المؤلفون: Marzano, Martina, Kruskopf, Mattias, Panna, Alireza R, Rigosi, Albert F, Patel, Dinesh K, Jin, Hanbyul, Cular, Stefan, Callegaro, Luca, Elmquist, Randolph E, Ortolano, Massimo

المساهمون: Marzano, Martina, Kruskopf, Mattia, Panna, Alireza R, Rigosi, Albert F, Patel, Dinesh K, Jin, Hanbyul, Cular, Stefan, Callegaro, Luca, Elmquist, Randolph E, Ortolano, Massimo

مصطلحات موضوعية: quantum Hall effect, quantum Hall arrays, graphene, resistance bridges, electrical metrology, calibration, Kelvin bridge

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000520146800001; volume:57; issue:1; firstpage:015007; journal:METROLOGIA; http://hdl.handle.net/11696/61071; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85082388761

الاتاحة: http://hdl.handle.net/11696/61071
https://doi.org/10.1088/1681-7575/ab581e

المؤلفون: Sardjono, Hadi

المساهمون: Puslit Metrologi - LIPI

المصدر: Jurnal Standardisasi; Vol 20, No 3 (2018); 181 - 188 ; 2337-5833 ; 1411-0822

مصطلحات موضوعية: Metrology, Electrical Metrology, ratio meter, measurement, DC voltage standard, dissemination method, Measurement method

جغرافية الموضوع: Metrology, Measurement data

Time: DC voltege Traceability Chart

وصف الملف: application/pdf

Relation: https://js.bsn.go.id/index.php/standardisasi/article/view/716/pdf; https://js.bsn.go.id/index.php/standardisasi/article/downloadSuppFile/716/109; https://js.bsn.go.id/index.php/standardisasi/article/view/716

الاتاحة: https://js.bsn.go.id/index.php/standardisasi/article/view/716
https://doi.org/10.31153/js.v20i3.716

المؤلفون: Kalhauge, Kristoffer Gram, Henrichsen, Henrik Hartmann, Wang, Fei, Hansen, Ole, Petersen, Dirch Hjorth

المصدر: Kalhauge , K G , Henrichsen , H H , Wang , F , Hansen , O & Petersen , D H 2018 , ' Vibration tolerance of micro-electrodes ' , Journal of Micromechanics and Microengineering , vol. 28 , no. 9 , 095010 . https://doi.org/10.1088/1361-6439/aac58e

مصطلحات موضوعية: Micro four-point probe, Electrical metrology, Mechanical vibration, Micro-electrodes

وصف الملف: application/pdf

Relation: https://orbit.dtu.dk/en/publications/7c5a985f-e942-4ceb-84d7-dd067fdf00e2

الاتاحة: https://orbit.dtu.dk/en/publications/7c5a985f-e942-4ceb-84d7-dd067fdf00e2
https://doi.org/10.1088/1361-6439/aac58e
https://backend.orbit.dtu.dk/ws/files/150111744/Submit_Version_iop_002_.pdf
https://backend.orbit.dtu.dk/ws/files/179417792/Submit_09_05_2018.pdf

المؤلفون: Sassine, S, Steck, B, Feltin, N, Devoille, L, Chenaud, B, Poirier, W, Schopfer, F, Spengler, G, Séron, O, Piquemal, F, Lotkhov, S

المصدر: Sba: Controle & Automação Sociedade Brasileira de Automatica. December 2010 21(6)

مصطلحات موضوعية: electrical metrology, low current measurements, cryogenic current comparator, quantum metrological triangle, quantum current standard

وصف الملف: text/html

URL الوصول: http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0103-17592010000600006

المؤلفون: Martina Marzano, Luca Callegaro, Nobu-Hisa Kaneko, Takehiko Oe, Massimo Ortolano

المصدر: Metrologia. 55:167-174

مصطلحات موضوعية: Computer science, Open problem, 02 engineering and technology, Integrated circuit, Quantum Hall effect, 01 natural sciences, quantum Hall effect, law.invention, 010309 optics, Software, quantum Hall arrays, law, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, electrical metrology, uncertainty, resistance standards, quantum Hall effect, quantum Hall arrays, resistance standards, electrical metrology, uncertainty, business.industry, 020208 electrical & electronic engineering, General Engineering, Characterization (materials science), Metrology, business, Realization (systems), Network analysis

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::46ebb445753557a6d18be2ff48eacb8b
https://doi.org/10.1088/1681-7575/aaa5c1

المؤلفون: Alexandre BOUNOUH, François BLARD, Henri CAMON, Denis BELIERES

المصدر: Sensors & Transducers, Vol 123, Iss 12, Pp 1-15 (2010)

مصطلحات موضوعية: MEMS Design, SOI Process, Electrical metrology, Voltage Reference, Technology (General), T1-995

Relation: http://www.sensorsportal.com/HTML/DIGEST/december_2010/P_719.pdf; https://doaj.org/toc/2306-8515; https://doaj.org/toc/1726-5479; https://doaj.org/article/4840b76eaeee476cad873acdb091d1e4

الاتاحة: https://doaj.org/article/4840b76eaeee476cad873acdb091d1e4

المؤلفون: Renata De Barros E Vasconcellos, Marcello L. R. De Campos

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.imeko2009.it.pt/Papers/FP_133.pdf.

مصطلحات موضوعية: Electrical Metrology, Fractional Delay, Principal Component Analysis, Sampling Systems

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.415.9417; http://www.imeko2009.it.pt/Papers/FP_133.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.415.9417
http://www.imeko2009.it.pt/Papers/FP_133.pdf

المؤلفون: Renata De Barros E Vasconcellos, Luiz Macoto Ogino

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.imeko2009.it.pt/Papers/FP_97.pdf.

مصطلحات موضوعية: electrical metrology, coaxial current bridges

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.415.6030; http://www.imeko2009.it.pt/Papers/FP_97.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.415.6030
http://www.imeko2009.it.pt/Papers/FP_97.pdf

المؤلفون: Alessandro Rossi, Mikko Möttönen, Janis Timoshenko, Jevgeny Klochan, Andrew S. Dzurak, Vyacheslavs Kashcheyevs, Fay E. Hudson, Sven Rogge, Giuseppe C. Tettamanzi

المصدر: NANO LETTERS. 18(7):4141-4147

مصطلحات موضوعية: Electron capture, Physics::Optics, FOS: Physical sciences, Bioengineering, 02 engineering and technology, Electron, 7. Clean energy, 01 natural sciences, Quantization (physics), 0103 physical sciences, Mesoscale and Nanoscale Physics (cond-mat.mes-hall), Quantum metrology, General Materials Science, 010306 general physics, Quantum, QC, Physics, ta214, Condensed Matter - Mesoscale and Nanoscale Physics, ta114, business.industry, Mechanical Engineering, Quantum dot, silicon, General Chemistry, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Semiconductor, quantum electrical metrology, single-electron pump, Optoelectronics, Electric current, 0210 nano-technology, business

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2ff0558fc3b903bf0026c1db3eb9268f
https://doi.org/10.1021/acs.nanolett.8b00874

المؤلفون: Nobu-hisa Kaneko, Yasuhiro Fukuyama, 福山 康弘, 金子 晋久

المصدر: 炭素 / TANSO. 2010, 2010(243):121

المؤلفون: Patel, Nishant

المصدر: Electrical and Computer Engineering ETDs

مصطلحات موضوعية: Electrical Measurements, Piezoelectric Fields, Electrical Metrology, Acoustic Waves

وصف الملف: application/pdf

Relation: https://digitalrepository.unm.edu/ece_etds/201; https://digitalrepository.unm.edu/cgi/viewcontent.cgi?article=1200&context=ece_etds

الاتاحة: https://digitalrepository.unm.edu/ece_etds/201
https://digitalrepository.unm.edu/cgi/viewcontent.cgi?article=1200&context=ece_etds

المؤلفون: G. Spengler, Laurent Devoille, W. Poirier, F Schopfer, F. Piquemal, S Lotkhov, B. Chenaud, Olivier Séron, B Steck, Nicolas Feltin, S. Sassine

المصدر: Sba: Controle & Automação Sociedade Brasileira de Automatica v.21 n.6 2010
Sba: Controle & Automação Sociedade Brasileira de Automatica
Sociedade Brasileira de Automática (SBA)
instacron:SBA
Sba: Controle & Automação Sociedade Brasileira de Automatica, Volume: 21, Issue: 6, Pages: 609-615, Published: DEC 2010

مصطلحات موضوعية: Physics, Josephson effect, Quantum Hall effect, Elementary charge, Planck constant, cryogenic current comparator, Computer Science Applications, low current measurements, symbols.namesake, Quantization (physics), Control and Systems Engineering, Quantum mechanics, symbols, Quantum metrology, quantum current standard, electrical metrology, Electrical and Electronic Engineering, Ohm, Quantum, quantum metrological triangle

وصف الملف: text/html

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7e3996fb8bc84516d4c383035f7ee755
https://doi.org/10.1590/s0103-17592010000600006

المؤلفون: Rengnez, Florentin

Thesis Advisors: Université Paris-Saclay (ComUE), Placko, Dominique

مصطلحات موضوعية: Comparateur cryogénique de courant, Mesure de faible courant, Effet tunnel à un electron, Metrologie electrique, Cryogenic current comparator, Low current measurement, Single electron tunneling, Electrical metrology

الاتاحة: http://www.theses.fr/2015SACLN009/document

المؤلفون: Rengnez, Florentin

المساهمون: STAR, ABES

مصطلحات موضوعية: Single electron tunneling, Metrologie electrique, [PHYS.COND.CM-GEN] Physics [physics]/Condensed Matter [cond-mat]/Other [cond-mat.other], Electrical metrology, Mesure de faible courant, Low current measurement, Comparateur cryogénique de courant, Effet tunnel à un electron, Cryogenic current comparator

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=od_____10369::de63e2fc9210b5af9460abe708d8dbf6
https://theses.hal.science/tel-01261434

المؤلفون: Rengnez, Florentin

المساهمون: Systèmes et Applications des Technologies de l'Information et de l'Energie (SATIE), École normale supérieure - Cachan (ENS Cachan)-Université Paris-Sud - Paris 11 (UP11)-Institut Français des Sciences et Technologies des Transports, de l'Aménagement et des Réseaux (IFSTTAR)-École normale supérieure - Rennes (ENS Rennes)-Université de Cergy Pontoise (UCP), Université Paris-Seine-Université Paris-Seine-Conservatoire National des Arts et Métiers CNAM (CNAM)-Centre National de la Recherche Scientifique (CNRS), Université Paris Saclay (COmUE), Dominique Placko

المصدر: https://theses.hal.science/tel-01261434 ; Autre [cond-mat.other]. Université Paris Saclay (COmUE), 2015. Français. ⟨NNT : 2015SACLN009⟩.

مصطلحات موضوعية: Cryogenic current comparator, Low current measurement, Single electron tunneling, Electrical metrology, Comparateur cryogénique de courant, Mesure de faible courant, Effet tunnel à un electron, Metrologie electrique, [PHYS.COND.CM-GEN]Physics [physics]/Condensed Matter [cond-mat]/Other [cond-mat.other]

Relation: NNT: 2015SACLN009; tel-01261434; https://theses.hal.science/tel-01261434; https://theses.hal.science/tel-01261434/document; https://theses.hal.science/tel-01261434/file/73038_RENGNEZ_2015_archivage.pdf

الاتاحة: https://theses.hal.science/tel-01261434
https://theses.hal.science/tel-01261434/document
https://theses.hal.science/tel-01261434/file/73038_RENGNEZ_2015_archivage.pdf

المؤلفون: Rengnez, Florentin

المساهمون: Université Paris-Saclay (ComUE), Placko, Dominique

مصطلحات موضوعية: Comparateur cryogénique de courant, Mesure de faible courant, Effet tunnel à un electron, Metrologie electrique, Cryogenic current comparator, Low current measurement, Single electron tunneling, Electrical metrology

Relation: http://www.theses.fr/2015SACLN009/document

الاتاحة: http://www.theses.fr/2015SACLN009/document

المؤلفون: Devoille, Laurent, Feltin, N., Steck, B., Chenaud, Boris, Sassine, S., Djordevic, S., Seron, O., Piquemal, François

المساهمون: Laboratoire commun de métrologie LNE-CNAM (LCM-CNAM), Laboratoire National de Métrologie et d'Essais Trappes (LNE)-Conservatoire National des Arts et Métiers CNAM (CNAM), Laboratoire Charles Coulomb (L2C), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)

المصدر: ISSN: 0957-0233.

مصطلحات موضوعية: quantum electrical metrology, quantum metrological triangle, single-electron tunnelling device, cryogenic current comparator, 06.20.Jr Determination of fundamental constants, 73.43.Fj Novel experimental methods, measurements, 06.20.fb Standards and calibration, 03.65.Ta Foundations of quantum mechanics, measurement theory, 06.20.fa Units, [PHYS.QPHY]Physics [physics]/Quantum Physics [quant-ph], [PHYS.COND.CM-MSQHE]Physics [physics]/Condensed Matter [cond-mat]/Mesoscopic Systems and Quantum Hall Effect [cond-mat.mes-hall]

الاتاحة: https://hal.science/hal-00789063
https://doi.org/10.1088/0957-0233/23/12/124011

المؤلفون: Urbanowicz, Adam, Vanstreels, Kris, Verdonck, Patrick, Van Besien, Els, Trompoukis, Christos, Shamiryan, Denis, De Gendt, Stefan, Baklanov, Mikhaïl

مصطلحات موضوعية: mechanical-properties, ellipsometric porosimetry, ultraviolet-radiation, electrical metrology, constant materials, thin-films, damage, cvd, range, model

Relation: Journal of Vacuum Science & Technology B, Microelectronics and Nanometer Structures vol:29 issue:3 pages:-; 57th Symposium of the American-Vacuum-Society Albuquerque, NM, NOV 17-22, 2010; https://lirias.kuleuven.be/handle/123456789/334947; P20928

الاتاحة: https://lirias.kuleuven.be/handle/123456789/334947
https://doi.org/10.1116/1.3572063

المؤلفون: B Steck, S. Sassine, Laurent Devoille, Nicolas Feltin, S. Djordevic, B. Chenaud, Olivier Séron, François Piquemal

المساهمون: Laboratoire commun de métrologie LNE-CNAM (LCM), Laboratoire National de Métrologie et d'Essais [Trappes] (LNE )-Conservatoire National des Arts et Métiers [CNAM] (CNAM), Laboratoire Charles Coulomb (L2C), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)

المصدر: Measurement Science and Technology
Measurement Science and Technology, IOP Publishing, 2012, 23 (12), pp.124011. ⟨10.1088/0957-0233/23/12/124011⟩

مصطلحات موضوعية: Josephson effect, Electron, Quantum Hall effect, Planck constant, Elementary charge, 01 natural sciences, 010305 fluids & plasmas, symbols.namesake, [PHYS.QPHY]Physics [physics]/Quantum Physics [quant-ph], Quantum mechanics, 0103 physical sciences, Ohm, 06.20.Jr Determination of fundamental constants , 73.43.Fj Novel experimental methods, measurements, 06.20.fb Standards and calibration, 03.65.Ta Foundations of quantum mechanics, measurement theory, 06.20.fa Units, 010306 general physics, Instrumentation, Engineering (miscellaneous), [PHYS.COND.CM-MSQHE]Physics [physics]/Condensed Matter [cond-mat]/Mesoscopic Systems and Quantum Hall Effect [cond-mat.mes-hall], Physics, Applied Mathematics, single-electron tunnelling device, Charge (physics), cryogenic current comparator, Cryogenic current comparator, quantum electrical metrology, symbols, quantum metrological triangle

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b71bf26adfc30753d31b20fbea72fbb5
https://hal.archives-ouvertes.fr/hal-00789063

المؤلفون: Kruskopf, Mattias, Bauer, Stephan, Pimsut, Yaowaret, Chatterjee, Atasi, Patel, Dinesh K, Rigosi, Albert F., Elmquist, Randolph E., Pierz, Klaus, Pesel, Eckart, Götz, Martin, Schurr, Jürgen

مصطلحات موضوعية: epitaxial graphene, quantum Hall effect, electrical metrology, resistance metrology, quantum metrology

Relation: https://doi.org/10.1109/TED.2021.3082809; https://zenodo.org/communities/18sib07-giqs; https://doi.org/10.5281/zenodo.5076039; https://doi.org/10.5281/zenodo.5076040; oai:zenodo.org:5076040

الاتاحة: https://doi.org/10.5281/zenodo.5076040