يعرض 1 - 20 نتائج من 55 نتيجة بحث عن '"Dowsett, M.G."', وقت الاستعلام: 0.66s تنقيح النتائج
  1. 1
    Academic Journal

    المصدر: %3Ci%3EJournal+of+Synchrotron+Radiation+27%3C%2Fi%3E%3A+653-663.+%3Ca+href%3D%22https%3A%2F%2Fhdl.handle.net%2F10.1107%2FS1600577520001812%22+target%3D%22_blank%22%3Ehttps%3A%2F%2Fhdl.handle.net%2F10.1107%2FS1600577520001812%3C%2Fa%3E

    وصف الملف: application/pdf

    Relation: info:eu-repo/semantics/altIdentifier/wos/000531472900011; https://www.vliz.be/imisdocs/publications/361675.pdf

  2. 2
    Academic Journal

    مصطلحات موضوعية: QC Physics

    Relation: Walker, M., Brown, M.G., Draxler, M., Dowsett, M.G., McConville, C.F., Noakes, T.C.Q. and Bailey, Paul (2011) Structural analysis of the Cu(100)–p(3)R45°–Sn surface using low and medium energy ion scattering spectroscopies. Surface Science, 605 (23-24). pp. 1934-1940. ISSN 0039-6028

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    Academic Journal
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    Academic Journal
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    Academic Journal
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    Academic Journal

    Relation: http://shura.shu.ac.uk/12778/; http://www.sciencedirect.com/science/article/pii/S138824810500264X; LEYSSENS, K., ADRIAENS, A., DOWSETT, M.G., SCHOTTE, B., OLOFF, I., PANTOS, E., BELL, Anthony M. T. and THOMPSON, S. P. (2005). Simultaneous in situ time resolved SR-XRD and corrosion potential analyses to monitor the corrosion on copper. Electrochemistry Communications, 7 (12), 1265-1270.

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    Academic Journal
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    Academic Journal

    مصطلحات موضوعية: Q Science (General), QC Physics

    Relation: Dowsett, M.G., Ormsby, T.J., Gard, F.S., Al-Harthi, S.H., Guzmán, B., McConville, C.F., Noakes, T.C.Q. and Bailey, Paul (2003) Determination of the variation in sputter yield in the SIMS transient region using MEIS. Applied Surface Science, 203-20. pp. 363-366. ISSN 0169-4332

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    Academic Journal
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    Academic Journal
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    Academic Journal
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    Academic Journal
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    Academic Journal
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    Academic Journal
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    Academic Journal
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    Academic Journal
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    Academic Journal
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    Academic Journal

    Relation: Bonar, J.M., Willoughby, A.F.W., Dan, A.H., McGregor, B.M., Lerch, W., Loffelmacher, D., Cooke, G.A. and Dowsett, M.G. (2001) Antimony and boron diffusion in SiGe and Si under the influence of injected point defects. Journal of Materials Science: Materials in Electronics, 12 (4-6), 219-221. (doi:10.1023/A:1011299017835 ).

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    Academic Journal
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    Academic Journal