المؤلفون: Alexandre Talbot, A. Toffoli, Simone Pokrant, D. Aime, Markus Muller, Alexandre Mondot, Yves Morand, G. Ribes, Francois Leverd, Thomas Skotnicki, Pascal Gouraud, Julien-Marc Roux, S. Descombes, Benoit Froment

المصدر: Solid-State Electronics. 50:620-625

مصطلحات موضوعية: Materials science, Silicon, business.industry, Transistor, chemistry.chemical_element, Nanotechnology, Hardware_PERFORMANCEANDRELIABILITY, Condensed Matter Physics, Epitaxy, Electronic, Optical and Magnetic Materials, PMOS logic, law.invention, Reliability (semiconductor), chemistry, law, Chemical-mechanical planarization, Hardware_INTEGRATEDCIRCUITS, Materials Chemistry, Miniaturization, Optoelectronics, Electrical and Electronic Engineering, business, Metal gate, Hardware_LOGICDESIGN

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0c6637d44991cb5c46cde16bf070c793
https://doi.org/10.1016/j.sse.2006.03.033

المؤلفون: H. Zuber, G. Poignavent, C. Le Signor, D. Aimé, E. Vieren, C. Tadla, R. Lugan, M. Belghazi, V. Labas, A.L. Santoni, D. Wipf, J. Buitink, J.C. Avice, C. Salon, K. Gallardo

المصدر: The Plant Journal

مصطلحات موضوعية: Germination, legume, Medicago truncatula, nutrient allocation, seed composition, sulfate transport, sulfur deficiency

Relation: http://okina.univ-angers.fr/publications/ua7911

الاتاحة: http://okina.univ-angers.fr/publications/ua7911
https://doi.org/10.1111/tpj.12350

المؤلفون: B. Frank Yang, R. Takalkar, Z. Ren, L. Black, A. Dube, J.W. Weijtmans, J. Li, J.B. Johnson, J. Faltermeier, A. Madan, Z. Zhu, A. Turansky, G. Xia, A. Chakravarti, R. Pal, K. Chan, A. Reznicek, T.N. Adam, B. Yang, J.P. de Souza, E.C.T. Harley, B. Greene, A. Gehring, M. Cai, D. Aime, S. Sun, H. Meer, J. Holt, D. Theodore, S. Zollner, P. Grudowski, D. Sadana, D.-G. Park, D. Mocuta, D. Schepis, E. Maciejewski, S. Luning, J. Pellerin, E. Leobandung

المصدر: 2008 IEEE International Electron Devices Meeting.

مصطلحات موضوعية: In situ, Materials science, Phosphorus doped, Silicon, chemistry, MOSFET, Ultimate tensile strength, Doping, Electronic engineering, Analytical chemistry, chemistry.chemical_element, Mosfet circuits, Epitaxy

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4be978b7620a3fb60241f50d73353f21
https://doi.org/10.1109/iedm.2008.4796611

المؤلفون: C. Fenouillet-Beranger, J. Todeschini, J.C. Le-Denmat, N. Loubet, C. Gallon, P. Perreau, S. Manakli, B. Minghetti, L. Pain, V. Arnal, A. Vandooren, S. Denorme, D. Aime, L. Tosti, C. Savardi, M. Broekaart, P. Gouraud, F. Leverd, V. Dejonghe, P. Brun, M. Guillermet, M. Aminpur, B. Icard, S. Barnola, F. Rouppert, F. Martin, T. Salvetat, S. Lhostis, C. Laviron, N. Auriac, T. Kormann, G. Chabanne, S. Gaillard, F. Boeuf, O. Belmont, E. Laffosse, D. Barge, A. Zauner, A. Tarnowka, K. Romanjec, H. Brut, A. Lagha, S. Bonnetier, F. Joly, J. Coignus, N. Mayet, A. Cathignol, D. Galpin, D. Pop, R. Delsol, R. Pantel, F. Pionnier, G. Thomas, D. Bensahel, S. Deleonibus, O. Faynot, T. Skotnicki, H. Mingam, L. Brevard, C. Buj, C. Soonekindt

المصدر: 2007 IEEE International Electron Devices Meeting.

مصطلحات موضوعية: Materials science, business.industry, Transistor, Electrical engineering, Silicon on insulator, law.invention, PMOS logic, law, Optoelectronics, Static random-access memory, Power MOSFET, Metal gate, business, NMOS logic, High-κ dielectric

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9b01d356319804f33639c8bbcd010bbb
https://doi.org/10.1109/iedm.2007.4418919

المؤلفون: D. Bensahel, D. Aime, Romain Gwoziecki, T. Salvetat, Simon Deleonibus, Francois Leverd, M. Aminpur, Claire Fenouillet-Beranger, A. Zauner, Antoine Cros, Vincent Cosnier, R. Gassilloud, L. Brevard, Marius K. Orlowski, A. Wild, J. Coignus, H. Mingam, Frederic Boeuf, C. Hobbs, Thomas Skotnicki, A. Vandooren, S. Minoref, P. Perreau, Sébastien Barnola, M. Muller, François Martin, Stephane Denorme, G. Chabanne, O. Faynot, D. Fleury

المصدر: ESSDERC 2007 - 37th European Solid State Device Research Conference.

مصطلحات موضوعية: Materials science, business.industry, Gate dielectric, Electrical engineering, Silicon on insulator, chemistry.chemical_element, Hardware_PERFORMANCEANDRELIABILITY, Dielectric, chemistry, Hardware_GENERAL, Gate oxide, MOSFET, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, business, Tin, Metal gate, Hardware_LOGICDESIGN, High-κ dielectric

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::60a2442250b9fc29632d8532e0ef3916
https://doi.org/10.1109/essderc.2007.4430926

المؤلفون: A. Tarnowka, C. Laviron, Thomas Skotnicki, Stephane Denorme, M. Muller, S. Bonnetier, Simone Pokrant, G. Ribes, A. Cathignol, Pascal Gouraud, C. Blanc, D. Aime, T. Kormann, G. Bidal, D. Barge, Mustapha Rafik, Frederic Boeuf, Gerard Ghibaudo, G. Chabanne

المصدر: Extended Abstracts of the 2007 International Conference on Solid State Devices and Materials.

مصطلحات موضوعية: Materials science, CMOS, business.industry, Optoelectronics, business, Power (physics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6db2c92bca05362059a5e914245c7884
https://doi.org/10.7567/ssdm.2007.a-9-5

المؤلفون: D. Aime, M. Muller, N. Gierczynski, G. Ribes, Alexandre Mondot, Thomas Skotnicki

المصدر: 2006 IEEE International Conference on IC Design and Technology.

مصطلحات موضوعية: Computer science, business.industry, Electrical engineering, Hardware_PERFORMANCEANDRELIABILITY, Metal gate electrodes, Reliability (semiconductor), CMOS, Hardware_GENERAL, Electrode, Hardware_INTEGRATEDCIRCUITS, Static random-access memory, business, Metal gate, Hardware_LOGICDESIGN

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cd9139fd14ad40a1230727fac5e3c44f
https://doi.org/10.1109/icicdt.2006.1669403

المؤلفون: Mustapha Rafik, T. Kormann, A. Mondot, D. Barge, A. Zauner, A. Toffoli, A. Tarnowka, Claire Fenouillet-Beranger, C. Laviron, Pascal Gouraud, Thomas Skotnicki, Simone Pokrant, D. Aime, S. Bonnetier, G. Braeckelmann, Frederic Boeuf, G. Bidal, G. Chabanne, Stephane Denorme, M. Muller

المصدر: Extended Abstracts of the 2006 International Conference on Solid State Devices and Materials.

مصطلحات موضوعية: Scheme (programming language), Materials science, CMOS, business.industry, Scalability, Optoelectronics, business, computer, computer.programming_language

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::576622f00ea1ff1f29d1fd86a3979bc6
https://doi.org/10.7567/ssdm.2006.j-8-1

المؤلفون: Francois Leverd, A. Toffoli, D. Aime, Alexandre Talbot, Thomas Skotnicki, A. Mondot, Simone Pokrant, Florian Cacho, M. Muller, Pascal Besson, S. Descombes, Yves Morand, B. Froment, M. Rivoire

المصدر: Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005..

مصطلحات موضوعية: Fabrication, Materials science, business.industry, law, Chemical-mechanical planarization, Transconductance, MOSFET, Transistor, Electronic engineering, Optoelectronics, business, law.invention

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9fa594e289881966ecc2a3364a062cdd
https://doi.org/10.1109/essder.2005.1546676

المؤلفون: D. Aime, A. Mondot, Julien-Marc Roux, M. Muller, A. Toffoli, Francois Leverd, G. Ribes, Pascal Gouraud, B. Froment, S. Descombes, Yves Morand, Alexandre Talbot, Simone Pokrant, Tomasz Skotnicki

المصدر: Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005..

مصطلحات موضوعية: Materials science, Silicon, business.industry, Transistor, Electrical engineering, chemistry.chemical_element, Single step, Hardware_PERFORMANCEANDRELIABILITY, Epitaxy, PMOS logic, law.invention, Reliability (semiconductor), CMOS, chemistry, law, MOSFET, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, business, Hardware_LOGICDESIGN

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::dbd6ce46f468f008752c62f1ef34de6d
https://doi.org/10.1109/essder.2005.1546682

المؤلفون: S. Jullian, D. Delille, Yves Morand, R. Pantel, T. Farjot, V. Carron, C. Laviron, Florian Cacho, Benoit Froment, D. Bensahel, Abdelkader Souifi, D. Aime, N. Emonet, Aomar Halimaoui, Marc Juhel, R. Molins, Francois Wacquant, S. Descombes

المساهمون: STMicroelectronics [Crolles] (ST-CROLLES), Laboratoire de physique de la matière (LPM), Institut National des Sciences Appliquées de Lyon (INSA Lyon), Institut National des Sciences Appliquées (INSA)-Université de Lyon-Institut National des Sciences Appliquées (INSA)-Université de Lyon-Centre National de la Recherche Scientifique (CNRS), Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Philips France Semiconducteurs, Centre des Matériaux (MAT), MINES ParisTech - École nationale supérieure des mines de Paris, Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Centre National de la Recherche Scientifique (CNRS), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Université de Lyon-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS), Centre des Matériaux (CDM), Mines Paris - PSL (École nationale supérieure des mines de Paris)

المصدر: Scopus-Elsevier
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2005. EuroSimE 2005.
Electron Devices Meeting, 2004. IEDM Technical Digest
Electron Devices Meeting, 2004. IEDM Technical Digest, 2004, pp.87-90, ⟨10.1109/IEDM.2004.1419073⟩

مصطلحات موضوعية: Materials science, Annealing (metallurgy), nickel compounds, doping, work function, 02 engineering and technology, Dielectric, interface structure, 01 natural sciences, chemistry.chemical_compound, Back end of line, thermal stresses, transmission electron microscopy, 0103 physical sciences, Silicide, Electronic engineering, Work function, 010302 applied physics, Dopant, business.industry, Doping, silicon, CMOS integrated circuits, 021001 nanoscience & nanotechnology, chemistry, CMOS, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], Optoelectronics, 0210 nano-technology, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2a8c5bd6cf15c0b77728d2e626b67fee
https://doi.org/10.1109/iedm.2004.1419073

المؤلفون: D. Aime, Francois Wacquant, Georges Cailletaud, Patrice Gergaud, Herve Jaouen, S. Minoret, Abdelkader Souifi, Florian Cacho, Benoit Froment, C. Rivero, Olivier Thomas

المصدر: MRS Proceedings. 875

مصطلحات موضوعية: Monocrystalline silicon, Nickel, Materials science, chemistry, Viscoplasticity, Residual stress, chemistry.chemical_element, Thin film, Composite material, Diffusion (business), Sheet resistance, Annealing (glass)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9ffb83821cdbdea3dc16eff6dfdc1678
https://doi.org/10.1557/proc-875-o14.5

المؤلفون: Mignot, D.-Aimé

Relation: Bulletin de la Société d'Histoire de la Guadeloupe; no. 132 (2002); http://id.erudit.org/iderudit/1040761ar

الاتاحة: http://id.erudit.org/iderudit/1040761ar
https://doi.org/10.7202/1040761ar

المؤلفون: Artigues, M. d' (Aimé-Gabriel), 1773-1848., Institut de France. Classe des sciences mathématiques et physiques.

مصطلحات موضوعية: Glass manufacture, Lenses, Optical glass

Relation: http://hdl.handle.net/2027/gri.ark:/13960/t84j36w1h

الاتاحة: http://hdl.handle.net/2027/gri.ark:/13960/t84j36w1h

المؤلفون: Artigues, M. d' (Aimé-Gabriel), 1773-1848.

مصطلحات موضوعية: Compagnie des cristalleries de Baccarat, Hydraulic machinery, Pumping machinery

Relation: http://hdl.handle.net/2027/gri.ark:/13960/t0tq8mf56

الاتاحة: http://hdl.handle.net/2027/gri.ark:/13960/t0tq8mf56

المؤلفون: Artigues, M. d' (Aimé-Gabriel), 1773-1848, author., Rousseau, Nicolas Louis, engraver.

مصطلحات موضوعية: Cristallerie de Vonêche, Kilns, Glassware

Time: France Paris.

وصف الملف: bib

Relation: http://hdl.handle.net/2027/gri.ark:/13960/t9v19dq62

الاتاحة: http://hdl.handle.net/2027/gri.ark:/13960/t9v19dq62

المؤلفون: Marco D. Aime, Paolo Carlo Pomi, Marco Vallini

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.thinkmind.org/download.php?articleid%3Dintsys_v2_n4_2009_6.

مصطلحات موضوعية: automatic system configuration, depend

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.676.6942; http://www.thinkmind.org/download.php?articleid%3Dintsys_v2_n4_2009_6

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.676.6942
http://www.thinkmind.org/download.php?articleid%3Dintsys_v2_n4_2009_6

المؤلفون: C. Fenouillet-Beranger, C. Gallon, A. Vandooren, D. Aime, L. Tosti, F. Leverd, O. Faynot, C. Arvet, C. Perrot, B. Froment, M. Muller, F. Allain, A. Toffoli, S. Vanbergue, M. L. Villani, D. Delille, S. Pokrant, T. Skotnicki

المصدر: 2006 European Solid-State Device Research Conference; 2006, p158-161, 4p

المؤلفون: A. Mondot, M. Muller, A. Talbot, C. Vizioz, S. Pokrant, F. Leverd, F. Martin, C. Leroux, Y. Morand, S. Descombes, D. Aime, F. Allian, P. Besson, T. Skotnicki

المصدر: 2006 European Solid-State Device Research Conference; 2006, p117-120, 4p

المؤلفون: D, Aime

المصدر: Journal of psychiatric nursing and mental health services. 11(4)

مصطلحات موضوعية: Mental Health Services, Mental Disorders, Humans, Day Care, Medical

URL الوصول: https://explore.openaire.eu/search/publication?articleId=pmid________::2bb28cec8f1d6dbfeb7a61ef4f36441d
https://pubmed.ncbi.nlm.nih.gov/4355614