المؤلفون: Cabuil, N., Le Gouil, A., Dickson, B., Lagha, A., Aminpur, M., Chaton, C., Royer, J.-C., Doclot, O., Seiler, David G., Diebold, Alain C., McDonald, Robert, Garner, C. Michael, Herr, Dan, Khosla, Rajinder P., Secula, Erik M.

المصدر: AIP Conference Proceedings ; volume 931, page 191-195 ; ISSN 0094-243X

الاتاحة: http://dx.doi.org/10.1063/1.2799368

المؤلفون: Sabadel, J.C., Armand, P., Cachau-Herreillat, D., Baldeck, P., Doclot, O., Ibanez, A., Philippot, E.

المصدر: Journal of Solid State Chemistry ; volume 132, issue 2, page 411-419 ; ISSN 0022-4596

الاتاحة: http://dx.doi.org/10.1006/jssc.1997.7499
https://api.elsevier.com/content/article/PII:S0022459697974995?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0022459697974995?httpAccept=text/plain

المؤلفون: Le Gouil, A., Cabuil, N., Dupeyrat, P., Dickson, B., Kwan, M., Barge, D., Gurer, E., Doclot, O., Royer, J.-C.

المصدر: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; Jul2008, Vol. 26 Issue 4, p805-811, 7p, 2 Black and White Photographs, 2 Diagrams, 3 Charts, 6 Graphs

مصطلحات موضوعية: X-ray photoelectron spectroscopy, LOGIC devices, NITRIDING, PLASMA gases, SEMICONDUCTOR wafers

المؤلفون: FENEYROU, P., DOCLOT, O., BLOCK, D., BALDECK, P.L., ZYSS, J.

المصدر: Journal of Nonlinear Optical Physics & Materials; Oct1996, Vol. 5 Issue 4, p767-774, 8p

المؤلفون: Feneyrou, P., Doclot, O., Block, D., Baldeck, P. L., Delysse, S., Nunzi, J. M.

المصدر: Optics Letters; August 1997, Vol. 22 Issue: 15 p1132-1134, 3p

المؤلفون: Cabuil, N.¹, Le Gouil, A.¹, Doclot, O.¹, Dickson, B.², Lagha, A.³, Aminpur, M.³, Chaton, C.⁴, Royer, J.-C.⁴

المصدر: Solid State Technology. Oct2007, Vol. 50 Issue 10, p48-51. 4p.

مصطلحات موضوعية: *COMPUTER integrated manufacturing systems, *MICROELECTRONICS, SEMICONDUCTOR wafers, SOLID freeform fabrication, SPECTROMETERS, SPECTRUM analysis instruments