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1Report
المؤلفون: D. S. Peck, M. C. Wooley
المصدر: The Bell System Technical JournalTelstar I. 42(4)
مصطلحات موضوعية: Chemistry
Relation: Telstar I, Volume 3
URL الوصول: https://ntrs.nasa.gov/citations/19640001172
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2Report
المؤلفون: J. S. Mayo, H. Mann, F. J. Witt, D. S. Peck, H. K. Gummel, W. L. Brown
المصدر: The Bell System Technical JournalTelstar I. 42(4)
مصطلحات موضوعية: Computers
Relation: Telstar I, Volume 2
URL الوصول: https://ntrs.nasa.gov/citations/19640000988
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3Report
المؤلفون: Homer E. Newell, J. A. Van Allen, W. R. Webber, P. S. Freier, C. E. Fichtel, Donald E. Guss, K. W. Ogilvie, D. K. Bailey, James B. Weddell, M. C. Chapman, R. E. Fortney, M. R. Morrison, J. A. Baicker, P. Rappaport, D. S. Peck, R. R. Blair, W. L. Brown, F. M. Smits
المصدر: Proceedings of the Symposium on the Protection Against Radiation Hazards in Space. 1(1 & 2)
مصطلحات موضوعية: Propulsion Systems, Space Radiation
Relation: Proceedings of the Symposium on the Protection Against Radiation Hazards in Space
URL الوصول: https://ntrs.nasa.gov/citations/19630005238
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4
المؤلفون: D. S. Peck
المصدر: IEEE Transactions on Electron Devices. 26:38-43
مصطلحات موضوعية: education.field_of_study, Engineering, business.industry, Population, Control (management), Process (computing), Failure rate, Integrated circuit, Circuit reliability, Electronic, Optical and Magnetic Materials, Reliability engineering, Life testing, law.invention, Reliability (semiconductor), CMOS, law, Range (statistics), Factory (object-oriented programming), Telephony, Electrical and Electronic Engineering, education, business, Electronic systems, Reliability (statistics)
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5
المؤلفون: D. S. Peck, M. C. Wooley
المصدر: Bell System Technical Journal. 42:1665-1686
مصطلحات موضوعية: Engineering, business.industry, Transistor, General Engineering, Semiconductor device, Reliability engineering, law.invention, Reliability (semiconductor), law, Component (UML), visual_art, Electronic component, visual_art.visual_art_medium, Orbit (dynamics), Satellite, business, Selection (genetic algorithm), Simulation
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6
المؤلفون: D. S. Peck, E. R. Schmid
المصدر: Nature. 199:741-744
مصطلحات موضوعية: Multidisciplinary, Materials science, business.industry, Transistor, Radiation, equipment and supplies, law.invention, Ionizing radiation, Radiation sensitivity, law, Communications satellite, Optoelectronics, business, Sensitivity (electronics), Electronic circuit, Voltage
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7
المؤلفون: D. S. Peck
المصدر: Electrical Engineering. 71:1136-1139
مصطلحات موضوعية: Pulse repetition frequency, Materials science, business.industry, Electrical engineering, Cathode, law.invention, Anode, Electric discharge in gases, Frequency divider, Optics, law, Cold cathode, Tube (fluid conveyance), Stage (hydrology), business
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8
المؤلفون: J. S. Mayo, D. S. Peck, F. J. Witt, H. Mann, W. L. Brown, H. K. Gummel
المصدر: Bell System Technical Journal. 42:1631-1657
مصطلحات موضوعية: Engineering, business.industry, General Engineering, Command system, Satellite, business, Simulation, Command guidance
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9
المؤلفون: D. S. Peck
المصدر: 13th International Reliability Physics Symposium.
مصطلحات موضوعية: Stress (mechanics), Materials science, Silicon, chemistry, Electronic engineering, chemistry.chemical_element, Semiconductor device, Electromigration, Engineering physics, Degradation (telecommunications)
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10
المؤلفون: D. S. Peck, C. H. Zierdt
المصدر: 11th Reliability Physics Symposium.
مصطلحات موضوعية: Electrolysis, Materials science, Silicon, Moisture, Humidity, chemistry.chemical_element, Semiconductor device, law.invention, Metal, chemistry, law, visual_art, visual_art.visual_art_medium, Composite material
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11
المؤلفون: D. S. Peck
المصدر: 8th Reliability Physics Symposium.
مصطلحات موضوعية: Materials science, Metallurgy, Molding (process), Hermetic seal, Seal (mechanical), Electromigration, law.invention, Corrosion, chemistry.chemical_compound, Reliability (semiconductor), Silicon nitride, chemistry, law, Metallizing
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12
المؤلفون: D. S. Peck
المصدر: 9th Reliability Physics Symposium.
مصطلحات موضوعية: Stress (mechanics), Acceleration, Group method of data handling, business.industry, Computer science, Data analysis, Structural engineering, business, Reliability engineering, Life testing
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13
المؤلفون: Anne Green, I. Anderson, A. M. Ward, D. S. Peck, R. G. F. Gray
المصدر: Journal of Inherited Metabolic Disease. 6:143-144
مصطلحات موضوعية: Prolidase deficiency, business.industry, Immunology, Genetics, medicine, medicine.disease, business, Genetics (clinical), Human genetics