المؤلفون: J. J. Scholtz, D. Dijkkamp, R. W. A. Schmitz

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.lepp.cornell.edu/~critten/cesrta/ecloud/doc/PhilJRes50_1996_375.pdf.

مصطلحات موضوعية: secondary electron emission, flat and slim display, energy distribution, Zeus display, MgO

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.466.4001; http://www.lepp.cornell.edu/~critten/cesrta/ecloud/doc/PhilJRes50_1996_375.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.466.4001
http://www.lepp.cornell.edu/~critten/cesrta/ecloud/doc/PhilJRes50_1996_375.pdf

المؤلفون: D Dijkkamp, J.J. Scholtz, R.W.A Schmitz

المصدر: Philips Journal of Research. 50:375-389

مصطلحات موضوعية: Physics, Cathode ray tube, Monte Carlo method, General Engineering, Binary compound, Mineralogy, Function (mathematics), Secondary electrons, law.invention, chemistry.chemical_compound, chemistry, law, Secondary emission, Yield (chemistry), Atomic physics, Energy (signal processing)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::71ef838d967f4bf71e2e39bf3d233b51
https://doi.org/10.1016/s0165-5817(97)84681-5

المؤلفون: H.B. Elswijk, D. Dijkkamp, Henricus J.W. Zandvliet, E. J. van Loenen, J. Dieleman

المصدر: Journal of Applied Physics. 70:2614-2617

مصطلحات موضوعية: Reflection high-energy electron diffraction, Chemistry, business.industry, Nucleation, General Physics and Astronomy, Crystal growth, Epitaxy, Molecular physics, Condensed Matter::Materials Science, Optics, Electron diffraction, Thin film, business, Vicinal, Molecular beam epitaxy

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::26dcaa4f8379efe894025be0cca53f34
https://doi.org/10.1063/1.349372

المؤلفون: D. Dijkkamp, H.B. Elswijk, R.W.J Hollering

المصدر: Surface Science. 243:121-126

مصطلحات موضوعية: Surface (mathematics), Misorientation, Chemistry, Analytical chemistry, Oxide, Second-harmonic generation, Surfaces and Interfaces, Condensed Matter Physics, Molecular physics, Signal, Surfaces, Coatings and Films, law.invention, Crystal, chemistry.chemical_compound, law, Condensed Matter::Superconductivity, Materials Chemistry, Scanning tunneling microscope, Vicinal

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0d270642446b1693864e8db2f167c9be
https://doi.org/10.1016/0039-6028(91)90350-2

المؤلفون: R. W. J. Hollering, H. W. L. Lindelauf, D. Dijkkamp, M. P. C. M. Krijn, P. A. M. van der Heide

المصدر: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 8:3997-4000

مصطلحات موضوعية: business.industry, Analytical chemistry, Second-harmonic generation, chemistry.chemical_element, Barium, Surfaces and Interfaces, Condensed Matter Physics, Polarization (waves), Surfaces, Coatings and Films, chemistry, Vacuum deposition, Physical vapor deposition, Monolayer, Optoelectronics, Work function, business, Order of magnitude

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d0225cb11a134950b480e034365f3340
https://doi.org/10.1116/1.576435

المؤلفون: A. J. Hoeven, J. M. Lenssinck, E. J. van Loenen, D. Dijkkamp

المصدر: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 8:3657-3661

مصطلحات موضوعية: Silicon, Chemistry, Scanning electron microscope, Nucleation, Analytical chemistry, chemistry.chemical_element, Surfaces and Interfaces, Condensed Matter Physics, Epitaxy, Surfaces, Coatings and Films, law.invention, Chemical physics, law, Thin film, Scanning tunneling microscope, Vicinal, Molecular beam epitaxy

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4fe9cfd818f3f2f6215219c5e90bee0f
https://doi.org/10.1116/1.576519

المؤلفون: D. Dijkkamp, S. Kordić, A. J. Hoeven, H. K. Moraal, E. J. van Loenen

المصدر: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 8:549-552

مصطلحات موضوعية: Materials science, Silicon, business.industry, Transistor, Scanning tunneling spectroscopy, Analytical chemistry, chemistry.chemical_element, Surfaces and Interfaces, Condensed Matter Physics, Surfaces, Coatings and Films, law.invention, chemistry, Depletion region, law, Optoelectronics, Field-effect transistor, Scanning tunneling microscope, business, p–n junction, Diode

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ba98f6f90163e2725583f5393547dc87
https://doi.org/10.1116/1.576385

المؤلفون: J. Dieleman, D. Dijkkamp, A. J. Hoeven, E. J. van Loenen

المصدر: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 8:218-221

مصطلحات موضوعية: Surface (mathematics), Morphology (linguistics), Materials science, Misorientation, Silicon, Analytical chemistry, Oxide, chemistry.chemical_element, Surfaces and Interfaces, Condensed Matter Physics, Molecular physics, Surfaces, Coatings and Films, law.invention, Faceting, chemistry.chemical_compound, chemistry, law, Thermal, Scanning tunneling microscope

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::190e6f3c33bb6c2c68bc7254c59966ee
https://doi.org/10.1116/1.577070

المؤلفون: E. J. van Loenen, A. J. Hoeven, D. Dijkkamp, S. Kordić, H. K. Moraal

المصدر: International Technical Digest on Electron Devices Meeting.

مصطلحات موضوعية: Materials science, Silicon, Scanning tunneling spectroscopy, Analytical chemistry, chemistry.chemical_element, Spin polarized scanning tunneling microscopy, Conductive atomic force microscopy, Electrochemical scanning tunneling microscope, law.invention, Scanning probe microscopy, chemistry, law, Scanning tunneling microscope, p–n junction

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9ed69162e991ec9124cf1eecc1261356
https://doi.org/10.1109/iedm.1989.74278

المؤلفون: D. Dijkkamp, J.E. Crombeen, E.M.J. Niessen, K. Joosse, W.A.M. Aarnink

المصدر: Proceedings ISDEIV. 18th International Symposium on Discharges and Electrical Insulation in Vacuum (Cat. No.98CH36073).

مصطلحات موضوعية: Engineering, Cost price, Quality management, business.industry, Cathode ray tube, Electrical engineering, High voltage, Insulator (electricity), law.invention, law, New product development, Process control, business, Process engineering, Electron gun

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::59242d10dddfe8c3a019886dbb9ca639
https://doi.org/10.1109/deiv.1998.738863

المؤلفون: J. Dieleman, D. Dijkkamp, J. M. Lenssinck, A. J. Hoeven, E. J. van Loenen

المصدر: Applied Physics Letters. 56:1755-1757

مصطلحات موضوعية: Physics and Astronomy (miscellaneous), Silicon, Atomic force microscopy, Chemistry, business.industry, Resolution (electron density), chemistry.chemical_element, law.invention, Condensed Matter::Materials Science, Optics, law, Computer Science::Computer Vision and Pattern Recognition, Scanning tunneling microscope, business, Image resolution, Quantum tunnelling

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::98f2fa522574d3115909d9b7a7d3689f
https://doi.org/10.1063/1.103090

المؤلفون: E. J. van Loenen, A. J. Hoeven, J. Dieleman, D. Dijkkamp, J. M. Lenssinck

المصدر: Applied Physics Letters. 56:39-41

مصطلحات موضوعية: Morphology (linguistics), Physics and Astronomy (miscellaneous), Silicon, Misorientation, business.industry, Oxide, chemistry.chemical_element, Molecular physics, law.invention, Characterization (materials science), chemistry.chemical_compound, Optics, chemistry, law, Perpendicular, Thin film, Scanning tunneling microscope, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::35e295cf7e57f741559b1b2952cfcc11
https://doi.org/10.1063/1.102640

المؤلفون: A. J. Hoeven, D. Dijkkamp, J. Dieleman, E. J. van Loenen, J. M. Lenssinck

المصدر: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 8:207-209

مصطلحات موضوعية: Materials science, Silicon, Analytical chemistry, chemistry.chemical_element, Surfaces and Interfaces, Island growth, Condensed Matter Physics, Molecular physics, Surfaces, Coatings and Films, law.invention, Electron diffraction, chemistry, law, Monolayer, Scanning tunneling microscope, Anisotropy, Deposition (law), Molecular beam epitaxy

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9530b21a455fae099b1c8e66d440eee9
https://doi.org/10.1116/1.577067

المؤلفون: E. J. van Loenen, D. Dijkkamp, J. M. Lenssinck, A. J. Hoeven, J. Dieleman

المصدر: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 8:574-576

مصطلحات موضوعية: Materials science, Scale (ratio), Silicon, business.industry, chemistry.chemical_element, Nanotechnology, Surfaces and Interfaces, Condensed Matter Physics, Structuring, Surfaces, Coatings and Films, law.invention, chemistry, law, Indentation, Optoelectronics, Nanometre, Scanning tunneling microscope, business, Image resolution, Surface states

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::15ab82f0ea6172b00503a5ea5fe57dc6
https://doi.org/10.1116/1.576391

المؤلفون: D. Dijkkamp, H.B. Elswijk, E. J. van Loenen

المصدر: Ordering at Surfaces and Interfaces ISBN: 9783642844843

مصطلحات موضوعية: Atomic diffusion, Surface diffusion, Scanning probe microscopy, Materials science, law, Scanning tunneling spectroscopy, Spin polarized scanning tunneling microscopy, Scanning tunneling microscope, Diffusion (business), Molecular physics, Electrochemical scanning tunneling microscope, law.invention

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6beae5b253453a09d86846184d7b981d
https://doi.org/10.1007/978-3-642-84482-9_10

المؤلفون: E. J. van Loenen, H.B. Elswijk, D. Dijkkamp, Henricus J.W. Zandvliet

المساهمون: Physics of Interfaces and Nanomaterials, Faculty of Science and Technology

المصدر: Physical Review B (Condensed Matter), 0(45), 5965-5968. American Institute of Physics

مصطلحات موضوعية: Materials science, Silicon, METIS-128865, Diagonal, Isotropy, chemistry.chemical_element, Molecular physics, law.invention, Monatomic ion, chemistry, law, Computer Science::Systems and Control, IR-73166, Physics::Atomic and Molecular Clusters, Condensed Matter::Strongly Correlated Electrons, Scanning tunneling microscope, Anisotropy, Surface reconstruction, Vicinal

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bb7dd2ecd09e5dcf3e3dc48f175859a2
https://research.utwente.nl/en/publications/43c8140a-8fbf-48e5-ac3b-952cabb4f61b

المؤلفون: D. Dijkkamp, H.B. Elswijk, E. J. van Loenen

المصدر: Physical review. B, Condensed matter. 44(8)

مصطلحات موضوعية: Physics, Condensed matter physics, law, Spatially resolved, Saturation (graph theory), Surface structure, Electronic structure, Scanning tunneling microscope, law.invention

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3a5bfbe313b919d3c7933c8206c4753d
https://pubmed.ncbi.nlm.nih.gov/10000008

المؤلفون: H.B. Elswijk, E. J. van Loenen, J. M. Lenssinck, D. Dijkkamp, A. J. Hoeven, J. Dieleman

المصدر: NATO ASI Series ISBN: 9781461279112

مصطلحات موضوعية: Condensed Matter::Materials Science, Materials science, law, business.industry, Condensed Matter::Superconductivity, Monte Carlo method, Optoelectronics, Scanning tunneling microscope, business, law.invention, Molecular beam epitaxy

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::12beee09d4edc6d4f4b9c97f4389aaf7
https://doi.org/10.1007/978-1-4613-0653-5_17

المؤلفون: A. J. Hoeven, E. J. van Loenen, J. M. Lenssinck, D. Dijkkamp

المصدر: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 9:1963

مصطلحات موضوعية: Ozone, Chemistry, General Engineering, Oxide, Analytical chemistry, chemistry.chemical_element, medicine.disease_cause, chemistry.chemical_compound, Desorption, Ultraviolet light, medicine, Irradiation, Carbon, Molecular beam, Ultraviolet

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::bfe81a25cdb0520e410972724a0a2c33
https://doi.org/10.1116/1.585388

المؤلفون: D. Dijkkamp, P. A. M. van der Heide, R. W. J. Hollering, H. W. L. Lindelauf

المصدر: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 9:1967

مصطلحات موضوعية: chemistry.chemical_compound, X-ray photoelectron spectroscopy, Silicon, Annealing (metallurgy), Chemistry, General Engineering, Analytical chemistry, Oxide, Second-harmonic generation, chemistry.chemical_element, Order of magnitude, Surface reconstruction, Surface states

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::235e5c027f060851b5dd3d72a8f9471d
https://doi.org/10.1116/1.585389