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المؤلفون: Jaroslaw Wozniak, Andrzej Olszyna, Lucyna Jaworska, Sławomir Cygan, Tomasz Cygan, Mateusz Petrus, Dominika Teklinska, Marek Kostecki
المصدر: Ceramics International. 46:7170-7177
مصطلحات موضوعية: 010302 applied physics, Chemical substance, Materials science, Graphene, Process Chemistry and Technology, Oxide, Spark plasma sintering, 02 engineering and technology, Tribology, 021001 nanoscience & nanotechnology, Microstructure, 01 natural sciences, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, chemistry.chemical_compound, chemistry, law, Powder metallurgy, 0103 physical sciences, Materials Chemistry, Ceramics and Composites, Composite material, 0210 nano-technology, Science, technology and society
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2
المؤلفون: Sławomir Cygan, Andrzej Olszyna, Dominika Teklinska, Tomasz Cygan, Jaroslaw Wozniak, Mateusz Petrus, Lucyna Jaworska, Marek Kostecki
المصدر: Ceramics International. 45:21742-21750
مصطلحات موضوعية: 010302 applied physics, Materials science, Graphene, Process Chemistry and Technology, Composite number, 02 engineering and technology, Tribology, 021001 nanoscience & nanotechnology, Microstructure, 01 natural sciences, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Nanomaterials, chemistry.chemical_compound, Fracture toughness, chemistry, law, 0103 physical sciences, Materials Chemistry, Ceramics and Composites, Cubic zirconia, Composite material, 0210 nano-technology, Carbon nitride
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3
المؤلفون: Ewa Dumiszewska, Piotr Knyps, Piotr Caban, Jaroslaw Gaca, Marek Wojcik, Dominika Teklinska
المصدر: Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2019.
مصطلحات موضوعية: business.industry, Optoelectronics, Algan gan, business
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4
المؤلفون: Dominika Teklinska, Iwona Jozwik, Piotr Knyps
المصدر: Microscopy and Microanalysis. 25:1982-1983
مصطلحات موضوعية: Materials science, Thin layers, Atomic force microscopy, Recrystallization (metallurgy), Composite material, Instrumentation, Electron backscatter diffraction
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المؤلفون: Dominika Teklinska, Maciej Miśnik, A. Michalewicz, Mariusz Sochacki, A. Domanowska, Marcin Turek, Paweł Borowicz, Piotr Konarski, Jerzy Żuk, K. Król, Jan Szmidt
المصدر: Materials Science Forum. :496-499
مصطلحات موضوعية: Thermal oxidation, Materials science, business.industry, Mechanical Engineering, Phosphorus, Inorganic chemistry, chemistry.chemical_element, Substrate (electronics), Condensed Matter Physics, chemistry.chemical_compound, chemistry, Mechanics of Materials, Trap density, MOSFET, Silicon carbide, Optoelectronics, General Materials Science, Oxidation process, business, Conduction band
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6The role of hydrogen in carbon incorporation and surface roughness of MOCVD-grown thin boron nitride
المؤلفون: Piotr Caban, Justyna Grzonka, Malgorzata Mozdzonek, Paweł Piotr Michałowski, Marek Wojcik, Jacek M. Baranowski, Pawel Ciepielewski, Dominika Teklinska, Jaroslaw Gaca
المصدر: Journal of Crystal Growth
مصطلحات موضوعية: 010302 applied physics, Materials science, Analytical chemistry, chemistry.chemical_element, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Inorganic Chemistry, X-ray reflectivity, chemistry.chemical_compound, symbols.namesake, chemistry, Boron nitride, 0103 physical sciences, Materials Chemistry, Sapphire, Surface roughness, symbols, Metalorganic vapour phase epitaxy, 0210 nano-technology, Raman spectroscopy, Boron, Carbon
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7
المؤلفون: Kacper Grodecki, Dominika Teklinska, Andrzej Olszyna, Piotr Caban, Iwona Jozwik-Biala, Wlodek Strupinski
المصدر: Journal of Crystal Growth. 401:542-546
مصطلحات موضوعية: Morphology (linguistics), Materials science, Silicon, Carbonization, chemistry.chemical_element, Nanotechnology, Condensed Matter Physics, Epitaxy, Inorganic Chemistry, chemistry, Materials Chemistry, Surface roughness, Composite material, Layer (electronics), Slightly worse
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المؤلفون: Marcin Pisarek, Dimitri Arvanitis, J. Mierczyk, Katarzyna Racka, Jerzy Krupka, Kinga Kościewicz, Krzysztof Grasza, Ryszard Diduszko, B. Surma, Dominika Teklinska, Rafal Jakiela, I.A. Kowalik, Emil Tymicki
المصدر: Journal of Crystal Growth. 377:88-95
مصطلحات موضوعية: 010302 applied physics, Materials science, Dopant, Doping, Inorganic chemistry, technology, industry, and agriculture, chemistry.chemical_element, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Inorganic Chemistry, Crystal, Atmosphere, Cerium, stomatognathic system, X-ray photoelectron spectroscopy, Chemical engineering, chemistry, 0103 physical sciences, Materials Chemistry, Source material, 0210 nano-technology
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9
المؤلفون: Jerzy Krupka, Emil Tymicki, Ryszard Diduszko, M. Piersa, Katarzyna Racka, Dominika Teklinska, Krzysztof Grasza, P. Skupiński, Rafal Jakiela, Tadeusz Łukasiewicz, Kinga Kościewicz
المصدر: Materials Science Forum. :29-32
مصطلحات موضوعية: Crystallography, Materials science, Chemical engineering, Mechanics of Materials, Mechanical Engineering, Nitrogen doping, General Materials Science, Experimental methods, Condensed Matter Physics
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المؤلفون: Dominika Teklinska, Andrzej Olszyna, Kinga Kościewicz, Grzegorz Kowalski, Wlodek Strupiński, Mateusz Tokarczyk, Krystyna Mazur
المصدر: Materials Science Forum. :95-98
مصطلحات موضوعية: Materials science, Misorientation, business.industry, Mechanical Engineering, Condensed Matter Physics, Epitaxy, law.invention, Reduction (complexity), Crystallography, Mechanics of Materials, law, Etching (microfabrication), Optoelectronics, General Materials Science, Growth rate, Crystallization, business
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11
المؤلفون: Jacek M. Baranowski, Kinga Kosciewicz, Kacper Grodecki, Andrzej Olszyna, Mateusz Tokarczyk, Wlodek Strupinski, Grzegorz Kowalski, Dominika Teklinska
المصدر: Open Physics, Vol 9, Iss 2, Pp 446-453 (2011)
مصطلحات موضوعية: Diffraction, sic, c/si ratio, Materials science, Scanning electron microscope, Graphene, Physics, QC1-999, graphene, Analytical chemistry, General Physics and Astronomy, Substrate (electronics), Epitaxy, cvd, law.invention, symbols.namesake, chemistry.chemical_compound, Optical microscope, chemistry, silicon carbide, law, symbols, Silicon carbide, Raman spectroscopy
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12
المصدر: Micron (Oxford, England : 1993). 80
مصطلحات موضوعية: Nanostructure, Materials science, Scanning electron microscope, Analytical chemistry, General Physics and Astronomy, 02 engineering and technology, Spectrum Analysis, Raman, 01 natural sciences, law.invention, Condensed Matter::Materials Science, symbols.namesake, Structural Biology, law, 0103 physical sciences, Microscopy, General Materials Science, Graphite, 010306 general physics, Spectroscopy, Graphene, Cell Biology, 021001 nanoscience & nanotechnology, Nanostructures, symbols, Microscopy, Electron, Scanning, Sublimation (phase transition), 0210 nano-technology, Raman spectroscopy
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المؤلفون: Michal Borecki, Norbert Kwietniewski, Dominika Teklinska, Mariusz Duk, Andrzej Kociubiński, Mariusz Sochacki
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Materials science, Fabrication, Annealing (metallurgy), business.industry, Doping, Chemical vapor deposition, Epitaxy, chemistry.chemical_compound, chemistry, Silicon carbide, Electronic engineering, Optoelectronics, p–n junction, business, Ohmic contact