://hdl.handle.net/11386/4838233
https://doi.org/10.1109/I2MTC53148.2023.10175926

المؤلفون: Bretzner, Lars, Laptev, Ivan, Lindeberg, Tony, 1964

المصدر: Fifth IEEE International Conference on Automatic Face and Gesture Recognition, 2002. Proceedings. :63-74

مصطلحات موضوعية: Computer vision, Control systems, Electronic equipment testing, Filtering, Image sampling, Particle tracking, Prototypes, Real time systems, Skin, System testing

وصف الملف: electronic

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-40153
http://www.csc.kth.se/cvap/abstracts/BreLapLin-FG02.html
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=1004190
https://kth.diva-portal.org/smash/get/diva2:462620/FULLTEXT01.pdf

المؤلفون: Zymak, I., Antipenkov, R., Favetta, M., Grittani, G., Grenfell, A., Lazzarini, C. M., Goncalves, L., Sobr, V., Špaèek, A., Szuba, W., Versaci, R., Lorenz, S., Nevrkla, M., Sluková, V., Fucilli, F. I. M., Lapadula, L., Tassielli, G. F., Ranieri, E., Piombino, M., Bakule, P., Bulanov, S. V.

المساهمون: RADECS 2022, Zymak, I., Antipenkov, R., Favetta, M., Grittani, G., Grenfell, A., Lazzarini, C. M., Goncalves, L., Sobr, V., Špaèek, A., Szuba, W., Versaci, R., Lorenz, S., Nevrkla, M., Sluková, V., Fucilli, F. I. M., Lapadula, L., Tassielli, G. F., Ranieri, E., Piombino, M., Bakule, P., Bulanov, S. V.

مصطلحات موضوعية: Electron accelerators, Electronic equipment testing, Integrated circuit reliability, laser plasma acceleration, Laser wakefield acceleration, Low Earth orbit satellites, Radiation to electronics effects

Relation: info:eu-repo/semantics/altIdentifier/isbn/979-8-3503-7123-9; info:eu-repo/semantics/altIdentifier/wos/WOS:001164255500035; ispartofbook:RADECS 2022 - European Conference on Radiation and Its Effects on Components and Systems; 22nd European Conference on Radiation and Its Effects on Components and Systems, RADECS 2022; firstpage:1; lastpage:4; numberofpages:4; https://hdl.handle.net/11586/526440

الاتاحة: https://hdl.handle.net/11586/526440
https://doi.org/10.1109/radecs55911.2022.10412406

المؤلفون: Patrizi, G, Catelani, M, Ciani, L, Carratu', M, Pietrosanto, A, Sommella, P, Betta, G, Capriglione, D

المساهمون: IEEE, Patrizi, G, Catelani, M, Ciani, L, Carratu', M, Pietrosanto, A, Sommella, P, Betta, G, Capriglione, D

مصطلحات موضوعية: Electronic equipment testing, Error compensation, Inertial sensor, Reliability, Temperature dependence

Relation: info:eu-repo/semantics/altIdentifier/isbn/978-1-6654-1076-2; info:eu-repo/semantics/altIdentifier/wos/WOS:000861142800011; ispartofbook:2022 IEEE 9th International Workshop on Metrology for AeroSpace, MetroAeroSpace 2022; 2022 IEEE 9th International Workshop on Metrology for AeroSpace, MetroAeroSpace 2022; firstpage:54; lastpage:58; numberofpages:5; serie:IEEE METROLOGY FOR AEROSPACE; https://hdl.handle.net/11386/4807749; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85137991532

الاتاحة: https://hdl.handle.net/11386/4807749
https://doi.org/10.1109/MetroAeroSpace54187.2022.9856314

المؤلفون: Gabriele Patrizi, Marcantonio Catelani, Lorenzo Ciani, Marco Carratu, Antonio Pietrosanto, Paolo Sommella, Giovanni Betta, Domenico Capriglione

المصدر: 2022 IEEE 9th International Workshop on Metrology for AeroSpace (MetroAeroSpace).

مصطلحات موضوعية: Error compensation, Temperature dependence, Electronic equipment testing, Inertial sensors, Reliability

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ef8fa7cd2431e602ff158442b9c30a39
https://doi.org/10.1109/metroaerospace54187.2022.9856314

المؤلفون: Ryoko KISHIKAWA

المصدر: IEICE Transactions on Communications. 2019, E102.B(2):345

المؤلفون: Sanz, Ivan, Anguera Pros, Jaume, Andújar Linares, Aurora, Puente Baliarda, Carles, Borja, C.

المساهمون: Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions

مصطلحات موضوعية: Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Antenes i agrupacions d'antenes, Microwave antennas, Antenna radiation patterns, Bandwidth, Copper, Electronic equipment testing, Geometry, Q factor, Resonance, Resonant frequency, Spirals, Wire, Antenes de microones

Relation: http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5505660; Sanz, I. [et al.]. The Hilbert monopole revisited. A: European Conference on Antennas and Propagation. "Proceedings of the 4th European Conference on Antennas and Propagation: EuCAP 2010: 12-16 April, 2010: Barcelona, Spain". Barcelona: Institute of Electrical and Electronics Engineers (IEEE), 2010.; http://hdl.handle.net/2117/20067

الاتاحة: http://hdl.handle.net/2117/20067

المؤلفون: Picher, Cristina, Anguera Pros, Jaume, Puente Baliarda, Carles, Kahng, Sungtek, Andújar Linares, Aurora

المساهمون: Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions

مصطلحات موضوعية: Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Antenes i agrupacions d'antenes, Microwave antennas, Antenna measurements, Bandwidth, Electronic equipment testing, Frequency, Humans, Mobile antennas, Mobile handsets, Slot antennas, Specific absorption rate, Telephone sets, Antenes de microones

وصف الملف: 5 p.

Relation: http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5505633&tag=1; Picher, C. [et al.]. Analysis of the specific absorption rate in handset antennas with slotted ground planes. A: European Conference on Antennas and Propagation. "Proceedings of the 4th European Conference on Antennas and Propagation: EuCAP 2010: 12-16 April, 2010: Barcelona, Spain". Barcelona: Institute of Electrical and Electronics Engineers (IEEE), 2010, p. 1-5.; http://hdl.handle.net/2117/20003

الاتاحة: http://hdl.handle.net/2117/20003

المؤلفون: Borja, C., Anguera Pros, Jaume, Puente Baliarda, Carles, Vergés, Jordi

المساهمون: Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions

مصطلحات موضوعية: Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Radiodifusió per ràdio, Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Antenes i agrupacions d'antenes, Antenes de microones, Mobile communication systems, Antenna measurements, Electronic equipment testing, Fractals, Humans, Mobile antennas, Mobile handsets, Power measurement, Receiving antennas, Semiconductor device measurement, Wire, Microwave antennas, Comunicacions mòbils, Sistemes de

وصف الملف: 5 p.; application/pdf

Relation: http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5505238; Borja, C. [et al.]. How much can be reduced the internal FM antenna of mobiles phones?. A: European Conference on Antennas and Propagation. "Proceedings of the 4th European Conference on Antennas and Propagation: EuCAP 2010: 12-16 April, 2010: Barcelona, Spain". Barcelona: Institute of Electrical and Electronics Engineers (IEEE), 2010, p. 1-5.; http://hdl.handle.net/2117/20021

الاتاحة: http://hdl.handle.net/2117/20021

المؤلفون: Rolán Blanco, Alejandro, Córcoles López, Felipe, Pedra Durán, Joaquim, Monjo Mur, Lluís, Bogarra Rodríguez, Santiago

المساهمون: Universitat Politècnica de Catalunya. Departament d'Enginyeria Elèctrica, Universitat Politècnica de Catalunya. QSE - Qualitat del Subministrament Elèctric, Universitat Politècnica de Catalunya. SAC - Sistemes Avançats de Control, Universitat Politècnica de Catalunya. CS2AC-UPC - Supervision, Safety and Automatic Control

مصطلحات موضوعية: Àrees temàtiques de la UPC::Enginyeria electrònica, Àrees temàtiques de la UPC::Enginyeria mecànica::Motors, Electric motors, Induction, Electronic circuits, Electric machines, Electronic equipment testing, Fault diagnosis, Time-varying systems, Motors elèctrics d'inducció, Cicuits electrònics

وصف الملف: 10 p.; application/pdf

Relation: https://digital-library.theiet.org/content/journals/10.1049/iet-epa.2014.0258; Rolan, A., Corcoles, F., Pedra, J., Monjo, L., Bogarra, S. Testing of three-phase equipment under voltage sags. "IET electric power applications", 09 Abril 2015, vol. 9, núm. 4, p. 287-296.; http://hdl.handle.net/2117/79313

الاتاحة: http://hdl.handle.net/2117/79313
https://doi.org/10.1049/iet-epa.2014.0258

المؤلفون: Boga, Biter, Ocak, Ilker Ender, Külah, Haluk, Akın, Tayfun

مصطلحات موضوعية: Micromechanical devices, Signal sampling, Signal processing, System testing, Delta-sigma modulation, Readout electronics, Electronic equipment testing, Filters, Signal design, Accelerometers

Relation: Boga B., Ocak I. E. , KÜLAH H., AKIN T., "MODELING OF A CAPACITIVE Sigma-Delta MEMS ACCELEROMETER SYSTEM INCLUDING THE NOISE COMPONENTS AND VERIFICATION WITH TEST RESULTS", 22nd International Conference on Micro Electro Mechanical Systems (MEMS), Sorrento, İtalya, 25 - 29 Ocak 2009, ss.821-824; 65949098181; https://hdl.handle.net/11511/41238; WOS:000341431500205

الاتاحة: https://hdl.handle.net/11511/41238
https://doi.org/10.1109/memsys.2009.4805509

المؤلفون: Vairamohan, B., Komatsu, W., Galassi, M., Monteiro, T. C., Oliveira, M. A., Ami, S. U., Matakas, L., Marafão, F. P., Bormio, E., Camargo, J., McGranaghan, M. F., Jardini, J. A.

المساهمون: Universidade Estadual Paulista (UNESP)

مصطلحات موضوعية: Dynamic voltage restorer, Power euality mitigation devices, Voltage sags, Voltage swells, Electric measuring instruments, Power quality, Standardization, Technological forecasting, Videodisks, Voltage regulators, Voltage stabilizing circuits, Case studies, Development platforms, Phase voltages, Power quality devices, Power quality mitigations, System compatibilities, Technology assessments, Test protocols, Voltage disturbances, Electronic equipment testing

Relation: ICHQP 2008: 13th International Conference on Harmonics and Quality of Power; http://dx.doi.org/10.1109/ICHQP.2008.4668799; ICHQP 2008: 13th International Conference on Harmonics and Quality of Power.; http://hdl.handle.net/11449/70870; 2-s2.0-57749091443

الاتاحة: http://hdl.handle.net/11449/70870
https://doi.org/10.1109/ICHQP.2008.4668799

المؤلفون: BENSO, Alfredo, DI CARLO, STEFANO, PRINETTO, Paolo Ernesto, SAVINO, ALESSANDRO, Scionti, A.

المساهمون: Benso, Alfredo, DI CARLO, Stefano, Prinetto, Paolo Ernesto, Savino, Alessandro, Scionti, A.

مصطلحات موضوعية: DIGITAL SYSTEM DESIGN TEST AND VERIFICATION, Built-in self-test, Automatic testing, Computer architecture, Electronic equipment testing, Fault detection, System testing

وصف الملف: STAMPA

Relation: info:eu-repo/semantics/altIdentifier/isbn/9781424420599; info:eu-repo/semantics/altIdentifier/wos/WOS:000260994900025; ispartofbook:Titolo volume non avvalorato; IEEE 11th International Biennial Baltic Electronics Conference (BEC); firstpage:139; lastpage:142; numberofpages:4; http://hdl.handle.net/11583/1870166; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-57849168472; http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4657498

الاتاحة: http://hdl.handle.net/11583/1870166
https://doi.org/10.1109/BEC.2008.4657498
http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4657498

المؤلفون: Holdmeyer, Kyle, and others

المصدر: Defense Acquisition Review Journal. 08/2007 14(3):487-500

مصطلحات موضوعية: GLOBAL POSITIONING SYSTEM - Testing, ELECTRONIC EQUIPMENT - Testing, FUTURE COMBAT SYSTEMS - Equipment - Testing

URL الوصول: http://www.dtic.mil/dtic/aulimp/citations/gsa/2007_117432/143932.html

المؤلفون: BENSO, Alfredo, BOSIO, ALBERTO, DI CARLO, STEFANO, DI NATALE, Giorgio, PRINETTO, Paolo Ernesto

المساهمون: Benso, Alfredo, Bosio, Alberto, DI CARLO, Stefano, DI NATALE, Giorgio, Prinetto, Paolo Ernesto

مصطلحات موضوعية: DIGITAL SYSTEM DESIGN TEST AND VERIFICATION, Automatic testing, Data buse, Digital system, Electronic equipment testing, Random access memory

وصف الملف: STAMPA

Relation: info:eu-repo/semantics/altIdentifier/isbn/0769525008; info:eu-repo/semantics/altIdentifier/wos/WOS:000235572800066; ispartofbook:Titolo volume non avvalorato; IEEE 3rd International Workshop on Electronic Design, Test and Applications (DELTA); firstpage:385; lastpage:392; numberofpages:8; http://hdl.handle.net/11583/1499997; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-33847140548; http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1581244

الاتاحة: http://hdl.handle.net/11583/1499997
https://doi.org/10.1109/DELTA.2006.17
http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1581244

المؤلفون: Lima, Delberis A., Padilha-Feltrin, Antonio

المساهمون: Universidade Estadual Paulista (UNESP)

مصطلحات موضوعية: Loss allocation, Power flow, Redispatch of active power, Transmission losses, Electric generators, Electric lines, Electric loads, Electric losses, Electronic equipment testing, Problem solving, Transmission loss, Electric power distribution

وصف الملف: 212-217

Relation: 2004 IEEE/PES Transmission and Distribution Conference and Exposition: Latin America; http://dx.doi.org/10.1109/TDC.2004.1432380; 2004 IEEE/PES Transmission and Distribution Conference and Exposition: Latin America, p. 212-217.; http://hdl.handle.net/11449/67979; WOS:000228358400039; 2-s2.0-22744445379

الاتاحة: http://hdl.handle.net/11449/67979
https://doi.org/10.1109/TDC.2004.1432380

المؤلفون: Flottes M. L, Bertrand Y., Balado L., Lupon E., Biasizzo A., Novak F., Pricopi N., Wunderlich H. J., DI CARLO, STEFANO, PRINETTO, Paolo Ernesto

المساهمون: Flottes, M. L., Bertrand, Y., Balado, L., Lupon, E., Biasizzo, A., Novak, F., DI CARLO, Stefano, Prinetto, Paolo Ernesto, Pricopi, N., Wunderlich, H. J.

مصطلحات موضوعية: DIGITAL SYSTEM DESIGN TEST AND VERIFICATION, Circuit testing, Continuing education, Design engineering, Electronic equipment testing, Engineering education, Industrial training, Integrated circuit testing, automatic test equipment

وصف الملف: STAMPA

Relation: info:eu-repo/semantics/altIdentifier/isbn/0769520812; info:eu-repo/semantics/altIdentifier/wos/WOS:000189390400022; ispartofbook:Titolo volume non avvalorato; IEEE 2nd International Workshop on Electronic Design, Test and Applications (DELTA); firstpage:135; lastpage:139; numberofpages:5; http://hdl.handle.net/11583/1499949; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-4544286355; http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1409829

الاتاحة: http://hdl.handle.net/11583/1499949
https://doi.org/10.1109/DELTA.2004.10024
http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1409829

المؤلفون: Bartosz Waskowicz, Piotr Lezynski, Wojciech Drożdż, Pawel Szczesniak, Robert Smolenski

المصدر: IEEE Access, Vol 7, Pp 47259-47272 (2019)

مصطلحات موضوعية: General Computer Science, Computer science, 020209 energy, power system control, Context (language use), 02 engineering and technology, Energy storage, Electric power system, 0202 electrical engineering, electronic engineering, information engineering, General Materials Science, Flexibility (engineering), energy storage, business.industry, General Engineering, Cyber-physical system, electronic equipment testing, Control engineering, 021001 nanoscience & nanotechnology, Renewable energy, Controllability, power electronics, power engineering and energy, Electrical engineering, lcsh:Electrical engineering. Electronics. Nuclear engineering, 0210 nano-technology, business, lcsh:TK1-9971, Realization (systems), Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::37637069093c76a5915839e08d59bdbd
https://doi.org/10.1109/access.2019.2907612

المؤلفون: Nicola Aresi, Giacomo Langfelder, Leonardo Gaffuri Pagani, Paolo Minotti

المصدر: Journal of Microelectromechanical Systems. 27:321-332

مصطلحات موضوعية: 0209 industrial biotechnology, Micromechanical devices, Computer science, Testing, emulation, Feedthrough, 02 engineering and technology, Tools, Printed circuit board, 020901 industrial engineering & automation, Transfer functions, Hardware_GENERAL, Gate array, 0202 electrical engineering, electronic engineering, information engineering, digital filters, electronic equipment testing, Emulation, FPGA, Instruments, integrated circuit testing, Microelectromechanical devices, Resonators, Mechanical Engineering, Electrical and Electronic Engineering, Electronics, Field-programmable gate array, Microelectromechanical systems, Analogue electronics, business.industry, 020208 electrical & electronic engineering, Electrical engineering, Noise, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::64b07f6c551fb9a2b9c159cec7a1cb02
https://doi.org/10.1109/jmems.2018.2803683