يعرض 1 - 20 نتائج من 5,898 نتيجة بحث عن '"Dark field microscopy"', وقت الاستعلام: 0.74s تنقيح النتائج
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    المساهمون: Universidad de Sevilla. Departamento de Ingeniería y Ciencia de los Materiales y del Transporte, Universidad de Sevilla. TEP123: Metalurgia e Ingeniería de los Materiales, SANDiE European Network of Excellence Contract No. NMP4-CT-2004-500101, The Spanish MEC Grant No. TEC2005-05781-C03-01, The Spanish MEC Grant No. TEC2005-05781-C03-02, The Spanish MEC Grant No. TEC2008-06756-C03-02/TEC, The Spanish MEC Grant No. NAN2004-09109-C04-01, Consolider-Ingenio 2010 CSD2006-00019, The CAM Grant No. S 0505ESP 0200, Junta de Andalucía project PAI05-TEP-00383, Junta de Andalucía project PAI05-TEP-03516

    Relation: Applied Physics Letters, 94 (043114).; NMP4-CT-2004-500101; TEC2005-05781-C03-01; TEC2005-05781-C03-02; TEC2008-06756-C03-02/TEC; NAN2004-09109-C04-01; CSD2006-00019; S 0505ESP 0200; PAI05-TEP-00383; PAI05-TEP-03516; https://pubs.aip.org/aip/apl/article/94/4/043114/337629/High-resolution-electron-microscopy-of-GaAs-capped; https://idus.us.es/handle//11441/150409

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    المصدر: Nanomaterials; Volume 13; Issue 13; Pages: 2027

    وصف الملف: application/pdf

    Relation: Nanophotonics Materials and Devices; https://dx.doi.org/10.3390/nano13132027

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