المؤلفون: Heidler, Nils, Mohaupt, Matthias, Risse, Stefan, Döring, Hans-Joachim

الاتاحة: http://data.europeana.eu/aggregation/europeana/2020801/dmglib_handler_docum_29475009

المؤلفون: Döring, Hans-Joachim

الاتاحة: https://dx.doi.org/10.11588/soai.1994.1.8279
https://hasp.ub.uni-heidelberg.de/journals/soai/article/view/8279

المؤلفون: Döring, Hans-Joachim

المصدر: südostasien informationen; Bd. 10 Nr. 1 (1994): südostasien informationen; 63-64

وصف الملف: application/pdf

Relation: https://hasp.ub.uni-heidelberg.de/journals/soai/article/view/8279/8149; https://hasp.ub.uni-heidelberg.de/journals/soai/article/view/8279

الاتاحة: https://hasp.ub.uni-heidelberg.de/journals/soai/article/view/8279

المؤلفون: Döring, Hans-Joachim

الاتاحة: http://deposit.d-nb.de/cgi-bin/dokserv?idn=987473093
http://opus.kobv.de/tuberlin/volltexte/2008/1747/

المؤلفون: Mohaupt, Matthias, Beckert, Erik, Burkhardt, Thomas, Hornaff, Marcel, Damm, Christoph, Eberhardt, Ramona, Tünnermann, Andreas, Döring, Hans-Joachim, Reimer, Klaus

المساهمون: Fraunhofer Institute for Applied Optics and Precision Engineering Jena (Fraunhofer IOF), Fraunhofer (Fraunhofer-Gesellschaft), Vistec Electron Beam GmbH, Fraunhofer Institute for Silicon Technology (Fraunhofer ISIT), Svetan Ratchev, TC 5, WG 5.5

المصدر: IFIP Advances in Information and Communication Technology ; 6th International Precision Assembly Seminar (IPAS) ; https://hal.inria.fr/hal-01363878 ; 6th International Precision Assembly Seminar (IPAS), Feb 2012, Chamonix, France. pp.42-50, ⟨10.1007/978-3-642-28163-1_6⟩

مصطلحات موضوعية: multi shaped beam lithography, multi deflection array, MEMS assembly, precision alignment, [INFO]Computer Science [cs]

جغرافية الموضوع: Chamonix, France

Relation: hal-01363878; https://hal.inria.fr/hal-01363878; https://hal.inria.fr/hal-01363878/document; https://hal.inria.fr/hal-01363878/file/978-3-642-28163-1_6_Chapter.pdf

الاتاحة: https://hal.inria.fr/hal-01363878
https://hal.inria.fr/hal-01363878/document
https://hal.inria.fr/hal-01363878/file/978-3-642-28163-1_6_Chapter.pdf
https://doi.org/10.1007/978-3-642-28163-1_6

المؤلفون: Döring, Hans-Joachim

المصدر: Peripherie. 2022, Vol. 42 Issue 165/166, p11-30. 20p.

المؤلفون: Döring, Hans Joachim

مصطلحات موضوعية: Romanies -- Germany

المؤلفون: Döring, Hans-Joachim

المصدر: Vierteljahrshefte für Zeitgeschichte, 1959 Oct 01. 7(4), 418-428.

URL الوصول: https://www.jstor.org/stable/30196203

المؤلفون: Gramss, Juergen, Weidenmueller, Ulf, Stoeckel, Arnd, Jaritz, Renate, Doering, Hans-Joachim, Boettcher, Monika

المساهمون: Behringer, Uwe F.W.

المصدر: 27th European Mask and Lithography Conference ; SPIE Proceedings ; ISSN 0277-786X

الاتاحة: http://dx.doi.org/10.1117/12.896883

المؤلفون: Slodowski, Matthias, Doering, Hans-Joachim, Dorl, Wolfgang, Stolberg, Ines A.

المساهمون: Herr, Daniel J. C.

المصدر: Alternative Lithographic Technologies III ; SPIE Proceedings ; ISSN 0277-786X

الاتاحة: http://dx.doi.org/10.1117/12.879446

المؤلفون: Slodowski, Matthias, Döring, Hans-Joachim, Stolberg, Ines A., Dorl, Wolfgang

المساهمون: Montgomery, M. Warren, Maurer, Wilhelm

المصدر: SPIE Proceedings ; Photomask Technology 2010 ; ISSN 0277-786X

الاتاحة: http://dx.doi.org/10.1117/12.868977

المؤلفون: Gramss, Juergen, Stoeckel, Arnd, Weidenmueller, Ulf, Doering, Hans-Joachim, Bloecker, Martin, Sczyrba, Martin, Finken, Michael, Wandel, Timo, Melzer, Detlef

المساهمون: Montgomery, M. Warren, Maurer, Wilhelm

المصدر: SPIE Proceedings ; Photomask Technology 2010 ; ISSN 0277-786X

الاتاحة: http://dx.doi.org/10.1117/12.865708

المؤلفون: Slodowski, Matthias, Doering, Hans-Joachim, Dorl, Wolfgang, Stolberg, Ines A.

المساهمون: Herr, Daniel J. C.

المصدر: SPIE Proceedings ; Alternative Lithographic Technologies II ; ISSN 0277-786X

الاتاحة: http://dx.doi.org/10.1117/12.846529

المؤلفون: Slodowski, Matthias, Doering, Hans-Joachim, Elster, Thomas, Stolberg, Ines A.

المساهمون: Schellenberg, Frank M., La Fontaine, Bruno M.

المصدر: Alternative Lithographic Technologies ; SPIE Proceedings ; ISSN 0277-786X

الاتاحة: http://dx.doi.org/10.1117/12.814113

المؤلفون: Stolberg, Ines, Pain, Laurent, Kretz, Johannes, Boettcher, Monika, Doering, Hans-Joachim, Gramss, Juergen, Hahmann, Peter

المصدر: 23rd European Mask and Lithography Conference ; SPIE Proceedings ; ISSN 0277-786X

الاتاحة: http://dx.doi.org/10.1117/12.736974

المؤلفون: Doering, Hans-Joachim, Elster, Thomas, Heinitz, Joachim, Fortagne, Olaf, Brandstaetter, Christoph, Haugeneder, Ernst, Eder-Kapl, Stefan, Lammer, Gertraud, Loeschner, Hans, Reimer, Klaus, Eichholz, Joerg, Saniter, Juergen

المساهمون: Mackay, R. Scott

المصدر: SPIE Proceedings ; Emerging Lithographic Technologies IX ; ISSN 0277-786X

الاتاحة: http://dx.doi.org/10.1117/12.600458

المؤلفون: Brandstaetter, Christoph, Haugeneder, Ernst, Doering, Hans-Joachim, Elster, Thomas, Heinitz, Joachim, Fortagne, Olaf, Eder-Kapl, Stefan, Lammer, Gertraud, Jochl, Peter, Loeschner, Hans, Reimer, Klaus, Saniter, Juergen, Talmi, Maati, Eberhardt, Ramona, Kroenert, Klaus

المصدر: SPIE Proceedings ; 21st European Mask and Lithography Conference ; ISSN 0277-786X

الاتاحة: http://dx.doi.org/10.1117/12.637298

المؤلفون: Risse, Stefan, Damm, Christoph, Hornaff, Marcel, Kamm, Andreas, Mohaupt, Matthias, Eberhardt, Ramona, Schmidt, Ingo, Ramm, Roland, Kühmstedt, Peter, Notni, Gunther, Döring, Hans-Joachim, Elster, Thomas, Kirschstein, Ulf Carsten, Schenk, Christoph

مصطلحات موضوعية: electron beam lithography, wire deflector, electron-optical column, precision assembly, solderjet bumping multi shaped beam, computed tomography measurement

Time: 620, 621

Relation: International Conference on Micro- and Nano-Engineering (MNE) 2011; Microelectronic engineering; https://publica.fraunhofer.de/handle/publica/229056

الاتاحة: https://publica.fraunhofer.de/handle/publica/229056
https://doi.org/10.1016/j.mee.2012.04.014

المؤلفون: Lemke, Melchior, Gramss, Juergen, Doering, Hans-Joachim, Eichhorn, Hans, Schubert, Gerhard

المساهمون: Behringer, Uwe F. W.

المصدر: SPIE Proceedings ; 16th European Conference on Mask Technology for Integrated Circuits and Microcomponents ; ISSN 0277-786X

الاتاحة: http://dx.doi.org/10.1117/12.377107

المؤلفون: Döring, Hans-Joachim.

المساهمون: Kriminalistik Verlag. pbl

المصدر: Bibliogr. s. 220-228.

URL الوصول: http://katalog.nukat.edu.pl/lib/item?id=chamo:3724087&theme=nukat