المؤلفون: Armen V. Sogoyan, Alexander I. Chumakov, Anastasia V. Ulanova, Anatoly A. Smolin, Andrey V. Yanenko, Dmitry V. Boychenko

المصدر: Безопасность информационных технологий, Vol 31, Iss 4, Pp 153-164 (2024)

مصطلحات موضوعية: test standard, radiation hardness, prior information, probability of failure-free operation, bayesian probability., Information technology, T58.5-58.64, Information theory, Q350-390

وصف الملف: electronic resource

Relation: https://bit.spels.ru/index.php/bit/article/view/1723; https://doaj.org/toc/2074-7128; https://doaj.org/toc/2074-7136

URL الوصول: https://doaj.org/article/6766754768bc49e493ad78240d776fd5

المؤلفون: Alexey S. Artamonov, Dmitry V. Boychenko, Anna S. Kameneva

المصدر: Безопасность информационных технологий, Vol 31, Iss 4, Pp 165-176 (2024)

مصطلحات موضوعية: information systems security, mass thickness, integrated circuit packages, x-ray inspection system, nica nuclotron., Information technology, T58.5-58.64, Information theory, Q350-390

وصف الملف: electronic resource

Relation: https://bit.spels.ru/index.php/bit/article/view/1724; https://doaj.org/toc/2074-7128; https://doaj.org/toc/2074-7136

URL الوصول: https://doaj.org/article/70f4f1bbfbc64bc7a26659a589e76387

المؤلفون: Denis I. Sotskov, Vladislav N. Kotov, Alexey V. Zubakov, Nikolay A. Usachev, Alexander Y. Nikiforov, Dmitry V. Boychenko

المصدر: Безопасность информационных технологий, Vol 31, Iss 2, Pp 142-158 (2024)

مصطلحات موضوعية: design technique, tag, power management unit, cmos, uhf, tagging, radiofrequency identification., Information technology, T58.5-58.64, Information theory, Q350-390

وصف الملف: electronic resource

Relation: https://bit.spels.ru/index.php/bit/article/view/1641; https://doaj.org/toc/2074-7128; https://doaj.org/toc/2074-7136

URL الوصول: https://doaj.org/article/18912203678644f0b84b69c6048fe70a

المؤلفون: Maria O. Kalashnikova, Roman S. Torshin, Georgy S. Sorokoumov, Alexander A. Demidov, Dmitry V. Boychenko

المصدر: Безопасность информационных технологий, Vol 30, Iss 2, Pp 127-141 (2023)

مصطلحات موضوعية: analog-to-digital converter, sigma-delta, histogram method, adc`s static parameters, adc`s dynamic parameters, chip testing, total ionizing dose., Information technology, T58.5-58.64, Information theory, Q350-390

وصف الملف: electronic resource

Relation: https://bit.spels.ru/index.php/bit/article/view/1502; https://doaj.org/toc/2074-7128; https://doaj.org/toc/2074-7136

URL الوصول: https://doaj.org/article/18e510204cff48228b623772b7af6272

المؤلفون: Alexander I. Chumakov, Armen V. Sogoyan, Anatoly A. Smolin, Alexey O. Ahmetov, Dmitry V. Bobrovsky, Dmitry V. Boychenko, Nikolai V. Ryasnoy, Konstantin A. Chumakov, Evgeny V. Churilin, Vladimir F. Gerasimov, Vitaly V. Khaustov, Alexander A. Sashov, Anastasia V. Ulanova, Andrey V. Yanenko

المصدر: Безопасность информационных технологий, Vol 27, Iss 1, Pp 83-97 (2020)

مصطلحات موضوعية: single event effects, hardness assurance levels, test requirements., Information technology, T58.5-58.64, Information theory, Q350-390

وصف الملف: electronic resource

Relation: https://bit.mephi.ru/index.php/bit/article/view/1254; https://doaj.org/toc/2074-7128; https://doaj.org/toc/2074-7136

URL الوصول: https://doaj.org/article/ab333ff0ce35425d9e89c2daade7ec77

المؤلفون: K. M. Amburkin, N. A. Usachev, Nikita M. Zhidkov, Igor O. Metelkin, D. I. Sotskov, Dmitry M. Amburkin, Dmitry V. Boychenko, Alexander G. Kuznetsov, V. V. Elesin, Varvara V. Elesina

المصدر: IEEE Transactions on Nuclear Science. 67:2396-2404

مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, 010308 nuclear & particles physics, business.industry, Heterojunction bipolar transistor, Amplifier, Bipolar junction transistor, Heterojunction, Integrated circuit, 01 natural sciences, Silicon-germanium, Gallium arsenide, law.invention, chemistry.chemical_compound, Nuclear Energy and Engineering, chemistry, law, 0103 physical sciences, Optoelectronics, Radio frequency, Electrical and Electronic Engineering, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e4d5b42db1462e1dff136e9d770ea5a4
https://doi.org/10.1109/tns.2020.3015560

المؤلفون: L.N. Kessarinskiy, F. F. Taiibov, K. A. Koval, A. S. Kameneva, A. O. Shirin, Dmitry V. Boychenko

المصدر: 2021 IEEE 32nd International Conference on Microelectronics (MIEL).

مصطلحات موضوعية: Set (abstract data type), Authentication, Computer science, business.industry, visual_art, Electronic component, Control (management), visual_art.visual_art_medium, Microelectronics, business, Reliability (statistics), Reliability engineering, Counterfeit

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::fdaf9c54e622286cda411e4d8597c9a3
https://doi.org/10.1109/miel52794.2021.9569037

المؤلفون: A. S. Kolosova, Dmitry V. Boychenko, G. G. Davydov, P. S. Gromova, M. V. Muzafarov, Alexander A. Pechenkin

المصدر: 2021 IEEE 32nd International Conference on Microelectronics (MIEL).

مصطلحات موضوعية: Volume (thermodynamics), Range (aeronautics), Thermoelectric effect, Heat exchanger, Control unit, Mechanical engineering, Environmental science, Power semiconductor device, Semiconductor device, Power (physics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::19e8ed53318824c7c5a767d6051e93e9
https://doi.org/10.1109/miel52794.2021.9569044

المؤلفون: Alexander Y. Nikiforov, Maxim S. Gorbunov, Dmitry V. Boychenko, Anatoly A. Smolin, G. G. Davydov

المصدر: 2021 IEEE 32nd International Conference on Microelectronics (MIEL).

مصطلحات موضوعية: Reliability (semiconductor), business.industry, Event (computing), Computer science, Absorbed dose, Microelectronics, Radiation, business, Engineering physics

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::82d23c60f381e911bf1f9621c3dbe498
https://doi.org/10.1109/miel52794.2021.9569095

المؤلفون: G. G. Davydov, Anna S. Kolosova, Mikhail V. Muzafarov, Alexander A. Pechenkin, Dmitry V. Boychenko, Polina S. Gromova, Aleksandra V. Demidova

المصدر: 2021 International Siberian Conference on Control and Communications (SIBCON).

مصطلحات موضوعية: Refrigerant, Microcontroller, Materials science, Power consumption, Nuclear engineering, Minimum distance, Thermoelectric effect, Semiconductor device, Radiation, Term (time)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1493866c67ba598025cf44181af198c3
https://doi.org/10.1109/sibcon50419.2021.9438878

المؤلفون: Vladimir Shuvalov, A. O. Shirin, Dmitry V. Boychenko, L.N. Kessarinskiy, Sevada Arabyan

المصدر: 2021 International Siberian Conference on Control and Communications (SIBCON).

مصطلحات موضوعية: Very-large-scale integration, 010308 nuclear & particles physics, Process (engineering), Computer science, business.industry, Functional testing, 02 engineering and technology, 01 natural sciences, Modularity, 020202 computer hardware & architecture, Automatic test equipment, Reliability (semiconductor), 0103 physical sciences, Scalability, 0202 electrical engineering, electronic engineering, information engineering, business, Computer hardware, Parametric statistics

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6148f9563a1455c2a323434a6f37c588
https://doi.org/10.1109/sibcon50419.2021.9438892

المؤلفون: Dmitry V. Boychenko, R. E. Vaskin, Georgy S. Sorokoumov, V. D. Kalashnikov

المصدر: 2021 International Siberian Conference on Control and Communications (SIBCON).

مصطلحات موضوعية: Spacecraft, 010308 nuclear & particles physics, Serial communication, business.industry, Computer science, Interface (computing), Space radiation, 01 natural sciences, Software, 0103 physical sciences, Electronic engineering, Transceiver, business, Radiation hardening, Communication channel

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::791e63e5036dfd445afa2fbe8d1a7a3b
https://doi.org/10.1109/sibcon50419.2021.9438912

المؤلفون: A.S. Tararaksin, V. N. Vyuginov, Dmitry V. Boychenko, Svetlana-Elektronpribor Jsc, P. S. Gromova, A. S. Kolosova, Specialized Electronic Systems, V. V. Luchinin

المصدر: Electronic Enginering.Semiconductor Devices. 252:30-38

مصطلحات موضوعية: Safe operating area, Materials science, business.industry, Schottky diode, Optoelectronics, business, Charged particle

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2110154c1ffc56b8ede481eef31475d6
https://doi.org/10.36845/2073-8250-2019-252-1-30-38

المؤلفون: Dmitry V. Boychenko, A. N. Egorov, Alexander A. Pechenkin, O. B. Mavritskii, Dmitriy V. Savchenkov

المصدر: Optical Sensing and Detection VI.

مصطلحات موضوعية: Materials science, business.industry, Substrate (electronics), Integrated circuit, Laser, law.invention, Active layer, Wavelength, law, Femtosecond, Microelectronics, Optoelectronics, business, Radiation hardening

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7f6f6a57a0ebc57f34678be041b6fe6d
https://doi.org/10.1117/12.2555772

المؤلفون: A. V. Demidova, A.V. Sogoyan, Dmitry V. Boychenko

المصدر: Russian Microelectronics. 46:162-165

مصطلحات موضوعية: 010302 applied physics, Materials science, Nanotechnology, 02 engineering and technology, Carbon nanotube, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Charged particle, Electronic, Optical and Magnetic Materials, law.invention, Condensed Matter::Materials Science, Molecular dynamics, Nanosensor, law, 0103 physical sciences, Materials Chemistry, Sensitivity (control systems), Electrical and Electronic Engineering, 0210 nano-technology, Nanoscopic scale

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::565ea85cb855d6226d3c1a5767f0792f
https://doi.org/10.1134/s106373971703009x

المؤلفون: G. G. Davydov, P. S. Gromova, V. N. Vyuginov, V. V. Luchinin, A.S. Tararaksin, A. S. Kolosova, Dmitry V. Boychenko

المصدر: 2019 IEEE 31st International Conference on Microelectronics (MIEL).

مصطلحات موضوعية: Materials science, 010308 nuclear & particles physics, business.industry, Schottky diode, 01 natural sciences, Temperature measurement, Power (physics), Safe operating area, chemistry.chemical_compound, chemistry, 0103 physical sciences, Silicon carbide, Optoelectronics, Power semiconductor device, business, Diode, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8425cd0a9ccd853e87328d5b71f9d66b
https://doi.org/10.1109/miel.2019.8889645

المؤلفون: A. Y. Nikiforov, Georgy S. Sorokoumov, D. V. Bobrovsky, Anatoly A. Smolin, Dmitry V. Boychenko, A. O. Akhmetov, A. E. Shemyakov

المصدر: 2019 IEEE 31st International Conference on Microelectronics (MIEL).

مصطلحات موضوعية: 010302 applied physics, Materials science, Proton, Test procedures, Nuclear Theory, Particle accelerator, 02 engineering and technology, 021001 nanoscience & nanotechnology, Proton energy, 01 natural sciences, law.invention, Nuclear physics, Computer Science::Hardware Architecture, law, High energy proton, Single event upset, Ionization, 0103 physical sciences, Physics::Atomic and Molecular Clusters, Physics::Accelerator Physics, Nuclear Experiment, 0210 nano-technology, Beam (structure)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::49fc3867c95f6f50f29395ff74f9206f
https://doi.org/10.1109/miel.2019.8889634

المؤلفون: R. K. Mozhaev, Dmitry V. Boychenko, Maksim E. Cherniak, S. V. Novikov

المصدر: 2019 IEEE 31st International Conference on Microelectronics (MIEL).

مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, X-ray, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Linear particle accelerator, Photodiode, law.invention, law, Absorbed dose, 0103 physical sciences, MOSFET, Optoelectronics, 0210 nano-technology, business, Radiation hardening, Light-emitting diode, Research method

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8dc2bed13d78630308b16ed0b0e5baef
https://doi.org/10.1109/miel.2019.8889615

المؤلفون: Dmitry V. Boychenko, L.N. Kessarinskiy, A. S. Artamonov, A. Y. Nikiforov, G. G. Davydov, I.B. Yashanin

المصدر: Microelectronics Reliability. 64:130-133

مصطلحات موضوعية: 010302 applied physics, Process quality, Engineering, business.industry, System of measurement, 02 engineering and technology, Radiation, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Test (assessment), Reliability engineering, Reliability (semiconductor), CMOS, Absorbed dose, 0103 physical sciences, Electrical and Electronic Engineering, 0210 nano-technology, Safety, Risk, Reliability and Quality, business, Radiation hardening

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::47297c0eac32c825fd58891c56940915
https://doi.org/10.1016/j.microrel.2016.07.082

المؤلفون: Mikhail E. Koroteev, Dmitry V. Zavorotnov, Dmitry V. Boychenko, Alexandra V. Demidova

المصدر: 2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS).

مصطلحات موضوعية: Materials science, law, business.industry, Absorbed dose, Quartz resonator, Optoelectronics, Degradation (geology), Integrated circuit, business, Quartz, Signal, law.invention

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::fe7343ffbc530b9d98b5dcb8a327830a
https://doi.org/10.1109/radecs45761.2018.9328714