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    Academic Journal

    مصطلحات موضوعية: Amorphous carbon, Particle accelerators, SEY, XPS, Raman spectroscopy

    وصف الملف: application/pdf

    Relation: info:eu-repo/grantAgreement/FCT/3599-PPCDT/CERN%2FFIS-TEC%2F0039%2F2019/PT; info:eu-repo/grantAgreement/FCT/6817 - DCRRNI ID/UIDB%2F00068%2F2020/PT; info:eu-repo/grantAgreement/FCT/6817 - DCRRNI ID/UIDP%2F00068%2F2020/PT; info:eu-repo/grantAgreement/FCT/6817 - DCRRNI ID/UIDB%2F04565%2F2020/PT; info:eu-repo/grantAgreement/FCT/6817 - DCRRNI ID/UIDP%2F04565%2F2020/PT; LA/P/0140/2020; IST-ID/131/2018; https://www.mdpi.com/1422-0067/24/16/12999; Bundaleski, N.; Adame, C.F.; Alves, E.; Barradas, N.P.; Cerqueira, M.F.; Deuermeier, J.; Delaup, Y.; Ferraria, A.M.; Ferreira, I.M.M.; Neupert, H.; et al. The Role of Hydrogen Incorporation into Amorphous Carbon Films in the Change of the Secondary Electron Yield. Int. J. Mol. Sci. 2023, 24, 12999. https://doi.org/10.3390/ijms241612999; https://hdl.handle.net/1822/87238; 12999

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