المؤلفون: Soltani, A., Talbi, A., Mortet, V., BenMoussa, A., Zhang, W. J., Gerbedoen, J-C, De Jaeger, J-C, Gokarna, A., Haenen, K., Wagner, P.

مصطلحات موضوعية: Physics, Applied, Condensed Matter, diamond, cBN, AlN, sputtering, CVD, doping, photodetector, RF resonator, actuator, sensor

وصف الملف: application/pdf

Relation: AIP Conference Proceedings; Ferro, G.; Siffert, P. (Ed.). 2010 WIDE BANDGAP CUBIC SEMICONDUCTORS: FROM GROWTH TO DEVICES, p. 191-196; http://hdl.handle.net/1942/16978; 196; 191; 1292; 000286950900046

الاتاحة: http://hdl.handle.net/1942/16978

المؤلفون: Soubercaze-Pun, Geoffroy, Tartarin, Jean-Guy, Bary, Laurent, Rayssac, Jacques, Morvan, E, Grimbert, B, De Jaeger, J-C, Graffeuil, Jacques

المساهمون: Université Toulouse III - Paul Sabatier (UT3), Université Fédérale Toulouse Midi-Pyrénées, Équipe Microondes et Opto-microondes pour Systèmes de Télécommunications (LAAS-MOST), Laboratoire d'analyse et d'architecture des systèmes (LAAS), Université Toulouse - Jean Jaurès (UT2J)-Université Toulouse 1 Capitole (UT1), Université Fédérale Toulouse Midi-Pyrénées-Université Fédérale Toulouse Midi-Pyrénées-Centre National de la Recherche Scientifique (CNRS)-Université Toulouse III - Paul Sabatier (UT3), Université Fédérale Toulouse Midi-Pyrénées-Institut National des Sciences Appliquées - Toulouse (INSA Toulouse), Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université Fédérale Toulouse Midi-Pyrénées-Université Toulouse - Jean Jaurès (UT2J)-Université Toulouse 1 Capitole (UT1), Service Instrumentation Conception Caractérisation (LAAS-I2C), Thales Research and Technologies Orsay (TRT), THALES, Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)

المصدر: IMS 2006 ; https://hal.archives-ouvertes.fr/hal-01343917 ; IMS 2006, Jun 2006, San Francisco, United States. 4p, ⟨10.1109/MWSYM.2006.249760⟩

مصطلحات موضوعية: AlGaN /GaN HEMT large-signal modeling, Low Frequency Noise, Low phase noise oscillator, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

جغرافية الموضوع: San Francisco, United States

Relation: hal-01343917; https://hal.archives-ouvertes.fr/hal-01343917; https://hal.archives-ouvertes.fr/hal-01343917/document; https://hal.archives-ouvertes.fr/hal-01343917/file/IMS_2006_SanFrancisco.pdf

الاتاحة: https://hal.archives-ouvertes.fr/hal-01343917
https://hal.archives-ouvertes.fr/hal-01343917/document
https://hal.archives-ouvertes.fr/hal-01343917/file/IMS_2006_SanFrancisco.pdf
https://doi.org/10.1109/MWSYM.2006.249760

المؤلفون: Barkad, H A, Soltani, A, Mattalah, M, Gerbedoen, J-C, Rousseau, M, De Jaeger, J-C, BenMoussa, A, Mortet, V, Haenen, K, Benbakhti, B, DEEE, 4, Building, Rankine, Oakfield Avenue, Moreau, M, Dupuis, R, Ougazzaden, A

المساهمون: Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF), Royal Observatory of Belgium Brussels (ROB), Institute for Materials Research, IMEC vzw, Division IMOMEC, University of Glasgow, Georgia Tech Lorraine Metz, Université de Franche-Comté (UFC), Université Bourgogne Franche-Comté COMUE (UBFC)-Université Bourgogne Franche-Comté COMUE (UBFC)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Georgia Institute of Technology Atlanta -CentraleSupélec-Ecole Nationale Supérieure des Arts et Metiers Metz-Centre National de la Recherche Scientifique (CNRS)

المصدر: ISSN: 0022-3727 ; EISSN: 1361-6463.

مصطلحات موضوعية: Simulation, Photodiodes, AlN, deep UV

Relation: hal-00569746; https://hal.archives-ouvertes.fr/hal-00569746; https://hal.archives-ouvertes.fr/hal-00569746/document; https://hal.archives-ouvertes.fr/hal-00569746/file/PEER_stage2_10.1088%252F0022-3727%252F43%252F46%252F465104.pdf

الاتاحة: https://hal.archives-ouvertes.fr/hal-00569746
https://hal.archives-ouvertes.fr/hal-00569746/document
https://hal.archives-ouvertes.fr/hal-00569746/file/PEER_stage2_10.1088%252F0022-3727%252F43%252F46%252F465104.pdf
https://doi.org/10.1088/0022-3727/43/46/465104

المؤلفون: BenMoussa, A., Soltani, A., Schuehle, U., HAENEN, Ken, Chong, Y. M., Zhang, W. J., Dahal, R., Lin, J. Y., Jiang, H. X., Barkad, H.A., Benmoussa, Boumédiène, Bolsee, D., Hermans, C., Kroth, U., Laubis, C., MORTET, Vincent, De Jaeger, J. C., Giordanengo, B., Richter, M., Scholze, F., Hochedez, J. F.

مصطلحات موضوعية: UV photodetector, MSM, WBGM, Solarblind

وصف الملف: application/pdf

Relation: DIAMOND AND RELATED MATERIALS, 18(5-8). p. 860-864; http://hdl.handle.net/1942/9768; 864; 5-8; 860; 18; 000267737000039

الاتاحة: http://hdl.handle.net/1942/9768
https://doi.org/10.1016/j.diamond.2008.11.013

المؤلفون: Mortet, V., Soltani, A., Talbi, A., Pobedinskas, P., Haenen, K., De Jaeger, J-C., Pernod, P., Wagner, P.

المصدر: Procedia Chemistry ; volume 1, issue 1, page 40-43 ; ISSN 1876-6196

الاتاحة: http://dx.doi.org/10.1016/j.proche.2009.07.010
https://api.elsevier.com/content/article/PII:S1876619609000114?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S1876619609000114?httpAccept=text/plain

المؤلفون: Soltani, A., Barkad, H. A., Mattalah, M., Benbakhti, B., De Jaeger, J.-C., Chong, Y. M., Zou, Y. S., Zhang, W. J., Lee, S. T., BenMoussa, A., Giordanengo, B., Hochedez, J.-F.

المصدر: Applied Physics Letters ; volume 92, issue 5 ; ISSN 0003-6951 1077-3118

الاتاحة: https://doi.org/10.1063/1.2840178
https://pubs.aip.org/aip/apl/article-pdf/doi/10.1063/1.2840178/14661834/053501_1_online.pdf

المؤلفون: Rousseau, M., De Jaeger, J. C.

المصدر: VLSI Design ; volume 13, issue 1-4, page 323-328 ; ISSN 1065-514X 1563-5171

الاتاحة: http://dx.doi.org/10.1155/2001/69472
http://downloads.hindawi.com/archive/2001/069472.pdf
https://onlinelibrary.wiley.com/doi/pdf/10.1155/2001/69472

المؤلفون: Pace, L., Defrance, N., Videt, A., Idir, N., De Jaeger, J.-C., Avramovic, V.

المصدر: IEEE Transactions on Electron Devices ; volume 66, issue 6, page 2583-2588 ; ISSN 0018-9383 1557-9646

الاتاحة: http://dx.doi.org/10.1109/ted.2019.2909152
http://xplorestaging.ieee.org/ielx7/16/8715696/08686261.pdf?arnumber=8686261

المؤلفون: Chicot, G., Fiori, A., Volpe, P. N., Tran Thi, T. N., Gerbedoen, J. C., Bousquet, J., Alegre, M. P., Piñero, J. C., Araújo, D., Jomard, F., Soltani, A., De Jaeger, J. C., Morse, J., Härtwig, J., Tranchant, N., Mer-Calfati, C., Arnault, J. C., Delahaye, J., Grenet, T., Eon, D.

المصدر: Journal of Applied Physics; 2014, Vol. 116 Issue 8, p083702-1-083702-13, 13p, 1 Black and White Photograph, 2 Diagrams, 4 Charts, 10 Graphs

مصطلحات موضوعية: NANOMETROLOGY, DOPING agents (Chemistry), DIAMOND mining, METAL inclusions, ELLIPSOMETRY

المؤلفون: Soltani, A., Stolz, A., Charrier, J., Mattalah, M., Gerbedoen, J.-C., Barkad, H. A., Mortet, V., Rousseau, M., Bourzgui, N., BenMoussa, A., De Jaeger, J.-C.

المصدر: Journal of Applied Physics; 2014, Vol. 115 Issue 16, p163515-1-163515-6, 6p, 1 Diagram, 2 Charts, 7 Graphs

مصطلحات موضوعية: DISPERSION relations, EPITAXIAL layers, INFRARED radiation, X-ray diffraction, ATOMIC force microscopy, ALUMINUM nitride films, THIN films

المؤلفون: Cutivet, A., Altuntas, P., Defrance, N., Okada, E., Avramovic, V., Lesecq, M., Hoel, V., De Jaeger, J.-C., Boone, F., Maher, H.

المصدر: 2015 10th European Microwave Integrated Circuits Conference (EuMIC) ; page 93-96

الاتاحة: http://dx.doi.org/10.1109/eumic.2015.7345076
http://xplorestaging.ieee.org/ielx7/7331896/7345038/07345076.pdf?arnumber=7345076

المؤلفون: MENEGHESSO, GAUDENZIO, ZANONI, ENRICO, ONGARO C, BRYLINSKI C, DI FORTE POISSON M. A, HOEL V, DE JAEGER J. C, LANGER R, LAHRECHE H, BOVE P, THORPE J.

المساهمون: Meneghesso, Gaudenzio, Ongaro, C, Zanoni, Enrico, Brylinski, C, DI FORTE POISSON M., A, Hoel, V, DE JAEGER J., C, Langer, R, Lahreche, H, Bove, P, Thorpe, J.

مصطلحات موضوعية: Gallium Nitride, HEMT, Composite Substrate, reliability, degradation

وصف الملف: STAMPA

Relation: info:eu-repo/semantics/altIdentifier/isbn/9781424415076; info:eu-repo/semantics/altIdentifier/wos/WOS:000259347800090; IEDM07, Tech. Digest, IEEE International Electron Device Meeting; firstpage:401; lastpage:404; numberofpages:4; http://hdl.handle.net/11577/1780194; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-50249142981

الاتاحة: http://hdl.handle.net/11577/1780194
https://doi.org/10.1109/IEDM.2007.4418957

المؤلفون: Lakhdhar, H., Labat, N., Curutchet, A., Defrance, N., Lesecq, M., De Jaeger, J.-C., Malbert, N.

المساهمون: LABEX, CNRS

المصدر: Microelectronics Reliability ; volume 64, page 594-598 ; ISSN 0026-2714

الاتاحة: http://dx.doi.org/10.1016/j.microrel.2016.07.026
https://api.elsevier.com/content/article/PII:S0026271416301706?httpAccept=text/plain
https://api.elsevier.com/content/article/PII:S0026271416301706?httpAccept=text/xml

المؤلفون: Soltani, A., Talbi, A., Gerbedoen, J-C, De Jaeger, J-C, Pernod, P., Mortet, V., Bassam, A.

المصدر: 2014 IEEE International Ultrasonics Symposium ; page 2047-2050

الاتاحة: http://dx.doi.org/10.1109/ultsym.2014.0510
http://xplorestaging.ieee.org/ielx7/6917616/6931723/06932298.pdf?arnumber=6932298

المؤلفون: Altuntas, P., Defrance, N., Lesecq, M., Agboton, A., Ouhachi, R., Okada, E., Gaquiere, C., De Jaeger, J.-C., Frayssinet, E., Cordier, Y.

المصدر: 2014 9th European Microwave Integrated Circuit Conference ; page 88-91

الاتاحة: http://dx.doi.org/10.1109/eumic.2014.6997798
http://xplorestaging.ieee.org/ielx7/6971860/6997761/06997798.pdf?arnumber=6997798

المؤلفون: Agboton, A., DeFrance, N., Altuntas, P., Avramovic, V., Cutivet, A., Ouhachi, R., De Jaeger, J. C., Bouzid-Driad, S., Maher, H., Renvoise, M., Frijlink, P.

المصدر: 2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC) ; page 57-60

الاتاحة: http://dx.doi.org/10.1109/essderc.2013.6818818
http://xplorestaging.ieee.org/ielx7/6811819/6818804/06818818.pdf?arnumber=6818818

المؤلفون: Ostermaier, C., Pozzovivo, G., Carlin, J.-F., Basnar, B., Schrenk, W., Andrews, A. M., Douvry, Y., Gaquiere, C., De Jaeger, J.-C., Tóth, L., Pecz, B., Gonschorek, M., Feltin, E., Grandjean, N., Strasser, G., Pogany, D., Kuzmik, J., Ihm, Jisoon, Cheong, Hyeonsik

المصدر: AIP Conference Proceedings ; page 905-906 ; ISSN 0094-243X

الاتاحة: http://dx.doi.org/10.1063/1.3666669

المؤلفون: Malbert, N., Labat, N., Curutchet, A., Sury, C., Hoel, V., de Jaeger, J.-C., Defrance, N., Douvry, Y., Dua, C., Oualli, M., Piazza, M., Bru-Chevallier, C., Bluet, J.-M., Chikhaoui, W.

المصدر: 2010 IEEE International Reliability Physics Symposium ; page 139-145

الاتاحة: http://dx.doi.org/10.1109/irps.2010.5488839
http://xplorestaging.ieee.org/ielx5/5482567/5488659/05488839.pdf?arnumber=5488839

المؤلفون: Kuzmik, J., Ostermaier, Pozzovivo, G., Basnar, B., Schrenk, W., Carlin, J.-F., Gonschorek, M., Feltin, E., Grandjean, N., Douvry, Y., Gaquiere, Ch., De Jaeger, J.-C., Strasser, G., Pogany, D., Gornik, E.

المصدر: The Eighth International Conference on Advanced Semiconductor Devices and Microsystems ; page 163-166

الاتاحة: http://dx.doi.org/10.1109/asdam.2010.5666325
http://xplorestaging.ieee.org/ielx5/5653062/5666309/05666325.pdf?arnumber=5666325

المؤلفون: Mortet, V, Soltani, A, Talbi, A, Pobedinskas, P, Haenen, K, De Jaeger, J-C, Pernod, P, Wagner, Patrick Hermann

مصطلحات موضوعية: Nanocrystalline diamand NCD, Piezoelectric A1N, MEMS resonators

وصف الملف: 374209 bytes; application/pdf

Relation: PROCEEDINGS OF THE EUROSENSORS XXIII CONFERENCE vol:1 issue:1 pages:40-43; 23rd Eurosensors Conference location:Lausanne: SWITZERLAND date:SEP 06-09, 2009; https://lirias.kuleuven.be/handle/123456789/484962; https://lirias.kuleuven.be/bitstream/123456789/484962/1//Mortet+-+Procedia+Chemistry+-+2009.pdf

الاتاحة: https://lirias.kuleuven.be/handle/123456789/484962
https://lirias.kuleuven.be/bitstream/123456789/484962/1//Mortet+-+Procedia+Chemistry+-+2009.pdf