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1Academic Journal
المؤلفون: Dowsett, M.G., Sabbe, P.-J., Anjos, J.A., Schofield, E.J., Walker, D., Thomas, P., York, S., Brown, S., Wermeille, D., Adriaens, M.
المصدر: %3Ci%3EJournal+of+Synchrotron+Radiation+27%3C%2Fi%3E%3A+653-663.+%3Ca+href%3D%22https%3A%2F%2Fhdl.handle.net%2F10.1107%2FS1600577520001812%22+target%3D%22_blank%22%3Ehttps%3A%2F%2Fhdl.handle.net%2F10.1107%2FS1600577520001812%3C%2Fa%3E
وصف الملف: application/pdf
Relation: info:eu-repo/semantics/altIdentifier/wos/000531472900011; https://www.vliz.be/imisdocs/publications/361675.pdf
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2Academic Journal
المؤلفون: Walker, M., Brown, M.G., Draxler, M., Dowsett, M.G., McConville, C.F., Noakes, T.C.Q., Bailey, Paul
مصطلحات موضوعية: QC Physics
Relation: Walker, M., Brown, M.G., Draxler, M., Dowsett, M.G., McConville, C.F., Noakes, T.C.Q. and Bailey, Paul (2011) Structural analysis of the Cu(100)–p(3)R45°–Sn surface using low and medium energy ion scattering spectroscopies. Surface Science, 605 (23-24). pp. 1934-1940. ISSN 0039-6028
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3Academic Journal
المؤلفون: Walker, M., Brown, M.G., Draxler, M., Fishwick, L., Dowsett, M.G., McConville, C.F.
المصدر: Surface Science ; volume 605, issue 1-2, page 107-115 ; ISSN 0039-6028
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4Academic JournalNew Cs sputter ion source with polyatomic ion beams for secondary ion mass spectrometry applications
المؤلفون: Belykh, S.F., Palitsin, V.V., Veryovkin, I.V., Kovarsky, A.P., Chang, R.J.H., Adriaens, Annemie, Dowsett, M.G., Adams, Freddy
المصدر: 0034-6748 ; The review of scientific instruments
Relation: info:eu-repo/semantics/altIdentifier/isi/000249156700044
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5Academic Journal
المصدر: Diamond and Related Materials ; volume 16, issue 4-7, page 809-814 ; ISSN 0925-9635
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6Academic Journal
المؤلفون: Leyssens, K., Adriaens, A., Dowsett, M.G., Schotte, B., Oloff, I., Pantos, E., Bell, Anthony M. T., Thompson, S. P.
Relation: http://shura.shu.ac.uk/12778/; http://www.sciencedirect.com/science/article/pii/S138824810500264X; LEYSSENS, K., ADRIAENS, A., DOWSETT, M.G., SCHOTTE, B., OLOFF, I., PANTOS, E., BELL, Anthony M. T. and THOMPSON, S. P. (2005). Simultaneous in situ time resolved SR-XRD and corrosion potential analyses to monitor the corrosion on copper. Electrochemistry Communications, 7 (12), 1265-1270.
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7Academic Journal
المؤلفون: Dowsett, M.G., Adriaens, A., Soares, M., Wouters, H., Palitsin, V.V.N., Gibbons, R., Morris, R.J.H.
المصدر: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms ; volume 239, issue 1-2, page 51-64 ; ISSN 0168-583X
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8Academic Journal
المؤلفون: Dowsett, M.G., Ormsby, T.J., Gard, F.S., Al-Harthi, S.H., Guzmán, B., McConville, C.F., Noakes, T.C.Q., Bailey, Paul
مصطلحات موضوعية: Q Science (General), QC Physics
Relation: Dowsett, M.G., Ormsby, T.J., Gard, F.S., Al-Harthi, S.H., Guzmán, B., McConville, C.F., Noakes, T.C.Q. and Bailey, Paul (2003) Determination of the variation in sputter yield in the SIMS transient region using MEIS. Applied Surface Science, 203-20. pp. 363-366. ISSN 0169-4332
الاتاحة: http://eprints.hud.ac.uk/id/eprint/14805/
https://doi.org/10.1016/s0169-4332(02)00879-6 -
9Academic Journal
المؤلفون: Gibbons, R., Dowsett, M.G., Kelly, J., Blenkinsopp, P., Hill, R., Richards, D., Loibl, N.
المصدر: Applied Surface Science ; volume 203-204, page 343-347 ; ISSN 0169-4332
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10Academic Journal
المؤلفون: Gard, F.S., Riley, J.D., Dowsett, M.G., Prince, K.
المصدر: Applied Surface Science ; volume 203-204, page 490-494 ; ISSN 0169-4332
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11Academic Journal
المؤلفون: Rees, E.E., McPhail, D.S., Ryan, M.P., Kelly, J., Dowsett, M.G.
المصدر: Applied Surface Science ; volume 203-204, page 660-664 ; ISSN 0169-4332
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12Academic Journal
المؤلفون: Dowsett, M.G.
المصدر: Applied Surface Science ; volume 203-204, page 5-12 ; ISSN 0169-4332
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13Academic Journal
المؤلفون: Bellingham, J., Dowsett, M.G.
المصدر: Applied Surface Science ; volume 203-204, page 130-133 ; ISSN 0169-4332
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14Academic Journal
المؤلفون: Dowsett, M.G., Kelly, J.H., Rowlands, G., Ormsby, T.J., Guzmán, B., Augustus, P., Beanland, R.
المصدر: Applied Surface Science ; volume 203-204, page 273-276 ; ISSN 0169-4332
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15Academic Journal
المؤلفون: Kelly, J.H., Dowsett, M.G., Augustus, P., Beanland, R.
المصدر: Applied Surface Science ; volume 203-204, page 260-263 ; ISSN 0169-4332
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16Academic Journal
المؤلفون: Bellingham, J., Dowsett, M.G., Collart, E., Kirkwood, D.
المصدر: Applied Surface Science ; volume 203-204, page 851-854 ; ISSN 0169-4332
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17Academic Journal
المؤلفون: Dowsett, M.G., Morris, R., Chou, Pei-Fen, Corcoran, S.F., Kheyrandish, H., Cooke, G.A., Maul, J.L., Patel, S.B.
المصدر: Applied Surface Science ; volume 203-204, page 500-503 ; ISSN 0169-4332
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18Academic Journal
المؤلفون: Bonar, J.M., Willoughby, A.F.W., Dan, A.H., McGregor, B.M., Lerch, W., Loffelmacher, D., Cooke, G.A., Dowsett, M.G.
Relation: Bonar, J.M., Willoughby, A.F.W., Dan, A.H., McGregor, B.M., Lerch, W., Loffelmacher, D., Cooke, G.A. and Dowsett, M.G. (2001) Antimony and boron diffusion in SiGe and Si under the influence of injected point defects. Journal of Materials Science: Materials in Electronics, 12 (4-6), 219-221. (doi:10.1023/A:1011299017835 ).
الاتاحة: https://eprints.soton.ac.uk/21790/
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19Academic Journal
المؤلفون: Mironov, O.A, Fulgoni, D.J.F, Parry, C.P, Cooke, G.A, Dowsett, M.G, Parker, E.H.C, Chtcherbatchev, K.D, Bassas, J.M, Romano-Rodriguez, A, Perez-Rodriguez, A, Morante, J.R
المصدر: Thin Solid Films ; volume 367, issue 1-2, page 176-179 ; ISSN 0040-6090
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20Academic Journal
المؤلفون: Dowsett, M.G., Barlow, R.D.
المصدر: Analytica Chimica Acta ; volume 297, issue 1-2, page 253-275 ; ISSN 0003-2670