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المؤلفون: Wen Liu, Dimitris P. Ioannou, Johnatan Kantarovsky, Byoung Min, Tanya Nigam
المصدر: 2022 IEEE International Reliability Physics Symposium (IRPS).
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المؤلفون: Dimitris P. Ioannou, Uppili S. Raghunathan, Dave Brochu, Adam Divergilio, Vibhor Jain, John J. Pekarik
المصدر: 2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS).
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المؤلفون: Dimitris P. Ioannou
المصدر: Microelectronics Reliability. 54:1489-1499
مصطلحات موضوعية: Materials science, Gate stack, Condensed Matter Physics, Gate voltage, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Threshold voltage, Reliability (semiconductor), CMOS, Electronic engineering, Transient (oscillation), Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, Scaling, High-κ dielectric
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المؤلفون: Steven W. Mittl, Dimitris P. Ioannou, G. La Rosa
المصدر: IEEE Transactions on Device and Materials Reliability. 9:128-134
مصطلحات موضوعية: Materials science, Condensed matter physics, Relaxation (NMR), Analytical chemistry, chemistry.chemical_element, Instability, Electronic, Optical and Magnetic Materials, Threshold voltage, Stress (mechanics), chemistry, MOSFET, SILC, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, Tin, Metal gate
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المؤلفون: X. Chen, Derek H. Leu, D. Lea, T. Kirihata, Faraz Khan, J. B. Johnson, Dan Moy, Sami Rosenblatt, Norman Robson, Subramanian S. Iyer, Dimitris P. Ioannou, G. LaRosa, C. Kothandaraman
المصدر: IRPS
مصطلحات موضوعية: Materials science, business.industry, Transistor, Gate dielectric, Electrical engineering, law.invention, CMOS, law, Logic gate, Computer data storage, Optoelectronics, business, Metal gate, Quantum tunnelling, Hot-carrier injection
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المؤلفون: William F. Landers, C. Kothandaraman, Christopher N. Collins, Steven W. Mittl, G. La Rosa, Mukta G. Farooq, F. Chen, Prakash Periasamy, Subramanian S. Iyer, Dimitris P. Ioannou, Jinping Liu, Daniel Berger, John M. Safran, Jennifer A. Oakley, Ghosh Somnath, Carole D. Graas, Troy L. Graves-Abe
المصدر: IRPS
مصطلحات موضوعية: Back end of line, Reliability (semiconductor), Materials science, Through-silicon via, Electronic engineering, Silicon on insulator, Temperature cycling, Front end of line, Electromigration, Hot-carrier injection
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المؤلفون: Dimitris P. Ioannou, Dimitris E. Ioannou
المصدر: Solid-State Electronics. 48:1947-1951
مصطلحات موضوعية: Engineering, Hardware_MEMORYSTRUCTURES, business.industry, Circuit design, Silicon on insulator, Hardware_PERFORMANCEANDRELIABILITY, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Single event upset, Beta (plasma physics), Hardware_INTEGRATEDCIRCUITS, Materials Chemistry, Electronic engineering, Static random-access memory, Electrical and Electronic Engineering, business, Radiation hardening, Hardware_LOGICDESIGN, Hardening (computing), Electronic circuit
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المؤلفون: Giuseppe La Rosa, Dimitris P. Ioannou
المصدر: 2014 IEEE International Reliability Physics Symposium.
مصطلحات موضوعية: Stress (mechanics), Materials science, Reliability (semiconductor), Silicon, chemistry, Modulation, Gate oxide, Ultimate tensile strength, MOSFET, Electronic engineering, chemistry.chemical_element, Composite material, Threshold voltage
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المؤلفون: Yaocheng Liu, Jaeger Daniel, Timothy J. McArdle, Kai Zhao, Paul D. Agnello, J. Cai, Claude Ortolland, Gregory G. Freeman, Geng Wang, Paul Chang, C. DeWan, Vijay Narayanan, V. Varadarajan, Dimitris P. Ioannou, P. Oldiges, Shreesh Narasimha, Robert R. Robison, Anthony I. Chou
المصدر: 2013 IEEE International Electron Devices Meeting.
مصطلحات موضوعية: Modeling and simulation, business.industry, Semiconductor materials, MOSFET, Electronic engineering, Electrical engineering, Process (computing), Short-channel effect, business, Performance enhancement, Dual (category theory), Communication channel
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المؤلفون: Michael V. Aquilino, Jaeger Daniel, J. Koshy, E. Engbrecht, Edward P. Maciejewski, L. Zhuang, Mahender Kumar, G. Costrini, J. Gill, Paul D. Agnello, Rajeev Malik, Jin Cai, Gregory G. Freeman, S. Lucarini, N. Arnold, Geng Wang, David M. Fried, Matthew W. Stoker, R. Bolam, Dimitris P. Ioannou, Katsunori Onishi, Paul C. Parries, Richard Wise, Alvin G. Thomas, Min Dai, Viorel Ontalus, Jessica Dechene, Shreesh Narasimha, Robert R. Robison, Judson R. Holt, Dechao Guo, Paul Chang, Naftali E. Lustig, Michael P. Chudzik, Basanth Jagannathan, Paul S. McLaughlin, Bernard A. Engel, Xiaolin Li, Amit Kumar, W. Kong, Rishikesh Krishnan, Barry P. Linder, J. Norum, C. DeWan, Claude Ortolland, Karen A. Nummy, Michael A. Gribelyuk, Jae Gon Lee, Christopher D. Sheraw, G. Han, C-H. Lin, Benjamin Cipriany, Takashi Ando, N. Habib, J. Johnson
المصدر: 2012 International Electron Devices Meeting.
مصطلحات موضوعية: Hardware_MEMORYSTRUCTURES, Materials science, Memory hierarchy, business.industry, Copper interconnect, Electrical engineering, Silicon on insulator, Hardware_PERFORMANCEANDRELIABILITY, PMOS logic, CMOS, MOSFET, Hardware_INTEGRATEDCIRCUITS, business, Dram, NMOS logic, Hardware_LOGICDESIGN
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المؤلفون: Nilufa Rahim, Stew Rauch, Yanfeng Wang, Fen Chen, J. Greg Massey, Joe Lukaitis, Michael J. Hauser, Ernest Y. Wu, Paul A. Hyde, Steve Mittl, Sudesh Saroop, Ann Swift, Dimitris P. Ioannou
المصدر: 2012 IEEE International Reliability Physics Symposium (IRPS).
مصطلحات موضوعية: Materials science, business.industry, Gate dielectric, Electrical engineering, Silicon on insulator, Time-dependent gate oxide breakdown, Hardware_PERFORMANCEANDRELIABILITY, Hardware_GENERAL, Logic gate, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, business, Metal gate, Gate equivalent, AND gate, Hardware_LOGICDESIGN, High-κ dielectric
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المؤلفون: James H. Stathis, Michael P. Chudzik, Barry Linder, Dimitris P. Ioannou, Vijay Narayanan, Kisik Choi, Siddarth A. Krishnan, Eduard A. Cartier, Takashi Ando, Kai Zhao, Unoh Kwon, Andreas Kerber
المصدر: 2012 IEEE International Reliability Physics Symposium (IRPS).
مصطلحات موضوعية: Materials science, Negative-bias temperature instability, business.industry, Transistor, Electrical engineering, Hardware_PERFORMANCEANDRELIABILITY, law.invention, CMOS, law, Logic gate, MOSFET, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, Metal gate, business, AND gate, High-κ dielectric
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المؤلفون: Dimitris P. Ioannou, Steve Mittl, Dave Brochu
المصدر: 2012 IEEE International Reliability Physics Symposium (IRPS).
مصطلحات موضوعية: Materials science, CMOS, business.industry, Burn-in, Electronic engineering, Optoelectronics, Silicon on insulator, Ring oscillator, business, Metal gate, Temperature measurement, Voltage, High-κ dielectric
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المؤلفون: Ernest Y. Wu, Charles LaRow, Dimitris P. Ioannou
المصدر: 2011 International Electron Devices Meeting.
مصطلحات موضوعية: Stress (mechanics), Materials science, business.industry, Electrical engineering, Optoelectronics, Waveform, Charge (physics), Field-effect transistor, SILC, Trapping, business, Voltage
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المؤلفون: James H. Stathis, Andreas Kerber, R. Divakaruni, Yue Hu, Hemanth Jagannathan, Dae-Gyu Park, Siddarth A. Krishnan, Richard Carter, Deleep R. Nair, Yun-Yu Wang, Ricardo A. Donaton, William K. Henson, Shahab Siddiqui, Ernest Y. Wu, Murshed M. Chowdhury, Kathy Barla, Huiming Bu, Mukesh Khare, Rohit Pal, J.-P. Han, Matthew W. Stoker, S. Saroop, Sufi Zafar, Michael P. Chudzik, Eduard A. Cartier, X. Chen, Jin Cai, Vamsi Paruchuri, Eric C. Harley, Myung-Hee Na, Dimitris P. Ioannou, Ryosuke Iijima, Min Dai, Kevin McStay, Takashi Ando, Joseph F. Shepard, J. Schaeffer, J-H Lee, Naim Moumen, P. Montanini, Lisa F. Edge, Paul D. Agnello, Shreesh Narasimha, Srikanth Samavedam, Dechao Guo, Unoh Kwon, Dominic J. Schepis, Yue Liang, Martin Ostermayr, S. Inumiya, Thomas A. Wallner, B. Greene, H. Yamasaki, D.P. Prakash, Jaeger Daniel, Stephen W. Bedell, M. Hargrove, Michael A. Gribelyuk, Gauri Karve, Y. Lee, Vijay Narayanan, S. Uchimura, Martin M. Frank
المصدر: 2011 International Electron Devices Meeting.
مصطلحات موضوعية: Materials science, Silicon, business.industry, Electrical engineering, chemistry.chemical_element, Hardware_PERFORMANCEANDRELIABILITY, Threshold voltage, chemistry, CMOS, Hardware_GENERAL, Low-power electronics, MOSFET, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, Wafer, business, Metal gate, Hardware_LOGICDESIGN, High-κ dielectric
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المؤلفون: Kai Zhao, D. Badami, Eduard A. Cartier, Rahul M. Rao, R. Bolam, K. Das, Dimitris P. Ioannou, Aditya Bansal, Barry Linder, John M. Aitken, J. Greg Massey, Steven W. Mittl, G. La Rosa, Jae-Joon Kim, Michael J. Hauser, James H. Stathis
المصدر: 2011 International Reliability Physics Symposium.
مصطلحات موضوعية: Stress (mechanics), Reliability (semiconductor), Materials science, CMOS, Duty cycle, Logic gate, Electronic engineering, Inverter, Ring oscillator, Metal gate
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المؤلفون: D. Harmon, Wagdi W. Abadeer, Dimitris P. Ioannou
المصدر: 2009 IEEE International Reliability Physics Symposium.
مصطلحات موضوعية: Reliability (semiconductor), Materials science, RF switch, Negative-bias temperature instability, CMOS, business.industry, Logic gate, MOSFET, Electrical engineering, Silicon on insulator, Breakdown voltage, Optoelectronics, business
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المؤلفون: Giuseppe Larosa, Steve Mittl, Dimitris P. Ioannou
المصدر: 2008 IEEE International Integrated Reliability Workshop Final Report.
مصطلحات موضوعية: Materials science, Negative-bias temperature instability, business.industry, Transistor, Electrical engineering, High voltage, Engineering physics, law.invention, Threshold voltage, law, MOSFET, business, Metal gate, Voltage, High-κ dielectric
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المصدر: 2003 IEEE International Conference on SOI.
مصطلحات موضوعية: AND-OR-Invert, Pass transistor logic, Computer science, Logic gate, Logic family, Electronic engineering, NAND gate, XOR gate, Resistor–transistor logic, Hardware_LOGICDESIGN, NOR gate
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المؤلفون: Souvick Mitra, Akram Salman, Dimitris P. Ioannou, Dimitris E. Ioannou
المصدر: 2002 IEEE International SOI Conference.
مصطلحات موضوعية: Engineering, business.industry, Low-power electronics, Logic gate, MOSFET, Hardware_INTEGRATEDCIRCUITS, Electrical engineering, Silicon on insulator, Cmos logic circuits, Node (circuits), business, Threshold voltage