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1
المؤلفون: Paolo Rech, Davide Sabena, Luca Sterpone, Luigi Carro
المصدر: IEEE Transactions on Nuclear Science. 61:3123-3129
مصطلحات موضوعية: Nuclear and High Energy Physics, Single-Event Effects, CPU cache, Computer science, Computation, Reliability (computer networking), GPGPU, Fast Fourier transform, Parallel algorithm, Parallel computing, Supercomputer, Domain (software engineering), Nuclear Energy and Engineering, radiation testing, Electrical and Electronic Engineering, General-purpose computing on graphics processing units
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2
المؤلفون: Luca Sterpone, Matteo Sonza Reorda, Davide Sabena, Luigi Carro, Paolo Rech
المصدر: Microelectronics Reliability. 54:2621-2628
مصطلحات موضوعية: Computer science, null frames, GPGPU, Context (language use), Parallel computing, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Computer graphics, Shared memory, cache, SEU, radiation testing, Overhead (computing), Out-of-core algorithm, Cache, Electrical and Electronic Engineering, General-purpose computing on graphics processing units, Graphics, Safety, Risk, Reliability and Quality, Algorithm
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3
المؤلفون: Davide Sabena, Matteo Sonza Reorda, Luca Sterpone
المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 22:813-823
مصطلحات موضوعية: Signal processing, software-based self-test, business.industry, Computer science, Clock rate, Test compression, VLIW, Test Program Generation, Software, Hardware and Architecture, Very long instruction word, Embedded system, Fault coverage, Electrical and Electronic Engineering, business, Parametric statistics
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4
المؤلفون: Davide Sabena, Matteo Sonza Reorda, Luca Sterpone
المساهمون: Politecnico di Torino = Polytechnic of Turin (Polito), Alex Orailoglu, H. Fatih Ugurdag, Luís Miguel Silveira, Martin Margala, Ricardo Reis, TC 10, WG 10.5
المصدر: IFIP Advances in Information and Communication Technology ISBN: 9783319237985
VLSI-SoC (Selected Papers)
IFIP Advances in Information and Communication Technology
21th IFIP/IEEE International Conference on Very Large Scale Integration-System on a Chip (VLSI-SoC)
21th IFIP/IEEE International Conference on Very Large Scale Integration-System on a Chip (VLSI-SoC), Oct 2013, Istanbul, Turkey. pp.208-226, ⟨10.1007/978-3-319-23799-2_10⟩مصطلحات موضوعية: 021103 operations research, Exploit, business.industry, Computer science, 0211 other engineering and technologies, Reconfigurability, Fault tolerance, 02 engineering and technology, Partition (database), Fault detection and isolation, 020202 computer hardware & architecture, Software, Very long instruction word, Partition-based diagnosis, Embedded system, Spare part, VLIW processor, 0202 electrical engineering, electronic engineering, information engineering, Software-based diagnosis, [INFO]Computer Science [cs], business
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5
المؤلفون: Davide Sabena, Mauricio de Carvalho, Paolo Rech, Luca Sterpone, Luigi Carro, Matteo Sonza Reorda
المصدر: IOLTS
مصطلحات موضوعية: Fault Injection, reliable GPGPU applications, robust algorithms, transient faults, Computer science, business.industry, media_common.quotation_subject, Reliability (computer networking), Fault injection, computer.software_genre, Software, Debugging, General purpose, Embedded system, General-purpose computing on graphics processing units, business, computer, media_common, Debugger
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6
المؤلفون: Heinrich Theodor Vierhaus, Tobias Koal, Davide Sabena, C. Stender, Mario Scholzel, Stephan Wong, Mario Porrmann, Jens Hagemeyer, Luca Sterpone, Robert Glein, Florian Rittner
المصدر: ETS
مصطلحات موضوعية: Engineering, business.industry, Fault tolerance, reconfigurable systems, Reconfigurable computing, VLIW processor, vliw processor, Computer architecture, Very long instruction word, Robustness (computer science), Redundancy (engineering), Static random-access memory, business, Field-programmable gate array, Test data
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7
المؤلفون: Davide Sabena, Luca Sterpone, M. Sonza Reorda
المصدر: VLSI-SoC
مصطلحات موضوعية: software-based self-test, Exploit, Computer science, business.industry, Control reconfiguration, VLIW processors, Instruction set, fault simulation, software-based fault diagnosis, Software, Computer architecture, Very long instruction word, Software fault tolerance, Spare part, Embedded system, Parallelism (grammar), business
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8
المؤلفون: Mario Porrmann, Luca Sterpone, Jens Hagemeyer, Jorgen Ilstad, Anees Ullah, Davide Sabena
المصدر: AHS
مصطلحات موضوعية: field programmable gate array, Computer science, DRPM system, Testing, Xilinx Virtex-4 FPGA, Hardware_PERFORMANCEANDRELIABILITY, dynamically reconfigurable processing module architecture, space application, avionic application, dynamic neutron testing, aerospace computing, Hardware, Radiation hardening (electronics), Neutron, Static random-access memory, Hardware_ARITHMETICANDLOGICSTRUCTURES, Architecture, static random access memory, Field-programmable gate array, SRAM-based FPGA, Routing, Neutrons, Xilinx Virtex-5 FPGA, business.industry, Circuit faults, Field programmable gate arrays, Fault injection, Neutron radiation, Avionics, Reconfigurable computing, fault injection campaign, SRAM-based FPGAs, Embedded system, heavy-ions radiation experiment, SRAM chips, Neutron Radiation Testing, business, Single Event Upsets
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9
المؤلفون: Paolo Rech, Luigi Carro, Luca Sterpone, Davide Sabena, M. Sonza Reorda
المصدر: IDT
Politecnico di Torino-IRISمصطلحات موضوعية: Exploit, business.industry, Computer science, GPGPU, Parallel computing, soft errors, Computer graphics, radiation testing, redundancy techniques, Radiation testing, Software, General purpose, Redundancy (engineering), General-purpose computing on graphics processing units, business, Error detection and correction
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10
المؤلفون: Davide Sabena, Luca Sterpone, M. Sonza Reorda
المصدر: VLSI-SoC
مصطلحات موضوعية: SBST, Exploit, Computer science, business.industry, VLIW, Test Program Generation, Parallel computing, Test (assessment), Software, Very long instruction word, Fault coverage, Parallelism (grammar), business, Self test, Parametric statistics
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11
المؤلفون: Davide Sabena, Luca Sterpone, Matteo Sonza Reorda
المصدر: PDP
مصطلحات موضوعية: Router, Emulation, business.industry, Computer science, Fault tolerance, Hardware_PERFORMANCEANDRELIABILITY, Network interface, Fault injection, Fault (power engineering), Network on a chip, Embedded system, Hardware_INTEGRATEDCIRCUITS, business, Testability
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12
المؤلفون: Davide Sabena, M. Sonza Reorda, Luca Sterpone
المصدر: DFT
مصطلحات موضوعية: Very-large-scale integration, Decision support system, SBST, business.industry, Computer science, Fault tolerance, Parallel computing, ComputerSystemsOrganization_PROCESSORARCHITECTURES, Fault (power engineering), Instruction set, Software, Development (topology), Very long instruction word, Embedded system, VLIW, business, fault simulation
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13
المؤلفون: Davide Sabena, Luca Sterpone, M. Sonza Reorda, S. Campagna
المصدر: DDECS
مصطلحات موضوعية: Engineering, business.industry, Very long instruction word, Reliability (computer networking), Embedded system, SIGNAL (programming language), Clock rate, Benchmark (computing), Transient (computer programming), Fault injection, business, Field-programmable gate array
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14
المؤلفون: Davide Sabena, M. Sonza Reorda, Luca Sterpone
المصدر: Politecnico di Torino-IRIS
VLSI-SoCمصطلحات موضوعية: Triple modular redundancy, business.industry, Computer science, Clock rate, Fault tolerance, hardening technique, Software, Soft error, cross domain error, Very long instruction word, Embedded system, Fault coverage, VLIW processor, Benchmark (computing), business