المؤلفون: Jean-Philippe Noel, Reda Boumchedda, Edith Beigne, Pablo Royer, David Turgis, Christopher Mounet, Ivan Miro-Panades, Bastien Giraud, Jean-Frederic Christmann, A. Makosiej, Lorenzo Ciampolini

المصدر: IEEE Solid-State Circuits Letters. 1:186-189

مصطلحات موضوعية: business.industry, Computer science, Interfacing, Asynchronous communication, Virtual ground, Ranging, Central processing unit, Static random-access memory, Electrical and Electronic Engineering, business, Computer hardware, Sleep mode, Efficient energy use

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::df10f8cb416c28110088f299351b0ccc
https://doi.org/10.1109/lssc.2019.2899971

المؤلفون: Ciampolini, Lorenzo, Meignen, Sylvain, Menut, Olivier, David, Turgis

المساهمون: STMicroelectronics Crolles (ST-CROLLES), Modélisation Géométrique & Multirésolution pour l'Image (MGMI), Laboratoire Jean Kuntzmann (LJK), Université Pierre Mendès France - Grenoble 2 (UPMF)-Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Pierre Mendès France - Grenoble 2 (UPMF)-Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)

المصدر: https://hal.science/hal-01016804 ; 2014.

مصطلحات موضوعية: [MATH.MATH-SP]Mathematics [math]/Spectral Theory [math.SP]

الاتاحة: https://hal.science/hal-01016804
https://hal.science/hal-01016804v1/document
https://hal.science/hal-01016804v1/file/solving_9.pdf

المؤلفون: Anuj Grover, David Turgis, Ivan Miro-Panades, Shamsi Azmi, Bastien Giraud, Guillaume Moritz, G. S. Visweswaran, Chittoor Parthasarathy, Jean-Philippe Noel, Mohammad Daud, Promod Kumar, Edith Beigne, Philippe Flatresse

المصدر: IEEE Transactions on Circuits and Systems I: Regular Papers. 64:2438-2447

مصطلحات موضوعية: Computer science, 020208 electrical & electronic engineering, 02 engineering and technology, Capacitance, Process corners, 020202 computer hardware & architecture, CMOS, Memory cell, Logic gate, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Static random-access memory, Electrical and Electronic Engineering, Low voltage, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::caa40297e2b2f3bfcc75650e2d397f13
https://doi.org/10.1109/tcsi.2017.2705116

المؤلفون: Jean-Philippe Noel, David Turgis, E. Esmanhotto, Marco Rios, R. Boumchedda, Edith Beigne, A. Makosiej, Emilien Bourde-Cice, Bastien Giraud, Mathis Bellet

المصدر: NANOARCH

مصطلحات موضوعية: Hardware_MEMORYSTRUCTURES, Computer science, business.industry, 020208 electrical & electronic engineering, Transistor, Electrical engineering, 02 engineering and technology, Energy consumption, 020202 computer hardware & architecture, law.invention, law, Logic gate, 0202 electrical engineering, electronic engineering, information engineering, Static random-access memory, business, Low voltage, Access time, Efficient energy use, Electronic circuit

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1229f2490b66a757c6a2eeaa132cbc77
https://doi.org/10.1145/3232195.3232210

المؤلفون: David Turgis, E. Esmanhotto, Jean-Philippe Noel, Bastien Giraud, Emilien Bourde-Cice, Reda Boumchedda, Mathis Bellet, Marco Rios, Edith Beigne, Adam Makosiej

المصدر: EasyChair Preprints.

مصطلحات موضوعية: Computer science, business.industry, Electrical engineering, Static random-access memory, business, Low voltage, Efficient energy use

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::771e35968129cbce85ac59ac7a6e5ec2
https://doi.org/10.29007/nc31

المؤلفون: Fady Abouzeid, Jean-Christophe Lafont, Sebastien Haendler, David Turgis, Anis Feki, Bruno Allard, Faress Tissafi Drissi

المساهمون: ESC de Sfax, Ampère, Département Energie Electrique (EE), Ampère (AMPERE), École Centrale de Lyon (ECL), Université de Lyon-Université de Lyon-Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-Institut National des Sciences Appliquées de Lyon (INSA Lyon), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Institut National de Recherche pour l’Agriculture, l’Alimentation et l’Environnement (INRAE)-École Centrale de Lyon (ECL), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Institut National de Recherche pour l’Agriculture, l’Alimentation et l’Environnement (INRAE), STMicroelectronics

المصدر: Solid-State Electronics
Solid-State Electronics, Elsevier, 2015, 106, pp.1-11. ⟨10.1016/j.sse.2014.11.018⟩

مصطلحات موضوعية: Computer science, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Sub threshold Design, 01 natural sciences, Hardware_GENERAL, Robustness (computer science), 0103 physical sciences, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Materials Chemistry, Electronic engineering, Static random-access memory, Electrical and Electronic Engineering, Operating voltage, Leakage (electronics), 010302 applied physics, Bit cell, [SPI.NRJ]Engineering Sciences [physics]/Electric power, 020208 electrical & electronic engineering, Half selected bit cells, SRAM, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, CMOS, Sub threshold, XY selection, Leakage, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::dee3287a8ea67d52f6d79283062b1050
https://doi.org/10.1016/j.sse.2014.11.018

المؤلفون: Kaya Can Akyel, Bastien Giraud, Reda Boumchedda, M. Brocard, Edith Beigne, Jean-Philippe Noel, David Turgis

المساهمون: STMicroelectronics [Crolles] (ST-CROLLES), Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)

المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE, 2017, 25 (8), pp.2296-2306. ⟨10.1109/TVLSI.2017.2688862⟩
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2017, 25 (8), pp.2296-2306. ⟨10.1109/TVLSI.2017.2688862⟩

مصطلحات موضوعية: 010302 applied physics, Engineering, Random access memory, Hardware_MEMORYSTRUCTURES, business.industry, Transistor, Silicon on insulator, High density, 02 engineering and technology, Hardware_PERFORMANCEANDRELIABILITY, 01 natural sciences, Memory array, 020202 computer hardware & architecture, law.invention, [SPI]Engineering Sciences [physics], Hardware and Architecture, law, 0103 physical sciences, MOSFET, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Static random-access memory, Electrical and Electronic Engineering, business, Software

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e8f8b5e9601d4d994015e4ccf7c1e997
https://hal-cea.archives-ouvertes.fr/cea-02193602

المؤلفون: Jean-Christophe Lafont, Faress Tissafi Drissi, Lorenzo Ciampolini, Xavier Jonsson, David Turgis, Jean-Paul Morin, Joseph Nguyen, Cyril Descleves

المصدر: ICCAD

مصطلحات موضوعية: Mathematical optimization, Speedup, Computer science, Monte Carlo method, Extrapolation, 02 engineering and technology, 01 natural sciences, Confidence interval, 020202 computer hardware & architecture, 010104 statistics & probability, Convex optimization, 0202 electrical engineering, electronic engineering, information engineering, Variance reduction, Static random-access memory, 0101 mathematics, Algorithm, Importance sampling, Quantile

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0336f1646ae77982cbaa886cd2d2ea96
https://doi.org/10.1145/2966986.2967031

المؤلفون: Kaya Can Akyel, M. Brocard, R. Boumchedda, G. Berhault, O. Billoint, Bastien Giraud, Sebastien Thuries, Edith Beigne, David Turgis, J.-P. Noel

المصدر: 2016 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S).

مصطلحات موضوعية: Engineering, Random access memory, Hardware_MEMORYSTRUCTURES, business.industry, 020208 electrical & electronic engineering, Spice, Transistor, High density, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, 020202 computer hardware & architecture, law.invention, Robustness (computer science), law, Embedded system, Logic gate, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Static random-access memory, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2118bf62b461a7ec7b1d48603301b37e
https://doi.org/10.1109/s3s.2016.7804376

المؤلفون: F. Giner, D. Noblet, F. Terrier, S. Ibars, Florian Cacho, Sebastien Haendler, Damien Croain, P. Mergault, Nicolas Planes, Franck Arnaud, Christophe Lecocq, M. Parra, Olivier Weber, Alexandre Villaret, David Turgis, R. Ranica, C. Julien, S. Naudet, Lorenzo Ciampolini, V. Huard, M. Quoirin

المصدر: VLSI Circuits

مصطلحات موضوعية: Computer science, business.industry, Electrical engineering, Electronic engineering, 02 engineering and technology, Static random-access memory, Process variability, 021001 nanoscience & nanotechnology, 0210 nano-technology, business, Low voltage, Leakage (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::bb0eaa26c069f69df3e827ba7f77ce46
https://doi.org/10.1109/vlsic.2016.7573512

المؤلفون: Olivier Callen, Daniel Noblet, Amit Chhabra, Siddharth Gupta, Shamsi Azmi, Pierre Malinge, Lorenzo Ciampolini, Dibya Dipti, Sebastien Haendler, Nicolas Planes, Christophe Lecocq, Shishir Kumar, David Turgis

المصدر: Journal of Low Power Electronics. 8:106-112

مصطلحات موضوعية: Computer science, business.industry, Electrical engineering, Node (circuits), Static random-access memory, Electrical and Electronic Engineering, Operating voltage, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::35d0a21742e2c4a344548f0b5b6f6c8d
https://doi.org/10.1166/jolpe.2012.1176

المؤلفون: Georges Gielen, Robert Puers, Riccardo Carta, Jef Thoné, David Turgis, Soheil Radiom

المصدر: Sensors and Actuators A: Physical. 156:43-48

مصطلحات موضوعية: Engineering, Frequency-shift keying, SIMPLE (military communications protocol), business.industry, Transmitter, Metals and Alloys, Electrical engineering, Topology (electrical circuits), FSK modulation, Condensed Matter Physics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Power (physics), law.invention, Transmission (telecommunications), Near-field antenna, Capsule endoscopy, law, High data rate telemetry, Wireless, Electrical and Electronic Engineering, business, Instrumentation

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a73c5ad74f9484d6d9b850de3c7fbad6
https://doi.org/10.1016/j.sna.2008.11.027

المؤلفون: Bastien Giraud, Chittoor Parthasarathy, Mohammad Daud, Guillaume Moritz, G. S. Visweswaran, Anuj Grover, David Turgis, Jean-Philippe Noel, Promod Kumar

المصدر: ICICDT

مصطلحات موضوعية: Coupling, Engineering, Hardware_MEMORYSTRUCTURES, Sense amplifier, business.industry, Hardware_PERFORMANCEANDRELIABILITY, Capacitance, Power (physics), Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Static random-access memory, Frequency scaling, business, Standby power, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::21ad3674244ed9abb0b40bc4e2f26c01
https://doi.org/10.1109/icicdt.2015.7165876

المؤلفون: David Turgis, Robert Puers

المصدر: Sensors and Actuators A: Physical. :129-136

مصطلحات موضوعية: Engineering, business.industry, Bandwidth (signal processing), Metals and Alloys, Condensed Matter Physics, Chip, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Radio transmission, Capsule endoscopy, law, Electronic engineering, Wireless, Electrical and Electronic Engineering, Image sensor, business, Instrumentation, Computer hardware, Data transmission, Image compression

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::fcdb86eca7b5bd06f48b90a765cc8a96
https://doi.org/10.1016/j.sna.2005.05.016

المؤلفون: Kaya Can Akyel, David Turgis, Lorenzo Ciampolini, Gerard Ghibaudo, Olivier Thomas

المساهمون: STMicroelectronics [Crolles] (ST-CROLLES), Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut National Polytechnique de Grenoble (INPG)-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS), Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Institut National Polytechnique de Grenoble (INPG)-Centre National de la Recherche Scientifique (CNRS)

المصدر: 2014 S3S Proceedings
2014 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)
2014 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Oct 2014, Millbrae, United States. pp.7a.3, ⟨10.1109/S3S.2014.7028222⟩

مصطلحات موضوعية: Coupling, Engineering, Hardware_MEMORYSTRUCTURES, business.industry, Electrical engineering, Silicon on insulator, Hardware_PERFORMANCEANDRELIABILITY, Signal, Noise (electronics), Buried oxide, Electronic engineering, Hardware_INTEGRATEDCIRCUITS, Static random-access memory, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, business, Front (military), Hardware_LOGICDESIGN

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e8a96524dd13660ff4deacf7d92794b7
https://hal.univ-grenoble-alpes.fr/hal-02049387

المؤلفون: Olivier P. Thomas, Kaya Can Akyel, Lorenzo Ciampolini, David Turgis, Gerard Ghibaudo

المساهمون: Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut National Polytechnique de Grenoble (INPG)-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS), STMicroelectronics [Crolles] (ST-CROLLES), Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Ed. by Bez, Pavan, Meneghesso

المصدر: 2014 ESSDERC Proceedings
2014 ESSDERC-44th European Solid-State Device Research Conference
2014 ESSDERC-44th European Solid-State Device Research Conference, Sep 2014, Venice, Italy. pp.94-97, ⟨10.1109/ESSDERC.2014.6948766⟩
ESSDERC

مصطلحات موضوعية: Engineering, Silicon, business.industry, Transistor, Electrical engineering, chemistry.chemical_element, Silicon on insulator, High density, Hardware_PERFORMANCEANDRELIABILITY, RTS, SRAM, Signal, Noise (electronics), law.invention, chemistry, law, Electronic engineering, Hardware_INTEGRATEDCIRCUITS, Random Telegraph Signal, FD-SOI, Static random-access memory, Process variability, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9068f5488dbb553172c0a145351ce59b
https://hal.archives-ouvertes.fr/hal-02048975

المؤلفون: Fabien Clermidy, Thomas Benoist, Robin Wilson, Bastien Giraud, Alexandre Valentian, Bertrand Pelloux-Prayer, Olivier P. Thomas, Sylvain Clerc, Julien Le Coz, Ivan Miro Panades, Jean-Philippe Noel, Christian Bernard, David Turgis, O. Billoint, Fady Abouzeid, Anuj Grover, Edith Beigne, Philippe Flatresse, Philippe Magarshack, Yvain Thonnart, Philippe Roche, Sebastien Bernard

المصدر: ISSCC

مصطلحات موضوعية: Signal processing, Computer science, Very long instruction word, business.industry, Datapath, Clock rate, Register file, Electronic engineering, Serial port, business, Digital signal processing

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::47adc5f80affc374a7ec69088eef9ea9
https://doi.org/10.1109/isscc.2014.6757509

المؤلفون: Anis Feki, Bruno Allard, Jean Christophe Lafont, David Turgis

المساهمون: ESC de Sfax, Ampère, Département Energie Electrique (EE), Ampère (AMPERE), École Centrale de Lyon (ECL), Université de Lyon-Université de Lyon-Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-Institut National des Sciences Appliquées de Lyon (INSA Lyon), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Institut National de Recherche pour l’Agriculture, l’Alimentation et l’Environnement (INRAE)-École Centrale de Lyon (ECL), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Institut National de Recherche pour l’Agriculture, l’Alimentation et l’Environnement (INRAE), STMicroelectronics

المصدر: Proceedings of the 2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference
S3S
S3S, Oct 2013, Monterey, Canada. ⟨10.1109/S3S.2013.6716525⟩

مصطلحات موضوعية: Engineering, 020209 energy, Differential amplifier, Unbalanced sense amplifier, 02 engineering and technology, Offset, Low-power electronics, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Hardware_INTEGRATEDCIRCUITS, Sub-threshold Design, Static random-access memory, Bit cell, Delay, business.industry, Sense amplifier, Amplifier, [SPI.NRJ]Engineering Sciences [physics]/Electric power, Electrical engineering, Differential sensing, ULV Bit-cell, 021001 nanoscience & nanotechnology, Chip, SRAM, FDSOI, 0210 nano-technology, business, Access time

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::366a382e6bdd4b0a5a57ad3167787550
https://hal.archives-ouvertes.fr/hal-01865466

المؤلفون: Jean-Philippe Noel, Guillaume Moritz, David Turgis, Bastien Giraud, Anuj Grover

المصدر: ICICDT

مصطلحات موضوعية: Engineering, Sense amplifier, business.industry, Amplifier, Electrical engineering, Silicon on insulator, Hardware_PERFORMANCEANDRELIABILITY, Integrated circuit design, Power (physics), Hardware_INTEGRATEDCIRCUITS, Electronic engineering, System on a chip, Frequency scaling, business, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::cadef977dbea0f1695738fcf18ffea26
https://doi.org/10.1109/icicdt.2013.6563301

المؤلفون: David Turgis, Anis Feki, Bruno Allard, Lorenzo Ciampolini, Jean-Christophe Lafont

المساهمون: ESC de Sfax, Ampère, Département Energie Electrique (EE), Ampère (AMPERE), École Centrale de Lyon (ECL), Université de Lyon-Université de Lyon-Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-Institut National des Sciences Appliquées de Lyon (INSA Lyon), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Institut National de Recherche pour l’Agriculture, l’Alimentation et l’Environnement (INRAE)-École Centrale de Lyon (ECL), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Institut National de Recherche pour l’Agriculture, l’Alimentation et l’Environnement (INRAE), STMicroelectronics

المصدر: Proc. of the 2012 International SoC Design Conference
ISOCC
ISOCC, Nov 2012, Jeju Island, South Korea. ⟨10.1109/ISOCC.2012.6406898⟩

مصطلحات موضوعية: Engineering, Hardware_MEMORYSTRUCTURES, business.industry, 020208 electrical & electronic engineering, [SPI.NRJ]Engineering Sciences [physics]/Electric power, Low leakage, 02 engineering and technology, SRAM, Bitcell, Sub threshold Design, 020202 computer hardware & architecture, half selected bitcells, CMOS, Low-power electronics, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Sub threshold, System on a chip, Static random-access memory, business, Leakage, Leakage (electronics), Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bf16840c882c80c6876a33b60a1a969f
https://hal.archives-ouvertes.fr/hal-01865458