المؤلفون: A. Bartasyte, R. Bouregba, E. Dogheche, M. Boudard, G. Poullain, C. Jimenez, D. Remiens, A. Abrutis, F. Weiss, O. Chaix-pluchery, Z. Saltyte

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://hal.archives-ouvertes.fr/docs/00/26/12/49/PDF/PTO_2.pdf.

مصطلحات موضوعية: MOCVD, PbTiO3 films, ferroelectric and piezoelectric properties

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.371.8537; http://hal.archives-ouvertes.fr/docs/00/26/12/49/PDF/PTO_2.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.371.8537
http://hal.archives-ouvertes.fr/docs/00/26/12/49/PDF/PTO_2.pdf

المؤلفون: O. Tiemogo Hamidou, E. Dogheche

المساهمون: Institut d’Électronique, de Microélectronique et de Nanotechnologie - Département Opto-Acousto-Électronique - UMR 8520 (IEMN-DOAE), Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)-Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF), Optoélectronique - IEMN (OPTO - IEMN)

المصدر: Proceedings of the Third International Conference on Railway Technology : Research, Development and Maintenance
Third International Conference on Railway Technology : Research, Development and Maintenance
Third International Conference on Railway Technology : Research, Development and Maintenance, Apr 2016, Cagliari, Italy. 8 p., ⟨10.4203/ccp.110.322⟩

مصطلحات موضوعية: [SPI.ACOU]Engineering Sciences [physics]/Acoustics [physics.class-ph], [SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic, ComputingMilieux_MISCELLANEOUS

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::69b709a6dd581a4c2bf1cc6d0a82fa69
https://uphf.hal.science/hal-03682690

المؤلفون: S.S. Ang, E. Dogheche, Aaron J. Danner, A. B. Chew, J. H. Teng, G. Y. Si

المصدر: International Journal of Nanoscience. :311-315

مصطلحات موضوعية: Nanostructure, Plasma etching, Materials science, Lithium niobate, Analytical chemistry, Bioengineering, Condensed Matter Physics, Computer Science Applications, Interference lithography, chemistry.chemical_compound, chemistry, Etching (microfabrication), General Materials Science, Dry etching, Electrical and Electronic Engineering, Inductively coupled plasma, Reactive-ion etching, Biotechnology

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::37d0c3977af1e2c64d28f9046da3a7a6
https://doi.org/10.1142/s0219581x10006867

المؤلفون: G. Velu, Denis Remiens, E. Dogheche

المساهمون: Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)

المصدر: Vacuum
Vacuum, Elsevier, 2002, 66, pp.1-8
Vacuum, 2002, 66, pp.1-8

مصطلحات موضوعية: 010302 applied physics, Permittivity, Piezoelectric coefficient, Materials science, Condensed matter physics, Mineralogy, 02 engineering and technology, Refractive index profile, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Ferroelectricity, Surfaces, Coatings and Films, 0103 physical sciences, Dielectric loss, Thin film, 0210 nano-technology, Instrumentation, Refractive index, Perovskite (structure)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b34b9550779e465b92662d566610695e
https://doi.org/10.1016/s0042-207x(01)00389-x

المؤلفون: Alshehri, B Alshehri, Bandar, Lee, SM Lee, Seung-Min, Kang, JH Kang, Jin-Ho, Gong, SH Gong, Suhyun, Ryu, SW Ryu, Sang-Wan, Cho, YH Cho, Yong-Hoon, Dogheche, E Dogheche, Elhadj

الاتاحة: http://hdl.handle.net/10203/193833
https://doi.org/10.1063/1.4892528

المؤلفون: Gokarna, A Gokarna, Anisha, Kim, JH Kim, Je-Hyung, Leroy, F Leroy, Floriane, Patriarche, G Patriarche, Gilles, Roussel, P Roussel, Pascal, Bougrioua, Z Bougrioua, Zahia, Rodriguez, C Rodriguez, Christophe, Dogheche, E Dogheche, Elhadj, Cho, YH Cho, Yong-Hoon

الاتاحة: http://hdl.handle.net/10203/189002
https://doi.org/10.1016/j.jlumin.2013.07.031

المؤلفون: Stolz, A Stolz, Arnaud, Ko, SM Ko, Suck-Min, Patriarche, G Patriarche, Gilles, Dogheche, E Dogheche, Elhadj, Cho, YH Cho, Yong-Hoon, Decoster, D Decoster, Didier

الاتاحة: http://hdl.handle.net/10203/174623
https://doi.org/10.1063/1.4776671

المؤلفون: Gong, SH Gong, Suhyun, Stolz, A. Stolz, Arnaud, Myeong, G.-H. Myeong, Gi-Hwan, Dogheche, E. Dogheche, Elhadj, Gokarna, A. Gokarna, Anisha, Ryu, S.-W. Ryu, Sang-Wan, Decoster, D. Decoster, Didier, Cho, Y.-H. Cho, Yong-Hoon

الاتاحة: http://hdl.handle.net/10203/93925

المؤلفون: Zhe Xu, E. Dogheche, A. Malcoci, Mario Weiß, S.P. McAlister, T. K. Ng, J. F. Lampin, J. A. Gupta, S. Fedderwitz, S.F. Yoon, A. Söhr, Kian Hua Tan, A. Poloczek, Dieter Jäger, Salim Faci, K. L. Lew, Satrio Wicaksono, J. Chazelas, Wan Khai Loke, Didier Decoster, C. Tripon-Canseliet, O. Ecin, Y. K. Sim, Malek Zegaoui, N. Saadsaoud

المساهمون: School of Electrical and Electronic Engineering (EEE), Nanyang Technological University [Singapour], Universität Duisburg-Essen [Essen], Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF), Laboratoire d'Electronique et Electromagnétisme (L2E), Université Pierre et Marie Curie - Paris 6 (UPMC), THALES Airborne Systems [Elancourt], THALES, Institute for Microstructural Sciences (NRC - IMS), National Research Council of Canada (NRC), Universität Duisburg-Essen = University of Duisburg-Essen [Essen], THALES [France]

المصدر: ECS Transcations
215th ECS Meeting
215th ECS Meeting, May 2009, San francisco, United States. pp.5-29, ⟨10.1149/1.3120682⟩
215th ECS Meeting, State-of-the-Art Program on Compound Semiconductors 50 (SOTAPOCS 50) and Processes at the Semiconductor Solution Interface 3
215th ECS Meeting, State-of-the-Art Program on Compound Semiconductors 50 (SOTAPOCS 50) and Processes at the Semiconductor Solution Interface 3, 2009, San Francisco, CA, United States. ⟨10.1149/1.3120682⟩

مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, Heterojunction bipolar transistor, Photodetector, 02 engineering and technology, Nitride, 021001 nanoscience & nanotechnology, 7. Clean energy, 01 natural sciences, [SPI.TRON]Engineering Sciences [physics]/Electronics, Full width at half maximum, Photoconductive switch, 0103 physical sciences, Antimonide, Optoelectronics, Photonics, 0210 nano-technology, business, Voltage, Elektrotechnik

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6ffa5285f5d51fc79bed5c3cc5d43b50
https://hal.sorbonne-universite.fr/hal-00620077

المؤلفون: E. Dogheche, E. Ntagwirumugara, T. Gryba, J.E. Lefebvre, V. Zhang

المساهمون: Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)

المصدر: IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control
IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control, 2007, 54, pp.2011-2015. ⟨10.1109/TUFFC.2007.495⟩
IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control, Institute of Electrical and Electronics Engineers, 2007, 54, pp.2011-2015. ⟨10.1109/TUFFC.2007.495⟩

مصطلحات موضوعية: 010302 applied physics, Frequency response, Materials science, Acoustics and Ultrasonics, business.industry, Interdigital transducer, Piezoelectric sensor, Surface acoustic wave, 01 natural sciences, Piezoelectricity, Filter (video), 0103 physical sciences, Mode coupling, Electronic engineering, Optoelectronics, Electrical and Electronic Engineering, business, 010301 acoustics, Instrumentation, Electronic filter

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4e6f40217700dfed2b57fd4e7b8224a0
https://pubmed.ncbi.nlm.nih.gov/18019238

المؤلفون: B. Theirry, E. Dogheche, D. Remiens

المصدر: Scopus-Elsevier

مصطلحات موضوعية: Transverse plane, Materials science, Optics, Field (physics), business.industry, Optical communication, Physics::Optics, Thin film, Propagation constant, business, Ferroelectricity, Waveguide (optics), Beam (structure)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4e1812ea15635ac9478ca8257cca5369
https://doi.org/10.1109/isaf.1996.602711

المؤلفون: J. C. Loulergue, E. Dogheche, Denis Remiens, Azzedine Boudrioua

المصدر: ISAF 1998. Proceedings of the Eleventh IEEE International Symposium on Applications of Ferroelectrics (Cat. No.98CH36245).

مصطلحات موضوعية: Optics, Materials science, Guided wave testing, business.industry, Sputtering, Annealing (metallurgy), Sapphire, Sputter deposition, Thin film, business, Refractive index, Ferroelectricity

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2ebae0317b810934fbaa42f4ce8afccc
https://doi.org/10.1109/isaf.1998.786760

المؤلفون: E. Dogheche, B. Belgacem, D. Remiens, P. Ruterana, F. Omnes, Cedex F, Ismra Bd, Maréchal Juin, Caen Cedex F

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.dmphotonics.com/Rutile_Coupling_Prism/RutilePrism_article.pdf.

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.604.6433; http://www.dmphotonics.com/Rutile_Coupling_Prism/RutilePrism_article.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.604.6433
http://www.dmphotonics.com/Rutile_Coupling_Prism/RutilePrism_article.pdf

المؤلفون: Saad Mezzour, J.P. Gouy, Jean-Pierre Vilcot, E. Dogheche, Didier Decoster

المصدر: SPIE Proceedings.

مصطلحات موضوعية: Materials science, business.industry, Optical link, Detector, Bandwidth (signal processing), Photodiode, law.invention, Electric power transmission, law, Electronic engineering, Maximum power transfer theorem, Optoelectronics, Center frequency, business, Microwave

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0cd06dfc762845111a549061a49c11a1
https://doi.org/10.1117/12.175280

المؤلفون: L. Kerkache, A. Layadi, E. Dogheche, D. R?miens

المصدر: European Physical Journal - Applied Physics; Jul2007, Vol. 39 Issue 1, p1-5, 5p

المؤلفون: S Rollier, D Jenkins, E Dogheche, B Legrand, M Faucher, L Buchaillot

المصدر: Journal of Micromechanics & Microengineering; Aug2010, Vol. 20 Issue 8, p085010-085010, 1p

مصطلحات موضوعية: ATOMIC force microscopy, LIQUIDS, MOLECULAR probes, IMAGING systems, CANTILEVERS, SILICON, ACTUATORS