يعرض 1 - 20 نتائج من 107 نتيجة بحث عن '"Dunaevskiy, M S"', وقت الاستعلام: 0.73s تنقيح النتائج
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    المساهمون: Ioffe Institute, Department of Neuroscience and Biomedical Engineering, Department of Electronics and Nanoengineering, Aalto-yliopisto, Aalto University

    وصف الملف: application/pdf

    Relation: Journal of Physics: Conference Series; Volume 1461, issue 1; Alekseev , P A , Smirnov , A N , Davydov , V Y , Haggrén , T , Lipsanen , H , Dunaevskiy , M S & Berkovits , V L 2020 , ' Photodegradation of surface passivated GaAs nanowires ' , Journal of Physics: Conference Series , vol. 1461 , no. 1 , 012002 . https://doi.org/10.1088/1742-6596/1461/1/012002; PURE UUID: a7f774eb-20fc-4cda-a279-7adda70d5071; PURE ITEMURL: https://research.aalto.fi/en/publications/a7f774eb-20fc-4cda-a279-7adda70d5071; PURE LINK: http://www.scopus.com/inward/record.url?scp=85084159605&partnerID=8YFLogxK; PURE FILEURL: https://research.aalto.fi/files/42907030/Alekseev_2020_J._Phys._Conf._Ser._1461_012002.pdf; https://aaltodoc.aalto.fi/handle/123456789/44529; URN:NBN:fi:aalto-202006013502

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    المساهمون: Ioffe Institute, Department of Electronics and Nanoengineering, Aalto-yliopisto, Aalto University

    وصف الملف: application/pdf

    Relation: Journal of Physics: Conference Series; Volume 1410; Borodin , B R , Alekseev , P A , Dunaevskiy , M S , Khayrudinov , V & Lipsanen , H 2019 , ' Analysis of doping distribution in horizontal GaAs nanowires with axial p-n junction by the conductive atomic force microscopy ' , Journal of Physics: Conference Series , vol. 1410 , no. 1 , 012228 . https://doi.org/10.1088/1742-6596/1410/1/012228; PURE UUID: d79e4245-0f57-4a3f-b6a3-ca8187932bbf; PURE ITEMURL: https://research.aalto.fi/en/publications/d79e4245-0f57-4a3f-b6a3-ca8187932bbf; PURE FILEURL: https://research.aalto.fi/files/40208337/Borodin_2019_J._Phys._Conf._Ser._1410_012228.pdf; https://aaltodoc.aalto.fi/handle/123456789/42580; URN:NBN:fi:aalto-202001171695

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    المساهمون: Department of Micro and Nanosciences, Department of Electronics and Nanoengineering, Ioffe Institute, St. Petersburg State University, GK Nitride Crystals, Aalto-yliopisto, Aalto University

    وصف الملف: application/pdf

    Relation: Journal of Physics: Conference Series; Volume 951, issue 1; Lebedev, A A, Davydov, V Y, Usachov, D Y, Lebedev, S P, Smirnov, A N, Levitskii, V S, Eliseyev, I A, Alekseev, P A, Dunaevskiy, M S, Rybkin, A G, Novikov, S N & Makarov, Y N 2018, ' Study of properties and development of sensors based on graphene films grown on SiC (0001) by thermal destruction method ', Journal of Physics: Conference Series, vol. 951, no. 1, 012007 . https://doi.org/10.1088/1742-6596/951/1/012007; PURE UUID: 41988c1e-27cc-46e7-bdc1-6861d561e441; PURE ITEMURL: https://research.aalto.fi/en/publications/41988c1e-27cc-46e7-bdc1-6861d561e441; PURE LINK: http://www.scopus.com/inward/record.url?scp=85042361556&partnerID=8YFLogxK; PURE FILEURL: https://research.aalto.fi/files/18124383/Lebedev_2018_J._Phys._Conf._Ser._951_012007.pdf; https://aaltodoc.aalto.fi/handle/123456789/30255; URN:NBN:fi:aalto-201803161725

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    المساهمون: Ioffe Institute, LUT University, Department of Bioproducts and Biosystems, Aalto-yliopisto, Aalto University

    وصف الملف: application/pdf

    Relation: IOP Conference Series: Materials Science and Engineering; Volume 443, issue 1; Dunaevskiy , M S , Alekseev , P A , Geydt , P , Lahderanta , E , Haggren , T & Lipsanen , H 2018 , ' Measurement of the bending of thin inclined nanowires as a method for determining elastic modulus ' , IOP Conference Series: Materials Science and Engineering , vol. 443 , no. 1 , 012006 . https://doi.org/10.1088/1757-899X/443/1/012006; PURE UUID: 2815049a-7274-4ad8-9f9e-47eb834c6a55; PURE ITEMURL: https://research.aalto.fi/en/publications/2815049a-7274-4ad8-9f9e-47eb834c6a55; PURE LINK: http://www.scopus.com/inward/record.url?scp=85057482928&partnerID=8YFLogxK; PURE FILEURL: https://research.aalto.fi/files/30313746/CHEM_Dunaevskiy_et_al_Measurement_of_the_bending_2018_IOP_Conference_Series_Materials_Science_and_Engineering.pdf; https://aaltodoc.aalto.fi/handle/123456789/35629; URN:NBN:fi:aalto-201812216637

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    المؤلفون: Dunaevskiy, M. S.1 (AUTHOR) Mike.Dunaeffsky@mail.ioffe.ru, Gushchina, E. V.1 (AUTHOR), Malykh, D. A.1 (AUTHOR), Lebedev, S. P.1 (AUTHOR), Lebedev, A. A.1 (AUTHOR)

    المصدر: Technical Physics Letters. Dec2023, Vol. 49 Issue 12, p238-241. 4p.

    مصطلحات موضوعية: *MICROSCOPY, *SURFACE potential, *SCANNING probe microscopy

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