المؤلفون: Joseph A Hagmann, Xiang Li, Sugata Chowdhury, Si-Ning Dong, Sergei Rouvimov, Sujitra J Pookpanratana, Kin Man Yu, Tatyana A Orlova, Trudy B Bolin, Carlo U Segre, David G Seiler, Curt A Richter, Xinyu Liu, Margaret Dobrowolska, Jacek K Furdyna

المصدر: New Journal of Physics, Vol 19, Iss 8, p 085002 (2017)

مصطلحات موضوعية: topological insulator, magnetism, band structure, molecular beam epitaxy, heterostructure, quantum matter, Science, Physics, QC1-999

Relation: https://doi.org/10.1088/1367-2630/aa759c; https://doaj.org/toc/1367-2630; https://doaj.org/article/2e80542d00a84b1d80be1e0c87f27ffb

الاتاحة: https://doi.org/10.1088/1367-2630/aa759c
https://doaj.org/article/2e80542d00a84b1d80be1e0c87f27ffb

المؤلفون: Tiglet Besara, Son T. Le, Jifeng Sun, David G. Seiler, Joseph A. Hagmann, Curt A. Richter, Theo Siegrist, David J. Singh, Joseph A. Stroscio, Lynn F. Schneemeyer

المصدر: Nanoscale. 9:7922-7929

مصطلحات موضوعية: Chemistry, Inorganic chemistry, Superatom, chemistry.chemical_element, 02 engineering and technology, 021001 nanoscience & nanotechnology, Electrochemistry, 01 natural sciences, Ion, Crystallography, Molybdenum, 0103 physical sciences, Tetrahedron, Cluster (physics), General Materials Science, 010306 general physics, 0210 nano-technology, Ternary operation, Nanoscopic scale

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b7896a199e0701462aff12e71b5ff28e
https://doi.org/10.1039/c7nr01087g

المؤلفون: Zhiyong Ma, David G. Seiler

Resource Type: eBook.

الموضوعات: Nanoelectronics, Metrology

Categories: SCIENCE / Physics / General, SCIENCE / Life Sciences / General, TECHNOLOGY & ENGINEERING / Materials Science / General

المؤلفون: David G. Seiler, Zhiyong Ma

مصطلحات موضوعية: Materials science, Photoemission spectroscopy, Chip-scale package, business.industry, Electronic engineering, Optoelectronics, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::07917460808837fb4df72644eb0a86c5
https://doi.org/10.1201/9781315185385-25

المؤلفون: David G. Seiler, Zhiyong Ma

مصطلحات موضوعية: Semiconductor, Materials science, Atomic force microscopy, business.industry, Optoelectronics, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b7f023158ed8bcf9f862329939bb22d4
https://doi.org/10.1201/9781315185385-11

المؤلفون: David G. Seiler, Zhiyong Ma

مصطلحات موضوعية: Interconnection, Computer science, Electronic engineering, Fault detection and isolation, Characterization (materials science)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::07af7ec2ef0de6f3acb89af91ffd50d9
https://doi.org/10.1201/9781315185385-33

المؤلفون: Zhiyong Ma, David G. Seiler

مصطلحات موضوعية: Materials science, Graphene, law, Electronic engineering, Nanotechnology, Characterization (materials science), Metrology, law.invention

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::38fa10150a646b810ff00d62f0369e45
https://doi.org/10.1201/9781315185385-23

المؤلفون: David G. Seiler, Zhiyong Ma

مصطلحات موضوعية: In situ, Materials science, Nanotechnology, Thin film

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::19ba137e51bc59228221ea576d315d6c
https://doi.org/10.1201/9781315185385-29

المؤلفون: David G. Seiler, Zhiyong Ma

مصطلحات موضوعية: Materials science, Nanotechnology, Metrology, Characterization (materials science)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::bcb98939526bc8037f535b423fa08318
https://doi.org/10.1201/9781315185385-18

المؤلفون: David G. Seiler

مصطلحات موضوعية: Interconnection, symbols.namesake, Materials science, business.industry, symbols, Optoelectronics, business, Raman spectroscopy, Characterization (materials science)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::427921624e8c6b31fa4da9be5f500565
https://doi.org/10.1201/9781315185385-32

المؤلفون: Zhiyong Ma, David G. Seiler

مصطلحات موضوعية: Materials science, Band mapping, business.industry, Electron energy loss spectroscopy, Inverse photoemission spectroscopy, Optoelectronics, Semiconductor nanostructures, Angle-resolved photoemission spectroscopy, business, Band offset

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7fc123ce7ba33096fa2dbfde3514ae74
https://doi.org/10.1201/9781315185385-20

المؤلفون: David G. Seiler, Zhiyong Ma

المصدر: Metrology and Diagnostic Techniques for Nanoelectronics

مصطلحات موضوعية: Materials science, Nanotechnology, Metrology, Characterization (materials science)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ee4d7af8128f4046d8e9b3b716498458
https://doi.org/10.1201/9781315185385-2

المؤلفون: Curt A. Richter, David G. Seiler, Son T. Le, Joseph A. Hagmann

المصدر: Journal of visualized experiments : JoVE. (107)

مصطلحات موضوعية: Cryostat, Boron Compounds, Materials science, Fabrication, General Chemical Engineering, 02 engineering and technology, 01 natural sciences, General Biochemistry, Genetics and Molecular Biology, law.invention, 010309 optics, Magnetics, Engineering, law, 0103 physical sciences, Materials Testing, Transition Elements, Thin film, General Immunology and Microbiology, business.industry, Graphene, General Neuroscience, Heterojunction, Equipment Design, 021001 nanoscience & nanotechnology, Characterization (materials science), Cold Temperature, Nanoelectronics, Optoelectronics, Chalcogens, Graphite, 0210 nano-technology, business, Single crystal

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::605c18924c3b2e1f757ed628bbdf2c46
https://pubmed.ncbi.nlm.nih.gov/26863449

المؤلفون: Amal Chabli, Peter Cherns, Nicolas Chevalier, David Cooper, Dominique Lafond, François Bertin, Henri Blanc, Ariel Brenac, Philippe Andreucci, Jean-Christophe Gabriel, Erik M. Secula, David G. Seiler, Rajinder P. Khosla, Dan Herr, C. Michael Garner, Robert McDonald, Alain C. Diebold

المساهمون: Minatec Grenoble (CEA/ INP Grenoble), Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), This work was supported by the French National Research Agency (ANR) through the Carnot fundingand the Basic Technological Research Program., David G. Seiler, Alain C. Diebold, Robert McDonald, C. Michael Garner, Dan Herr, Rajinder P. Khosla, Erik M. Secula, ANR-06-CARN-0011-01,Carnot LETI, ANR-06-CARN-0011-01,LETI,LETI(2006)

المصدر: Frontiers of Characterization and Metrology for Nanoelectronics. AIP, 2009
2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics
2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, May 2009, Albany, New York, United States. pp.12-20, ⟨10.1063/1.3251207⟩
ResearcherID

مصطلحات موضوعية: Materials science, Dynamic properties, Nanowire, Nanotechnology, 02 engineering and technology, Carbon nanotube, 01 natural sciences, law.invention, Scanning probe microscopy, [SPI]Engineering Sciences [physics], Beyond CMOS, law, 0103 physical sciences, [CHIM]Chemical Sciences, Tomography, 010302 applied physics, Protocol (science), Nanoelectromechanical systems, Microscopy, Nanotubes, 021001 nanoscience & nanotechnology, Characterization (materials science), CMOS, 3D characterization, 0210 nano-technology, PACS: 68.37.-d, 81.07.-b, Nanowires NWs, Nanoneedle

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::56834d9add8aebf5479754f426c6258f
https://hal-cea.archives-ouvertes.fr/cea-01549318/file/47-Chabli_caract-3d_Chabli_et_al.pdf

المؤلفون: David G. Seiler, James R. Ehrstein, J. S. Kim

المصدر: Journal of Applied Physics. 80:4425-4428

مصطلحات موضوعية: Electron mobility, Work (thermodynamics), Materials science, Condensed matter physics, Silicon, chemistry, Hall effect, Electrical resistivity and conductivity, General Physics and Astronomy, Conductivity tensor, chemistry.chemical_element, Magnetic field

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3fc1af10565412470ddd3b3d74cb5bb0
https://doi.org/10.1063/1.363403

المؤلفون: Michael Gaitan, Theodore V. Vorburger, Janet M. Cassard, David G. Seiler, Jon Geist, David T. Read

مصطلحات موضوعية: Microelectromechanical systems, Engineering, business.industry, Electrical engineering, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3aab0918e80d00353e2c237ca29d1151
https://doi.org/10.6028/nist.sp.260-177

المؤلفون: M. C. Chen, David G. Seiler, J. S. Kim, L. Colombo

المصدر: Journal of Electronic Materials. 24:1305-1310

مصطلحات موضوعية: Materials science, Solid-state physics, Magnetoresistance, business.industry, Semiconductor materials, Analytical chemistry, Liquid phase, Context (language use), High-electron-mobility transistor, Condensed Matter Physics, Epitaxy, Electronic, Optical and Magnetic Materials, Characterization (materials science), Materials Chemistry, Optoelectronics, Electrical and Electronic Engineering, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2d96586deb31cc73fb76770ac30f0fd8
https://doi.org/10.1007/bf02653089

المؤلفون: Janet M. Cassard, Michael Gaitan, Jon Geist, David G. Seiler

المصدر: 2012 IEEE International Conference on Microelectronic Test Structures.

مصطلحات موضوعية: Microelectromechanical systems, Stress gradient, Engineering, Certified reference materials, business.industry, Residual strain, Reference values, Electronic engineering, Standard test, NIST, Chip, business, Automotive engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::31e99842c128a57c39aff7b9d8ae1300
https://doi.org/10.1109/icmts.2012.6190649

المؤلفون: M. C. Chen, David G. Seiler, J. S. Kim, L. Colombo

المصدر: Semiconductor Science and Technology. 9:1696-1705

مصطلحات موضوعية: Analytical chemistry, Context (language use), Atmospheric temperature range, Condensed Matter Physics, Epitaxy, Electronic, Optical and Magnetic Materials, Magnetic field, Characterization (materials science), Condensed Matter::Materials Science, chemistry.chemical_compound, chemistry, Single crystal film, Materials Chemistry, Mercury cadmium telluride, Infrared detector, Electrical and Electronic Engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::bfbe5f02d2c5b0e6d10771e05bc74cc8
https://doi.org/10.1088/0268-1242/9/9/020

المؤلفون: M. Py, M. Veillerot, E. Martinez, J. M. Fabbri, R. Boujamaa, J. P. Barnes, F. Bertin, David G. Seiler, Alain C. Diebold, Robert McDonald, Amal Chabli, Erik M. Secula

المصدر: AIP Conference Proceedings.

مصطلحات موضوعية: Thin layers, Materials science, Flat surface, business.industry, Annealing (metallurgy), Analytical chemistry, Optoelectronics, Polishing, Sample preparation, Thin film, business, Smooth surface, High-κ dielectric

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4bda4ce3b70d8533b5717339d6eac4fc
https://doi.org/10.1063/1.3657885