المؤلفون: Shylashree N, Satish Tunga, Shaik Mahammad Ameer Afridi, Sridhar V

المصدر: e-Prime: Advances in Electrical Engineering, Electronics and Energy, Vol 8, Iss , Pp 100538- (2024)

مصطلحات موضوعية: Design for testability, Clock control, Test data register, Launch on capture, Launch on shift, Dynamic power, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: http://www.sciencedirect.com/science/article/pii/S2772671124001207; https://doaj.org/toc/2772-6711

URL الوصول: https://doaj.org/article/3c2410bbe02f4647bc2e9ccdf242a469

المؤلفون: Weizheng Wang, Xingxing Gong, Shuo Cai, Jiamin Liu, Xiangqi Wang

المصدر: IEEE Access, Vol 12, Pp 182561-182570 (2024)

مصطلحات موضوعية: Cryptographic chips, design for testability, scan obfuscation, scan-based side-channel attacks, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/10767141/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/acb0893b3cce46718ebd5cd7ee50c0a4

المؤلفون: Irith Pomeranz

المصدر: IEEE Access, Vol 12, Pp 98130-98140 (2024)

مصطلحات موضوعية: Design-for-testability (DFT), functional test sequence, test compaction, test generation, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/10599460/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/9acada5798b94638b3a0e31e009b00bc

المؤلفون: Tiancheng Wu, Weikang Fan, Yuefeng Gu, Feifan Fan, Qiuhong Li

المصدر: IEEE Access, Vol 12, Pp 109218-109229 (2024)

مصطلحات موضوعية: Design for testability, fault simulator, march algorithm, memory testing, three-cell coupling fault, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/10623655/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/1971d49db973401aa1c4509fef23aa51

المؤلفون: Suzano, Juan, Chastand, Antoine, Valea, Emanuele, Di Natale, Giorgio, Philippe, Anthony, Abouzeid, Fady, Roche, Philippe

المساهمون: STMicroelectronics Crolles (ST-CROLLES), Architectures and Methods for Resilient Systems (TIMA-AMfoRS), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP), Université Grenoble Alpes (UGA)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP), Université Grenoble Alpes (UGA), Laboratoire Systèmes-sur-puce et Technologies Avancées (LSTA), Université Grenoble Alpes (UGA)-Département Systèmes et Circuits Intégrés Numériques (DSCIN (CEA, LIST)), Laboratoire d'Intégration des Systèmes et des Technologies (LIST (CEA)), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Laboratoire d'Intégration des Systèmes et des Technologies (LIST (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Laboratoire Fonctions Innovantes pour circuits Mixtes (LFIM), IEEE

المصدر: 2024 IEEE European Test Symposium
IEEE European Test Symposium
https://hal.science/hal-04613326
IEEE European Test Symposium, May 2024, La Haye, Netherlands
https://ets24.ewi.tudelft.nl/

مصطلحات موضوعية: 3DIC, Chiplets, Design for Testability (DFT), Hardware Security, Root of Trust, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

جغرافية الموضوع: La Haye, Netherlands

الاتاحة: https://hal.science/hal-04613326
https://hal.science/hal-04613326v1/document
https://hal.science/hal-04613326v1/file/camera%20ready.pdf

المؤلفون: Alnatheer, Suleman, Ahmed, Mohammed Altaf

المساهمون: Prince Sattam bin Abdulaziz University, Al-Kharj, Saudi Arabia

المصدر: Indonesian Journal of Electrical Engineering and Computer Science; Vol 35, No 1: July 2024; 90-101 ; 2502-4760 ; 2502-4752 ; 10.11591/ijeecs.v35.i1

مصطلحات موضوعية: Electronics, VLSI, Design for testability, Memory test, BIST, ADKNN, BIST and BISR, Built-in redundancy analysis, Memory under test, NBOA, System-on-chips

وصف الملف: application/pdf

Relation: https://ijeecs.iaescore.com/index.php/IJEECS/article/view/36435/18393; https://ijeecs.iaescore.com/index.php/IJEECS/article/view/36435

الاتاحة: https://ijeecs.iaescore.com/index.php/IJEECS/article/view/36435
https://doi.org/10.11591/ijeecs.v35.i1.pp90-101

المؤلفون: Annavarapu Praneeth, Govardhani Immadi, V. S. V. Prabhakar, Venkata Narayana Madhava Reddy

المصدر: Engineering, Technology & Applied Science Research, Vol 14, Iss 3 (2024)

مصطلحات موضوعية: USB, JTAG, scan chains, logic vision, Design-for-Testability (DFT), Logic Built-In Self-Test (LBIST), Engineering (General). Civil engineering (General), TA1-2040, Technology (General), T1-995, Information technology, T58.5-58.64

Relation: https://etasr.com/index.php/ETASR/article/view/7163; https://doaj.org/toc/2241-4487; https://doaj.org/toc/1792-8036; https://doaj.org/article/f3fa369be970464586b099605b11ee36

الاتاحة: https://doi.org/10.48084/etasr.7163
https://doaj.org/article/f3fa369be970464586b099605b11ee36

المؤلفون: Ayub, Rabia, El Bakouri, O., Smith, J. R., Jorner, K., Ottosson, H.

المصدر: Journal of Physical Chemistry A. 125(2):570-584

مصطلحات موضوعية: Aromatic compounds, Design for testability, Ground state, Organic pollutants, Electron molecules, Electronic ground state, Expanded porphyrins, Macrocyclic compounds, Magnetic indices, Neutral macrocycles, Single-point energy, Steric congestion, Aromatization

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:ri:diva-57300
https://doi.org/10.1021/acs.jpca.0c08926

المؤلفون: Hendrik P. Nel, Fortunato Carlos Dualibe, Tinus Stander

المصدر: IEEE Open Journal of Circuits and Systems, Vol 4, Pp 70-84 (2023)

مصطلحات موضوعية: Built-in self-test, circuit simulation, CMOS, design for testability, LNA, microwave integrated circuits, Electric apparatus and materials. Electric circuits. Electric networks, TK452-454.4

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/10002329/; https://doaj.org/toc/2644-1225

URL الوصول: https://doaj.org/article/fc9c8e8e603c40a692be84e985220816

المؤلفون: Mirabella, Nunzio, Floridia, Andrea, Cantoro, Riccardo, Grosso, Michelangelo, Sonza Reorda, Matteo

المساهمون: Mirabella, Nunzio, Floridia, Andrea, Cantoro, Riccardo, Grosso, Michelangelo, Sonza Reorda, Matteo

مصطلحات موضوعية: ATPG, cell-aware, path delay, testing, design for testability, defect testing

وصف الملف: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/isbn/979-8-3503-4419-6; ispartofbook:2023 26th Euromicro Conference on Digital System Design (DSD); 26th Euromicro Conference Series on Digital System Design (DSD); firstpage:214; lastpage:219; numberofpages:6; https://hdl.handle.net/11583/2982736; https://ieeexplore.ieee.org/document/10456873

الاتاحة: https://hdl.handle.net/11583/2982736
https://doi.org/10.1109/DSD60849.2023.00039
https://ieeexplore.ieee.org/document/10456873

المؤلفون: Nel, Hendrik P., Dualibe, Fortunato, Stander, Tinus

المساهمون: Electronics and Microelectronics, Numediart

المصدر: IEEE Open Journal of Circuits and Systems, 4, 70-84 (2023-03-02)

مصطلحات موضوعية: Built-in self-test, circuit simulation, CMOS, design for testability, LNA, microwave integrated circuits, oscillation-based testing, PVT, Engineering, computing & technology, Electrical & electronics engineering, Ingénierie, informatique & technologie, Ingénierie électrique & électronique

Relation: http://xplorestaging.ieee.org/ielx7/8784029/10019301/10002329.pdf?arnumber=10002329; urn:issn:2644-1225; https://orbi.umons.ac.be/handle/20.500.12907/47391; info:hdl:20.500.12907/47391; https://orbi.umons.ac.be/bitstream/20.500.12907/47391/1/Influence_of_PVT_Variation_and_Threshold_Selection_on_OBT_and_OBIST_Fault_Detection_in_RFCMOS_Amplifiers.pdf

الاتاحة: https://orbi.umons.ac.be/handle/20.500.12907/47391
https://hdl.handle.net/20.500.12907/47391
https://orbi.umons.ac.be/bitstream/20.500.12907/47391/1/Influence_of_PVT_Variation_and_Threshold_Selection_on_OBT_and_OBIST_Fault_Detection_in_RFCMOS_Amplifiers.pdf
https://doi.org/10.1109/ojcas.2022.3232638

المؤلفون: Shaik Mahammad Ameer Afridi, Nagaraja Shylashree, Satish Tunga

المصدر: An effective way to generate the shift timing constraints and sanity checks, 30(3), 1399-1406, (2023-06-01)

مصطلحات موضوعية: Design for testability, Primetime, Sanity checks, Scan, Static timing analysis, Synopsys design constraints

Relation: https://doi.org/10.5281/zenodo.8008724; https://doi.org/10.5281/zenodo.8008725; oai:zenodo.org:8008725

الاتاحة: https://doi.org/10.5281/zenodo.8008725

المؤلفون: Madhura Rame Gowda, Jamuna

المصدر: Fault simulation for design for testability inserted designs, 29(2), 658-668, (2023-02-01)

مصطلحات موضوعية: ATPG, Design for Testability, Fault coverage, Fault list, Register-transfer level, Stuck at faults

Relation: oai:zenodo.org:7707121

الاتاحة: https://doi.org/10.11591/ijeecs.v29.i2.pp658-668

المؤلفون: Treger, Marvin, Hannebauer, Adrian, Behrens, Peter, Schneider, Andreas M.

المصدر: Physical Chemistry Chemical Physics 25 (2023), Nr. 22 ; Physical Chemistry Chemical Physics

مصطلحات موضوعية: Chemical stability, Density functional theory, Design for testability, Electronic structure, Energy gap, Organometallics, Refractive index, Benzenedicarboxylate, Density-functional-theory, Electronic and optical properties, Electronic structure and optical properties, High refractive, Hybrid density functional theory, Metalorganic frameworks (MOFs), Modular designs, Optical applications, Tailored materials, Halogenation, ddc:540

Relation: ESSN:1463-9084; http://dx.doi.org/10.15488/17513; https://www.repo.uni-hannover.de/handle/123456789/17643

الاتاحة: https://www.repo.uni-hannover.de/handle/123456789/17643
https://doi.org/10.15488/17513

المؤلفون: Treger, Marvin, König, Carolin, Behrens, Peter, Schneider, Andreas M.

المصدر: Physical Chemistry Chemical Physics 25 (2023), Nr. 28 ; Physical Chemistry Chemical Physics

مصطلحات موضوعية: Density functional theory, Design for testability, Hybrid materials, Metal ions, Organometallics, Building units, Fine tuning, Hybrid inorganic-organic, Inorganic-organic materials, Inorganics, Metalorganic frameworks (MOFs), Modulars, Novel materials, Optical applications, Theoretical study, Refractive index, ddc:540

Relation: ESSN:1463-9084; http://dx.doi.org/10.15488/17317; https://www.repo.uni-hannover.de/handle/123456789/17445

الاتاحة: https://www.repo.uni-hannover.de/handle/123456789/17445
https://doi.org/10.15488/17317

المؤلفون: Treger, Marvin, Hannebauer, Adrian, Schaate, Andreas, Budde, Jan L., Behrens, Peter, Schneider, Andreas M.

المصدر: Physical chemistry, chemical physics : PCCP 25 (2023), Nr. 8 ; Physical chemistry, chemical physics : PCCP

مصطلحات موضوعية: Density functional theory, Design for testability, Electronic structure, Metal-Organic Frameworks, Organic polymers, ddc:540

Relation: ESSN:1463-9084; http://dx.doi.org/10.15488/13702; https://www.repo.uni-hannover.de/handle/123456789/13812

الاتاحة: https://www.repo.uni-hannover.de/handle/123456789/13812
https://doi.org/10.15488/13702

المؤلفون: Mahammad Ameer Afridi, Shaik, Shylashree, Nagaraja, Tunga, Satish, Bavikatte Nanjundappa, Latha

المساهمون: Not Applicable

المصدر: Indonesian Journal of Electrical Engineering and Computer Science; Vol 30, No 3: June 2023; 1399-1406 ; 2502-4760 ; 2502-4752 ; 10.11591/ijeecs.v30.i3

مصطلحات موضوعية: Design for testability, Primetime, Sanity checks, Scan, Static timing analysis, Synopsys design constraints

وصف الملف: application/pdf

Relation: https://ijeecs.iaescore.com/index.php/IJEECS/article/view/29285/17327; https://ijeecs.iaescore.com/index.php/IJEECS/article/view/29285

الاتاحة: https://ijeecs.iaescore.com/index.php/IJEECS/article/view/29285
https://doi.org/10.11591/ijeecs.v30.i3.pp1399-1406

المؤلفون: Mohamed H. El-Mahlawy, Winston Waller

المصدر: Journal of Electrical and Electronics Engineering, Vol 14, Iss 2, Pp 31-42 (2021)

مصطلحات موضوعية: segmentations of digital circuits, partitioning of digital circuits, design for testability of digital vlsi circuits, pseudo-exhaustive testing, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: http://electroinf.uoradea.ro/images/articles/CERCETARE/Reviste/JEEE/JEEE_V14_N2_OCT_2021/5%20JEEE%20Mohamed%20H.%20El-Mahlawy.pdf; https://doaj.org/toc/1844-6035; https://doaj.org/toc/2067-2128

URL الوصول: https://doaj.org/article/a389cbefe1034a38b338c292b48c4fc1

المؤلفون: Mirabella, Nunzio, Floridia, Andrea, Cantoro, Riccardo, Grosso, Michelangelo, Sonza Reorda, Matteo

المساهمون: Mirabella, Nunzio, Floridia, Andrea, Cantoro, Riccardo, Grosso, Michelangelo, Sonza Reorda, Matteo

مصطلحات موضوعية: ATPG, cell-aware, testing, design for testability, defect testing

وصف الملف: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000913346300146; ispartofbook:Titolo volume non avvalorato; 29th IEEE International Conference on Electronics Circuits and Systems (ICECS); firstpage:1; lastpage:4; numberofpages:4; http://hdl.handle.net/11583/2971532; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85145352450; https://ieeexplore.ieee.org/document/9971003

الاتاحة: http://hdl.handle.net/11583/2971532
https://doi.org/10.1109/ICECS202256217.2022.9971003
https://ieeexplore.ieee.org/document/9971003

المؤلفون: Mouna Karmani, Noura Benhadjyoussef, Belgacem Hamdi, Mohsen Machhout

المصدر: IET Computers & Digital Techniques, Vol 15, Iss 2, Pp 160-170 (2021)

مصطلحات موضوعية: computer crime, cryptography, design for testability, embedded systems, integrated circuit design, Computer engineering. Computer hardware, TK7885-7895, Electronic computers. Computer science, QA75.5-76.95

وصف الملف: electronic resource

Relation: https://doaj.org/toc/1751-8601; https://doaj.org/toc/1751-861X

URL الوصول: https://doaj.org/article/e9c0b29999d4443c910c93ff8d82f7ef