-
1
المؤلفون: Cyprien Lanthermann, Theo A. ten Brummelaar, Peter G. Tuthill, Marc-Antoine Martinod, Edgar R. Ligon, Douglas R. Gies, Gail Schaefer, Matthew D. Anderson
المساهمون: Merand, A, Sallum, S, Sanchez-Bermudez, J
مصطلحات موضوعية: Technology, Science & Technology, FOS: Physical sciences, Optics, BINARY, Astronomy & Astrophysics, sensitivity, near-infrared, SUPERMASSIVE BLACK-HOLES, Physical Sciences, e-APD, K-band, Astrophysics - Instrumentation and Methods for Astrophysics, optical interferometry, Instrumentation and Methods for Astrophysics (astro-ph.IM), Instruments & Instrumentation, ANGULAR DIAMETERS, H-band
-
2
المؤلفون: John Young, C. Salcido, Eugene Seneta, James J. D. Luis, Daniel Mortimer, Edgar R. Ligon, Michelle Creech-Eakman, Christopher A. Haniff, David F. Buscher, Xiaowei Sun
المصدر: Optical and Infrared Interferometry and Imaging VII.
مصطلحات موضوعية: Computer science, business.industry, spectro-interferometry, Astrophysics::Instrumentation and Methods for Astrophysics, H band, Beam Combiner, Image plane, K-Band, J band, H-Band, symbols.namesake, Interferometry, Fourier transform, Optics, K band, J-Band, symbols, Spectral resolution, business, MROI, Beam (structure)
-
3
المؤلفون: Siavash Norouzi, James J. D. Luis, Ramyaa Ramyaa, John S. Young, Eugene B. Seneta, Morteza Darvish Morshedi Hosseini, Edgar R. Ligon
المصدر: Electronic Imaging. 34:203-1