يعرض 1 - 20 نتائج من 655,850 نتيجة بحث عن '"Electron microscopy"', وقت الاستعلام: 0.63s تنقيح النتائج
  1. 1
    Academic Journal
    Impact of Ga overpressure on the metal modulation epitaxy growth of AlN/AlGaN short period superlattices.

    المؤلفون: Chaney, Alexander1,2 (AUTHOR) alexander.chaney.1.ctr@us.af.mil, Averett, Kent2 (AUTHOR), Asel, Thaddeus J.2 (AUTHOR), Mou, Shin2 (AUTHOR)

    المصدر: Journal of Applied Physics. 1/14/2025, Vol. 137 Issue 2, p1-7. 7p.

    مصطلحات موضوعية: *SCANNING transmission electron microscopy, *X-ray diffraction, *PARTIAL pressure, *EPITAXY, *SURFACE active agents


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  2. 2
    Academic Journal
    Angle-resolved Raman scattering study of anisotropic two-dimensional tellurium nanoflakes.

    المؤلفون: Duan, Yuhao1 (AUTHOR), Zhao, Deming2 (AUTHOR), Li, Zhonglin1,3 (AUTHOR), Yu, Jing1,3 (AUTHOR), Liang, Yao4 (AUTHOR), Wang, Yingying1 (AUTHOR) yywang@hitwh.edu.cn

    المصدر: Journal of Applied Physics. 1/14/2025, Vol. 137 Issue 2, p1-8. 8p.

    مصطلحات موضوعية: *BREWSTER'S angle, *TRANSMISSION electron microscopy, *CHEMICAL stability, *RAMAN spectroscopy, *CHARGE carrier mobility, *RAMAN scattering


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  3. 3
    Academic Journal
    Effect of electron–electron interactions on the emission characteristics of ultracold, nanoscale photoemission-based electron sources.

    المؤلفون: Gevorkyan, G. S.1 (AUTHOR), Ridley, R.1 (AUTHOR), Gonzalez, E.1 (AUTHOR), Padmore, H. A.2 (AUTHOR), Karkare, S.1 (AUTHOR) Karkare@asu.edu

    المصدر: Journal of Applied Physics. 1/14/2025, Vol. 137 Issue 2, p1-10. 10p.

    مصطلحات موضوعية: *ELECTRON sources, *ELECTRON microscopy, *ELECTRON beams, *PHOTOEMISSION, *SPECTROMETRY, *ELECTRON energy loss spectroscopy


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  4. 4
    Academic Journal
    Band alignment in Zn(1−x)MgxO:Al/SiOx/Si heterostructures for photovoltaic applications realized by atomic layer deposition: Effects of Al doping and Mg alloying.

    المؤلفون: Schifano, R.1 (AUTHOR) schifano@ifpan.edu.pl, Gieraltowska, S.1 (AUTHOR), Kurek, J.1,2,3 (AUTHOR), Wachnicki, L.1 (AUTHOR), Rehman, U.1 (AUTHOR), Budiakivska, D.1,2 (AUTHOR), Chusnutdinow, S.1 (AUTHOR), Kopalko, K.1 (AUTHOR), Porro, S.4 (AUTHOR), Jakiela, R.1 (AUTHOR), Minikayev, R.1 (AUTHOR), Witkowski, B. S.1 (AUTHOR), Pawlowski, M.2 (AUTHOR), Jastrzebski, C.2 (AUTHOR), Thøgersen, A.5 (AUTHOR)

    المصدر: Journal of Applied Physics. 12/28/2024, Vol. 136 Issue 24, p1-17. 17p.

    مصطلحات موضوعية: *SCANNING transmission electron microscopy, *ATOMIC layer deposition, *CONDUCTION bands, *COMPOUND semiconductors, *VALENCE bands, *OPEN-circuit voltage


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  5. 5
    Academic Journal
    Lifetime mapping using femtosecond time-resolved photoemission electron microscopy.

    المؤلفون: Koo, Norman Tze Wei1 (AUTHOR), Woo, Kyung Chul1 (AUTHOR), Lim, Justin Wei Xiang2 (AUTHOR), Loh, Zhi-Heng1,2 (AUTHOR) zhiheng@ntu.edu.sg

    المصدر: Journal of Chemical Physics. 11/7/2024, Vol. 161 Issue 17, p1-16. 16p.

    مصطلحات موضوعية: *DECAY constants, *ELECTRON microscopy, *PHOTOEMISSION, *MANUFACTURING processes, *PIXELS


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  6. 6
    Academic Journal
    Polarity control and crystalline quality improvement of AlN thin films grown on Si(111) substrates by molecular beam epitaxy.

    المؤلفون: Fan, Shizhao1 (AUTHOR) szfan2020@sinano.ac.cn, Yin, Yuhao1 (AUTHOR), Liu, Rong1 (AUTHOR), Zhao, Haiyang1 (AUTHOR), Liu, Zhenghui2 (AUTHOR), Sun, Qian1 (AUTHOR), Yang, Hui1 (AUTHOR)

    المصدر: Journal of Applied Physics. 10/14/2024, Vol. 136 Issue 14, p1-11. 11p.

    مصطلحات موضوعية: *MOLECULAR beam epitaxy, *SCANNING transmission electron microscopy, *ANTIPHASE boundaries, *UMPOLUNG, *X-ray diffraction


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  7. 7
    Academic Journal
    Epitaxial growth of HfB2 thin films on Si(111) by magnetron sputtering.

    المؤلفون: Shanmugham, Sathish Kumar1 (AUTHOR), le Febvrier, Arnaud1 (AUTHOR) arnaud.lefebvrier@liu.se, Palisaitis, Justinas1 (AUTHOR), Persson, Per O. Å.1 (AUTHOR), Frost, Robert J. W.2 (AUTHOR), Primetzhofer, Daniel2,3 (AUTHOR), Petrov, Ivan1,4 (AUTHOR), Högberg, Hans1 (AUTHOR), Birch, Jens1 (AUTHOR), Rosen, Johanna5 (AUTHOR), Eklund, Per1 (AUTHOR), Nayak, Sanjay1 (AUTHOR) sanjay.nayak@liu.se

    المصدر: Journal of Applied Physics. 9/21/2024, Vol. 136 Issue 11, p1-10. 10p.

    مصطلحات موضوعية: *SCANNING transmission electron microscopy, *THIN films, *SUBSTRATES (Materials science), *SURFACE roughness, *MAGNETRON sputtering


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  8. 8
    Academic Journal
    Polarization-dependent photoemission electron microscopy for domain imaging of inorganic and molecular materials.

    المؤلفون: Ghosh, Atreyie1 (AUTHOR), Spellberg, Joseph L.1,2 (AUTHOR), King, Sarah B.1,2 (AUTHOR) sbking@uchicago.edu

    المصدر: Journal of Chemical Physics. 9/21/2024, Vol. 161 Issue 11, p1-12. 12p.

    مصطلحات موضوعية: *ELECTRON microscopy, *PHOTOEMISSION, *EXCITED states, *ELECTRONIC structure, *SPATIAL variation


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  9. 9
    Dissertation/ Thesis
    GHz Magnetization Dynamics in X-ray PhotoEmission Electron Microscopy (XPEEM)

    المؤلفون: Kaliq, Muhammad Waqas

    المساهمون: University/Department: Universitat de Barcelona. Facultat de Física

    Thesis Advisors: Foerster, Michael Joachim Ulrich, Macià Bros, Ferran, Franzese, Giancarlo

    المصدر: TDX (Tesis Doctorals en Xarxa)

    مصطلحات موضوعية: Espectroscòpia de raigs X, Espectroscopia de rayos X, X-ray spectroscopy, Microscòpia electrònica, Microscopia electrónica, Electron microscopy, Piezoelectricitat, Piezoelectricidad, Piezoelectricity, Dicroisme circular, Dicroísmo circular, Circular dichroism, Ciències Experimentals i Matemàtiques

    Time: 538.9

    وصف الملف: application/pdf

    URL الوصول: http://hdl.handle.net/10803/692455

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  10. 10
    Academic Journal
    Silver-induced layer exchange and crystallization of a-Si films investigated using in situ scanning transmission electron microscopy.

    المؤلفون: Yadav, Surbhi1 (AUTHOR), Birajdar, B. I.1 (AUTHOR) birajdar@mail.jnu.ac.in, Kraschewski, S. M.2 (AUTHOR), Apeleo Zubiri, B.2 (AUTHOR), Antesberger, T.3 (AUTHOR), Stutzmann, M.3 (AUTHOR), Spiecker, E.2 (AUTHOR) erdmann.spiecker@fau.de

    المصدر: Journal of Applied Physics. 8/28/2024, Vol. 136 Issue 8, p1-18. 18p.

    مصطلحات موضوعية: *TRANSMISSION electron microscopy, *MICROSCOPY, *SCANNING electron microscopy, *SUBSTRATES (Materials science), *CRYSTALLIZATION, *NEAR-field microscopy, *SCANNING transmission electron microscopy


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  11. 11
    Academic Journal
    Considerations for extracting moiré-level strain from dark field intensities in transmission electron microscopy.

    المؤلفون: Craig, Isaac M.1 (AUTHOR), Van Winkle, Madeline1 (AUTHOR), Ophus, Colin2 (AUTHOR), Bediako, D. Kwabena1,3 (AUTHOR) bediako@berkeley.edu

    المصدر: Journal of Applied Physics. 8/21/2024, Vol. 136 Issue 7, p1-12. 12p.

    مصطلحات موضوعية: *SCANNING transmission electron microscopy, *TRANSMISSION electron microscopy, *DIFFRACTION patterns, *CAPABILITIES approach (Social sciences), *SPATIAL resolution, *BORON nitride


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  12. 12
    Dissertation/ Thesis
    Mechanisms of the Asc1 amino acid transporter

    المؤلفون: Rullo Tubau, Josep

    المساهمون: University/Department: Universitat de Barcelona. Departament de Bioquímica i Biologia Molecular (Biologia)

    Thesis Advisors: Palacín Prieto, Manuel, Errasti-Murugarren, Ekaitz

    المصدر: TDX (Tesis Doctorals en Xarxa)

    مصطلحات موضوعية: Ciències de la salut, Ciencias biomédicas, Medical sciences, Aminoàcids, Aminoácidos, Amino acids, Microscòpia electrònica, Microscopia electrónica, Electron microscopy, Transport biològic, Transporte biológico, Biological transport, Ciències Experimentals i Matemàtiques

    وصف الملف: application/pdf

    URL الوصول: http://hdl.handle.net/10803/692397

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  13. 13
    Dissertation/ Thesis
    End-to-End Automation in STEM Imaging and Spectroscopy: Revolutionising the Analysis of Quantum Materials and Beyond

    المؤلفون: Botifoll Moral, Marc

    Thesis Advisors: Arbiol i Cobos, Jordi

    المصدر: TDX (Tesis Doctorals en Xarxa)

    مصطلحات موضوعية: Ciència de materials, Materials science, Ciencia de materiales, Microscopia electrònica, Electron microscopy, Microscopía electrónica, Intel·ligència artificial, Artificial intelligence, Inteligencia artificial, Ciències Experimentals

    وصف الملف: application/pdf

    URL الوصول: http://hdl.handle.net/10803/692001

    View record in TDX

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  14. 14
    Academic Journal
    Thermal Inactivation of Clostridium sporogenes PA 3679 in Low Acid Foods: Case Study of Maple Sap Concentrates.

    المؤلفون: Zareifard, M. R.1 (AUTHOR), Ali, F.1 (AUTHOR) fadi.ali@agr.gc.ca, Plamondon, J.1 (AUTHOR), Lapointe, C.1 (AUTHOR), Savard, T.1 (AUTHOR), Hubbard, K.2 (AUTHOR), Houde, J.3 (AUTHOR), Lagacé, L.3 (AUTHOR), Bhuyar, Prakash (AUTHOR) prakash@mju.ac.th

    المصدر: Journal of Food Processing & Preservation. 12/24/2024, Vol. 2024, p1-15. 15p.

    مصطلحات موضوعية: *PRODUCT acceptance, RESISTANCE heating, TRANSMISSION electron microscopy, REVERSE osmosis, SCANNING electron microscopy

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  15. 15
    Academic Journal
    Resistance behavior of Sb7Se3 thin films based on flexible mica substrate.

    المؤلفون: Wang, Yukun1 (AUTHOR) hyf@jsut.edu.cn, Hu, Yifeng1,2 (AUTHOR)

    المصدر: Journal of Chemical Physics. 8/28/2024, Vol. 161 Issue 8, p1-9. 9p.

    مصطلحات موضوعية: *ATOMIC force microscopy, *TRANSMISSION electron microscopy, *TRANSITION temperature, *SUBSTRATES (Materials science), *THIN films


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  16. 16
    Academic Journal
    Size-dependent growth dynamics of silver–gold core–shell nanoparticles monitored by in situ second harmonic generation and extinction spectroscopy.

    المؤلفون: Babayode, Daniel A.1 (AUTHOR), Peterson, Stena C.1 (AUTHOR), Haber, Louis H.1 (AUTHOR) lhaber@lsu.edu

    المصدر: Journal of Chemical Physics. 8/28/2024, Vol. 161 Issue 8, p1-14. 14p.

    مصطلحات موضوعية: *SECOND harmonic generation, *TRANSMISSION electron microscopy, *SURFACE morphology, *NANOPARTICLES, *NANOSTRUCTURED materials


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  17. 17
    Academic Journal
    The self-annealing of irradiation induced defects in magnetite Fe3O4: Revealing reversible irradiation-induced disorder transformation through in situ TEM.

    المؤلفون: Lopez Morales, Angelica M.1 (AUTHOR), Chen, Wei-Ying2 (AUTHOR), Kaoumi, Djamel1 (AUTHOR) djamelkaoumi@gmail.com

    المصدر: Journal of Applied Physics. 8/21/2024, Vol. 136 Issue 7, p1-8. 8p.

    مصطلحات موضوعية: *METAL-insulator transitions, *TRANSMISSION electron microscopy, *LATTICE constants, *AMORPHIZATION, *HETEROSTRUCTURES


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  18. 18
    Academic Journal
    Nanometer-thick molecular beam epitaxy Al films capped with in situ deposited Al2O3—High-crystallinity, morphology, and superconductivity.

    المؤلفون: Lin, Y. H. G.1 (AUTHOR), Cheng, C. K.1 (AUTHOR), Young, L. B.1 (AUTHOR), Chiang, L. S.1 (AUTHOR), Chen, W. S.1 (AUTHOR), Lai, K. H.1 (AUTHOR), Chiu, S. P.2 (AUTHOR), Wu, C. T.3 (AUTHOR), Liang, C. T.1 (AUTHOR), Lin, J. J.2 (AUTHOR), Hsu, C. H.4 (AUTHOR) chsu@nsrrc.org.tw, Lin, Y. H.5 (AUTHOR) yhlin@phys.ntu.edu.tw, Kwo, J.5 (AUTHOR) raynien@phys.nthu.edu.tw, Hong, M.1 (AUTHOR) mhong@phys.ntu.edu.tw

    المصدر: Journal of Applied Physics. 8/21/2024, Vol. 136 Issue 7, p1-8. 8p.

    مصطلحات موضوعية: *SCANNING transmission electron microscopy, *MOLECULAR beam epitaxy, *SURFACE roughness, *ALUMINUM ores, *SUPERCONDUCTING circuits


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  19. 19
    Academic Journal
    Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer.

    المؤلفون: Uzuhashi, Jun1,2 (AUTHOR) uzuhashi.jun@nims.go.jp, Chen, Jun1 (AUTHOR) chen.jun@nims.go.jp, Tanaka, Ryo3 (AUTHOR), Takashima, Shinya3 (AUTHOR), Edo, Masaharu3 (AUTHOR), Ohkubo, Tadakatsu1 (AUTHOR), Sekiguchi, Takashi1,2 (AUTHOR)

    المصدر: Journal of Applied Physics. 8/7/2024, Vol. 136 Issue 5, p1-7. 7p.

    مصطلحات موضوعية: *ATOM-probe tomography, *SCANNING transmission electron microscopy, *ION implantation, *GALLIUM nitride


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  20. 20
    Academic Journal
    Effects of electron beam irradiation on CrMnV and CrMnTiV high entropy alloys: Nano-mechanical, structural, and thermodynamic perspectives.

    المؤلفون: Sultana, N. A.1,2 (AUTHOR), Mohammed, Y. S.1,2 (AUTHOR), Pendleton, S. J.3 (AUTHOR), Vennekate, J.4 (AUTHOR), Ciovati, G.4,5 (AUTHOR), Li, X.6 (AUTHOR), Baumgart, H.2,6 (AUTHOR), Elmustafa, A. A.1,2 (AUTHOR) aelmusta@odu.edu

    المصدر: Journal of Applied Physics. 8/7/2024, Vol. 136 Issue 5, p1-9. 9p.

    مصطلحات موضوعية: *FIELD emission electron microscopy, *ENERGY dispersive X-ray spectroscopy, *MECHANICAL loads, *ATOMIC force microscopy, *EXPOSURE dose, *ELECTRON field emission, *ELECTRON beams


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