المؤلفون: André Bernard, Dietmar Bertsch, Stefan Lüthi, Martina Brülisauer, Ulrich Stärker, Emine Çağin, Peter Heeb, Klaus Dietrich

المصدر: SPIE Proceedings.

مصطلحات موضوعية: Signal-to-noise ratio, Materials science, Optics, Optical path, business.industry, Optical transfer function, Detector, Microscopy, Calibration, Field of view, business, Signal

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::152d186a72e01280b4b59d65a86ae468
https://doi.org/10.1117/12.2270316

المؤلفون: Martina Brülisauer, Klaus Dietrich, Dietmar Bertsch, Emine Çağin, Stefan Lüthi, André Bernard, Ulrich Stärker, Peter Heeb

المصدر: SPIE Proceedings.

مصطلحات موضوعية: Microscope, Materials science, business.industry, Fluorescence, law.invention, Optics, law, Quantum dot, Microscopy, Fluorescence microscope, Optoelectronics, Wafer, Thin film, business, Microfabrication

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5187bb5390adc040378c0fd96d97de84
https://doi.org/10.1117/12.2265776

المؤلفون: Marc-A. Nicolet, Matthias Meier, Valerio Romano, Nico Onda, Dietmar Bertsch, Alex Dommann, Marco Etter, Martin Gutsche

المصدر: Microelectronic Engineering. 83:2234-2237

مصطلحات موضوعية: Materials science, business.industry, Nanosecond, Condensed Matter Physics, Laser, Atomic and Molecular Physics, and Optics, Laser trimming, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Amorphous solid, Microsecond, Optics, law, Femtosecond, Electrical and Electronic Engineering, Thin film, business, Ultrashort pulse

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8f1b57b5a7b4a8c4d659f27452a139bf
https://doi.org/10.1016/j.mee.2006.10.010