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1Academic Journal
المؤلفون: Shigeo TANUMA, Tomoko HARADA, 原田 朋子, 田沼 繁夫
المصدر: 分析化学 / BUNSEKI KAGAKU. 1991, 40(11):711
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2Academic Journal
المؤلفون: Hansson, Rickard, Ericsson, Leif K. E., Dastoor, Paul, Moons, Ellen, Holmes, Natalie P., Rysz, Jakub, Opitz, Andreas, Campoy-Quiles, Mariano, Wang, Ergang, Barr, Matthew G., Kilcoyne, A. L. David, Zhou, Xiaojing
مصطلحات موضوعية: ray-absorption spectroscopy, electron-escape depth, coated thin films, phase-seperation
Relation: Journal of Materials Chemistry A Vol. 3, Issue 13, p. 6970-6979; http://hdl.handle.net/1959.13/1061682; uon:16996
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3Academic Journal
المؤلفون: Akgul, Guvenc
المساهمون: Akgul, Guvenc
مصطلحات موضوعية: NEXAFS, titanium, branching ratio, electron escape depth, thin films
Relation: BULLETIN OF MATERIALS SCIENCE; Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı; https://dx.doi.org/10.1007/s12034-014-0623-z; https://hdl.handle.net/11480/4201; 37; 41; 45
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4
المؤلفون: Guvenc Akgul
المساهمون: Nigde Univ, Bor Vocat Sch, TR-51700 Nigde, Turkey, Akgul, Guvenc
مصطلحات موضوعية: Yield (engineering), Materials science, Analytical chemistry, chemistry.chemical_element, Resonance, Electronic structure, Electron, electron escape depth, XANES, NEXAFS, chemistry, thin films, Mechanics of Materials, General Materials Science, titanium, branching ratio, Thin film, Absorption (electromagnetic radiation), Titanium
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5Academic Journal
المؤلفون: Ufuktepe, Y., Akgul, G., Aksoy, F., Nordlund, D.
المساهمون: 0-Belirlenecek
مصطلحات موضوعية: NEXAFS, nickel, transmission yield, 3d transition metals, electron escape depth
Relation: X-RAY SPECTROMETRY; Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı; https://dx.doi.org/10.1002/xrs.1362; https://hdl.handle.net/11480/4677; 40; 427; 431
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6Academic Journal
المؤلفون: Aksoy, F., Akgul, G., Ufuktepe, Y., Nordlund, D.
المساهمون: 0-Belirlenecek
مصطلحات موضوعية: XANES, Cr, Transmission yield, 3d Transition metals, Branching ratio, Electron Escape depth
Relation: JOURNAL OF ALLOYS AND COMPOUNDS; Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı; https://dx.doi.org/10.1016/j.jallcom.2010.07.100; https://hdl.handle.net/11480/4829; 508; 233; 237
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7
المؤلفون: Guvenc Akgul, Dennis Nordlund, F. Aksoy, Yüksel Ufuktepe
المساهمون: 0-Belirlenecek, Çukurova Üniversitesi, Ufuktepe, Yuksel -- 0000-0002-4411-5956, Nordlund, Dennis -- 0000-0001-9524-6908, [Aksoy, F. -- Akgul, G. -- Ufuktepe, Y.] Cukurova Univ, Dept Phys, TR-01330 Adana, Turkey -- [Aksoy, F.] Nigde Univ, Dept Phys, TR-51100 Nigde, Turkey -- [Nordlund, D.] Stanford Synchrotron Radiat Lab, Menlo Pk, CA 94025 USA
مصطلحات موضوعية: X-ray absorption spectroscopy, Yield (engineering), Absorption spectroscopy, Chemistry, Mechanical Engineering, Metals and Alloys, Attenuation length, Analytical chemistry, Electron Escape depth, Resonance, 3d Transition metals, Branching ratio, XANES, Full width at half maximum, Mechanics of Materials, Materials Chemistry, Transmission yield, Thin film, Cr