المؤلفون: Ouyang, X., Deeter, T., Berglund, C.N., Pease, R.F.W., McCord, M.A.

المصدر: ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095) ; page 25-31

الاتاحة: http://dx.doi.org/10.1109/icmts.2000.844400
http://xplorestaging.ieee.org/ielx5/6807/18268/00844400.pdf?arnumber=844400

المؤلفون: Blasch, I.M., Knauber, S., Deeter, T.

المصدر: Proceedings of the IEEE 1997 National Aerospace and Electronics Conference. NAECON 1997 ; volume 1, page 94-99

الاتاحة: http://dx.doi.org/10.1109/naecon.1997.617766
http://xplorestaging.ieee.org/ielx3/4871/13445/00617766.pdf?arnumber=617766

المؤلفون: Deeter, T. E., Schneider, D. L.

Relation: https://doi.org/10.1109/naecon.1995.522003; oai:zenodo.org:1276927

الاتاحة: https://doi.org/10.1109/naecon.1995.522003

المؤلفون: Ouyang, X., Deeter, T., Berglund, C.N., Pease, R.F.W., McCord, M.A.

المصدر: ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095); 2000, p25-31, 7p

المؤلفون: Dao, G., Tam, N., Hainsey, R., Qian, Q. D., Neff, J., Nasre-Esfahani, B., Deeter, T., Fujimoto, H., Troccolo, P.

المصدر: Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; 1994, Vol. 12 Issue 6, p3804-3808, 5p

المؤلفون: Blasch, I.M., Knauber, S., Deeter, T.

المصدر: Proceedings of the IEEE 1997 National Aerospace & Electronics Conference NAECON 1997; 1997, Issue 1, p94-94, 1p